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    迅速地接收液体吸收频谱用的装置和方法
    21.
    发明授权
    迅速地接收液体吸收频谱用的装置和方法 失效 转让

    公开(公告)号：CN104412080B

    公开(公告)日：2017-03-29

    申请号：CN201380018730.8

    申请日：2013-04-04

    Applicant: 德尔格制造股份两合公司

    Inventor： R·布赫塔尔 ,  P·德雷耶 ,  L·福纳西罗

    IPC: G01J3/26 ,  G01J3/42 ,  G01J3/433 ,  G01N21/3504

    CPC classification number: G01N21/3504 ,  G01J3/26 ,  G01J3/42 ,  G01J3/433 ,  G01N2201/061 ,  G01N2201/0662 ,  G01N2201/068

    Abstract: 本发明涉及接收液体吸收频谱用的装置，带有第一射线源(1)，它沿着第一光程(11)在第一频谱范围内发射射线；带有安排在第一光程(11)中的第一测量段(5)，沿过该测量段射线射过该液体；带有安排在第一光程(11)中的可调节的Fabry-Perot干涉计(7)，可以作为可移动带通滤波器在第一频谱范围内透射射线；并带有第一检测器(9；35)，在第一频谱范围内测量该射线的强度。按照本发明规定，该装置具有第一校准器(3)用以对射线进行频谱调制，它安排在第一光程值(17)，建立该Fabry-Perot(7)(干涉仪)是为了由Fabry-Perot干涉计(7)形成的带通滤波器可以这样地在第一频谱范围上移动，使得第一校准器(3)对射线的频谱调制可以作为射线强度的时间调制由第一检测器(9，35)测量。(11)上并在第一频谱范围内具有多个透射最大

    分光光度计
    25.
    发明授权
    分光光度计 有权

    公开(公告)号：CN101069085B

    公开(公告)日：2010-07-14

    申请号：CN200580041483.9

    申请日：2005-12-01

    Applicant: 福斯分析公司

    Inventor： H·V·朱尔

    IPC: G01N21/03 ,  G01N21/31

    CPC classification number: G01N21/0303 ,  G01N21/31 ,  G01N2021/036 ,  G01N2201/066 ,  G01N2201/0662 ,  G01N2201/1293

    Abstract: 分光光度计(2)包括辐射源(6)，优选地为光学辐射源，该源被放置以向样品容器(4)内的样品发射多个波长下的辐射，还包括用于探测和样品相互作用后的辐射的探测装置8。该样品容器(4)适用于对于发射的辐射给出多个穿过样品的不同波程长度。可操作性地连接运算单元(10；10b)，以接收来自探测装置(8)的取决于强度的输出，以及适用于存储所探测到的多个不同波程长度中两个或更多个波程长度下发射的辐射的强度值，该强度值和波长挂钩，以及适用于计算取决于两个波程长度中每一个波程长度下挂钩的强度值的比率的值，借此可以获取所存放的样品内感兴趣物质存在的指示。

    Method, device and sensor for determining an absorption behavior of a medium
    27.
    发明授权
    Method, device and sensor for determining an absorption behavior of a medium 有权

    公开(公告)号：US10036702B2

    公开(公告)日：2018-07-31

    申请号：US14975799

    申请日：2015-12-20

    Applicant: Robert Bosch GmbH

    Inventor： Ingo Ramsteiner

    IPC: G01N21/00 ,  G01N21/31 ,  G01N21/85

    CPC classification number: G01N21/31 ,  G01N21/314 ,  G01N21/8507 ,  G01N2201/0662 ,  G01N2201/0668

    Abstract: A method is used to determine an absorption behavior of a medium. The method includes establishing an absorption coefficient of the medium using a first intensity value and at least one second intensity value and a length different between a first measurement distance and a second measurement distance. The first intensity value represents a measured first light intensity after passing over a first measurement distance in the medium. The second intensity value represents a measured second light intensity after passing over a second measurement distance in the medium. The first intensity value and the second intensity value are measured using light with a common initial intensity.

