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    SOLAR SIMULATOR
    295.
    发明公开
    SOLAR SIMULATOR 审中-公开
    SONNENSIMULATOR

    公开(公告)号：EP2549178A1

    公开(公告)日：2013-01-23

    申请号：EP11756215.7

    申请日：2011-03-14

    Applicant: Yamashita Denso Corporation ,  Holonix International Co. Ltd.

    Inventor： KUBO, Nobuhiko ,  TAKAHASHI, Kuniaki

    IPC: F21V13/12 ,  F21S2/00 ,  F21V3/00 ,  F21V3/04 ,  F21Y103/00

    CPC classification number: F21S8/006 ,  G01J1/0411 ,  G01J1/0418 ,  G01J1/0474 ,  G01J1/08

    Abstract: A solar simulator includes a light source, an optical reflection element positioned behind the light source to reflect light emitted from the light source in a form of pseudo parallel light, a low-angle light-diffusion optical element for diffusing the reflected light from the optical reflection element at a low diffusion angle, and a parallel light conversion optical element including a number of air holes arranged in parallel rows and provided with faculties for transmitting incident light parallel to the axis of the air holes to absorb or attenuate nonparallel incident light. The parallel light conversion optical element converts the incident light from the low-angle light-diffusion optical element to parallel light and emits the converted parallel light.

    Abstract translation: 太阳模拟器包括光源，位于光源后面的光反射元件，用于以伪平行光的形式反射从光源发射的光;用于使来自光学器件的反射光扩散的低角度光扩散光学元件 具有低扩散角的反射元件和平行光转换光学元件，其包括并排布置的多个气孔，并且设置有用于透射与空气孔的轴线平行的入射光的能量，以吸收或衰减不平行的入射光。 平行光转换光学元件将来自低角度光散射光学元件的入射光转换为平行光，并发射转换后的平行光。

    LIGHT SOURCE EVALUATION DEVICE, LIGHT SOURCE ADJUSTMENT SYSTEM, LIGHT SOURCE EVALUATION SYSTEM, AND LIGHT SOURCE EVALUATION METHOD
    297.
    发明公开
    LIGHT SOURCE EVALUATION DEVICE, LIGHT SOURCE ADJUSTMENT SYSTEM, LIGHT SOURCE EVALUATION SYSTEM, AND LIGHT SOURCE EVALUATION METHOD 审中-公开
    LICHTQUELLENEVALUIERGSGORRICHTUNG，LICHTQUELLENEINSTELLUNGSSYSTEM，LICHTQUELLENEVALUIERUNGSSYSTEM UND LICHTQUELLENEVALUIERVER

    公开(公告)号：EP2448006A1

    公开(公告)日：2012-05-02

    申请号：EP10792013.4

    申请日：2010-06-17

    Applicant: Konica Minolta Sensing, Inc.

    Inventor： NISHIKAWA Yoshihiro

    IPC: H01L31/04 ,  G01J3/00

    CPC classification number: G01J1/08 ,  G01J3/0218 ,  G01J3/0254 ,  G01J3/14 ,  G01J3/18 ,  G01J3/2803 ,  G01J2001/4247

    Abstract: Provided are a light source evaluation device, a light source adjustment system, a light source evaluation system, and a light source evaluation method whereby it is possible to evaluate the characteristics of a solar simulator, which is a light source for measuring the characteristics of a solar cell, without creating a reference cell or pseudo cell tailored to the spectral sensitivity of a solar cell to be measured. Said evaluation is performed by calculating an evaluation value of the characteristics of the light emitted by a solar simulator in comparison to natural sunlight on the basis of the spectral irradiance of the light emitted by a solar simulator as measured by a spectroradiometer, the spectral irradiance of natural sunlight, and the pre-measured spectral sensitivity of the solar cell to be measured.