    System and method for defect detection and photoluminescence measurement of a sample
    28.
    发明授权
    System and method for defect detection and photoluminescence measurement of a sample 有权

    公开(公告)号：US09772289B2

    公开(公告)日：2017-09-26

    申请号：US15167721

    申请日：2016-05-27

    Applicant: KLA-Tencor Corporation

    Inventor： Romain Sappey

    IPC: G01N21/64 ,  G01N21/95 ,  G01N21/88

    CPC classification number: G01N21/6489 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2021/6495 ,  G01N2021/8845 ,  G01N2201/06113 ,  G01N2201/0662

    Abstract: Defect detection and photoluminescence measurement of a sample directing a beam of oblique-illumination wavelength light onto a portion of the sample, directing a beam of normal-illumination wavelength light for causing one or more photoluminescing defects of the sample to emit photoluminescent light onto a portion of the sample, collecting defect scattered radiation or photoluminescence radiation from the sample, separating the radiation from the sample into a first portion of radiation in the visible spectrum, a second portion of radiation including the normal-illumination wavelength light, and at least a third portion of radiation including the oblique-illumination wavelength light, measuring one or more characteristics of the first portion, the second portion or the third portion of radiation; detecting one or more photoluminescence defects or one or more scattering defects based on the measured one or more characteristics of the first portion, the second portion or the third portion of radiation.

    System and method for defect detection and photoluminescence measurement of a sample
    29.
    发明授权
    System and method for defect detection and photoluminescence measurement of a sample 有权
    样品的缺陷检测和光致发光测量的系统和方法

    公开(公告)号：US09354177B2

    公开(公告)日：2016-05-31

    申请号：US14212496

    申请日：2014-03-14

    Applicant: KLA-Tencor Corporation

    Inventor： Romain Sappey

    IPC: G01N21/64 ,  G01N21/88

    CPC classification number: G01N21/6489 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2021/6495 ,  G01N2021/8845 ,  G01N2201/06113 ,  G01N2201/0662

    Abstract: Defect detection and photoluminescence measurement of a sample directing a beam of oblique-illumination wavelength light onto a portion of the sample, directing a beam of normal-illumination wavelength light for causing one or more photoluminescing defects of the sample to emit photoluminescent light onto a portion of the sample, collecting defect scattered radiation or photoluminescence radiation from the sample, separating the radiation from the sample into a first portion of radiation in the visible spectrum, a second portion of radiation including the normal-illumination wavelength light, and at least a third portion of radiation including the oblique-illumination wavelength light, measuring one or more characteristics of the first portion, the second portion or the third portion of radiation; detecting one or more photoluminescence defects or one or more scattering defects based on the measured one or more characteristics of the first portion, the second portion or the third portion of radiation.

    Abstract translation: 样品的缺陷检测和光致发光测量将倾斜照明波长的光束引导到样品的一部分上，引导正常照明波长的光束，以使样品的一个或多个光致发光缺陷发射光致发光光到一部分上 收集来自样品的缺陷散射辐射或光致发光辐射，将来自样品的辐射分离成可见光谱中的辐射的第一部分，包括正常照明波长的光的第二部分辐射，以及至少三分之一 测量包括倾斜照明波长光的辐射部分，测量第一部分，第二部分或第三部分辐射的一个或多个特性; 基于所测量的第一部分，第二部分或第三部分辐射的一个或多个特性来检测一个或多个光致发光缺陷或一个或多个散射缺陷。

    INFRARED SENSOR WITH MULTIPLE SOURCES FOR GAS MEASUREMENT
    30.
    发明申请
    INFRARED SENSOR WITH MULTIPLE SOURCES FOR GAS MEASUREMENT 有权
    具有多种气源测量的红外传感器

    公开(公告)号：US20140306112A1

    公开(公告)日：2014-10-16

    申请号：US14317070

    申请日：2014-06-27

    Applicant: MSA TECHNOLOGY, LLC.

    Inventor： CHRISTOPHER D. STARTA ,  ROBERT E. UBER ,  THOMAS TRAUTZSCH ,  FREDERICK J. SCHULER

    IPC: G01N21/59

    CPC classification number: G01N21/59 ,  G01N21/3151 ,  G01N21/3504 ,  G01N2201/023 ,  G01N2201/0636 ,  G01N2201/0662

    Abstract: A closed path infrared sensor includes an enclosure, a first energy source within the enclosure, at least a second energy source within the enclosure, at least one detector system within the enclosure and a mirror system external to the enclosure and spaced from the enclosure. The mirror system reflects energy from the first energy source to the at least one detector system via a first analytical path and reflects energy from the second energy source to the at least one detector system via a second analytical path. Each of the first analytical path and the second analytical path are less than two feet in length.

    Abstract translation: 封闭路径红外传感器包括外壳，外壳内的第一能量源，外壳内的至少第二能量源，外壳内的至少一个检测器系统和外壳外部与外壳隔开的反射镜系统。 反射镜系统经由第一分析路径将来自第一能量源的能量反射到至少一个检测器系统，并且经由第二分析路径将来自第二能量源的能量反射到至少一个检测器系统。 第一分析路径和第二分析路径中的每一条长度小于两英尺。

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