    Abstract translation: 提供了一种光源评估装置，光源调节系统，光源评估系统和光源评估方法，由此可以评估作为用于测量a的特性的光源的太阳模拟器的特性 太阳能电池，而不产生根据待测量的太阳能电池的光谱灵敏度调整的参考电池或伪电池。 所述评估通过基于由太阳模拟器发射的光的光谱辐照度，通过由光谱辐射计测量的太阳模拟器的光谱辐照度来计算由太阳模拟器发射的光的特性与自然阳光的特性的评估值，光谱辐照度 自然阳光和待测量的太阳能电池的预测光谱灵敏度。

    LARGE-ANGLE UNIFORM RADIANCE SOURCE
    298.
    发明公开
    LARGE-ANGLE UNIFORM RADIANCE SOURCE 有权
    高光束均匀的射线源

    公开(公告)号：EP2406598A1

    公开(公告)日：2012-01-18

    申请号：EP09789507.2

    申请日：2009-03-12

    Applicant: Raytheon Company ,  Todd, Marion N.

    Inventor： TODD, Marion, N. ,  MACK, John, A. ,  ROCK, David, F.

    IPC: G01J1/08 ,  G01J3/10 ,  G01J5/52

    CPC classification number: G01J1/08 ,  G01J1/04 ,  G01J1/0474 ,  G01J3/10 ,  G01J5/522 ,  G01J2001/0481

    Abstract: A radiance source (20) includes a housing (40) having an interior wall (42), wherein at least a spherical portion of the interior wall (42) of the housing (40) is spherical, an interior volume (46) and an exit port (48). A light source (82) is disposed within the interior volume (46) of the housing (40). A calibration structure (84) blocks and reflects a light ray that would otherwise travel directly from the light source (82) to the exit port (48) without reflecting from the interior wall (42). The calibration structure (84) has a calibration body (86) having a curved back surface (88) facing the light source (82) and a curved front surface (90) facing the exit port (48). There is an optically diffuse, lambertian reflecting surface (96) on at least the spherical portion of the interior wall (42) of the housing (40), the back surface (88) of the calibration body (86), and the front surface (90) of the calibration body (86).

    A PARTICULATE DETECTOR
    300.
    发明公开
    A PARTICULATE DETECTOR 有权
    TEILCHENDETEKTOR

    公开(公告)号：EP2350616A1

    公开(公告)日：2011-08-03

    申请号：EP09785183.6

    申请日：2009-10-01

    Applicant: Thorn Security Limited

    Inventor： PENNEY, Stephen, John ,  SHAW, John, E., A. ,  TAYLOR, Paul, J. ,  BENNETT, Steven, Ian

    IPC: G01N21/53 ,  G01N15/02 ,  G08B17/107

    CPC classification number: G01N21/53 ,  F21K9/64 ,  F21V7/06 ,  F21V9/30 ,  F21Y2115/10 ,  G01J1/0214 ,  G01J1/0422 ,  G01J1/08 ,  G01N15/0211 ,  G01N2021/3181 ,  G01N2021/4733 ,  G01N2201/06193 ,  G01N2201/0625 ,  G01N2201/0696 ,  G08B17/107 ,  G08B17/113 ,  G08B17/117

    Abstract: A particulate detector (10) comprises a radiation source (12) arranged to emit radiation in at least first and second predetermined wavebands towards a sampling region (18) suspected of containing particulates, and a detection element (14), shielded from the radiation source (12), and arranged to detect radiation from the sampling region (18) at least first and second instances. The radiation source (12) is such that the emissions in the wavebands temporarily overlap. The detector is such that, at the instances at which the radiation is detected, the relative contributions from the emissions in each predetermined waveband are distinguishable, thereby allowing characteristics of the particulates to be determined. The radiation source (12) may comprise a light emitting diode (24).

    Abstract translation: 微粒检测器（10）包括辐射源（12），其被布置成在至少第一和第二预定波段中向被怀疑含有微粒的采样区域（18）发射辐射;以及检测元件（14），其与辐射源 （12），并且被布置成在至少第一和第二实例中检测来自采样区域（18）的辐射。 辐射源（12）使得波段中的发射暂时重叠。 检测器使得在检测到辐射的情况下，来自每个预定波段中的发射的相对贡献是可区分的，从而允许确定颗粒的特性。 辐射源（12）可以包括发光二极管（24）。

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