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公开(公告)号：DE3539667A1
公开(公告)日：1987-05-14
申请号：DE3539667
申请日：1985-11-08
Applicant: BRUKER ANALYTISCHE MESSTECHNIK
Inventor： GAST JUERGEN DIPL PHYS , SIMON ARNO DIPL PHYS DR
Abstract: In an IR-FR- spectrometer, a light beam (10) is guided from a source to a detector (31) and is passed, in a first mode of operation, by means of first optical means (12, 19, 20) through a sample to be measured (28) and, in a second mode of operation, by second optical means (12, 22, 21) through a reference sample (32). The first and second optical means comprise a common mirror element (12) having at least first and second mirror surfaces (13, 14, 15, 16) which are inclined relative to each other. The mirror surfaces abut in at least one point. There is provided means for moving the mirror element (12) relative to the light beam so that during such relative movement the impinging point of the light beam (10) is displace from the first mirror surface (13), over onto the second mirror surface (14).
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公开(公告)号：DE2539183C2
公开(公告)日：1986-06-19
申请号：DE2539183
申请日：1975-09-03
Applicant: THE PERKIN-ELMER CORP., NORWALK, CONN., US
IPC: G01J3/08 , G01J3/02 , G01J3/42 , G01N21/25 , G02B5/08 , G02B5/12 , G02B27/14 , G01J1/04 , G01N21/31 , G02B27/10
Abstract: A pair of beam splitters for an optical instrument wherein one beam splitter is used to divide source radiation into a sample and reference beam while the second beam splitter recombines the sample and reference beams prior to their entering a monochromator. In order to reduce schlieren effects, each beam splitter is provided with stripes of alternating reflective and transmitting portions. The edges of the stripes of each beam splitter lie wholly within the optical aperture while the ends of the stripes extend outwardly of the optical aperture. The beam splitters are oriented in such a manner that the stripes are orthogonal.
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公开(公告)号：BG38748A1
公开(公告)日：1986-02-28
申请号：BG5316781
申请日：1981-08-04
Applicant: LE N PROIZV OB BUREVESTNIK
IPC: G01J3/08
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公开(公告)号：FR2566902A1
公开(公告)日：1986-01-03
申请号：FR8509825
申请日：1985-06-27
Applicant: ZEISS JENA VEB CARL
Inventor： FLOREK STEFAN , BECKER-ROSS HELMUT , DOBSCHAL HANS-JURGEN , MOHR JOACHIM
Abstract: The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.
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Patent Agency Ranking
公开(公告)号：FR2444264B1
公开(公告)日：1985-08-30
申请号：FR7930592
申请日：1979-12-13
Applicant: HEWLETT PACKARD CO
Abstract: A beam directing device is provided which employs one or more mirrors mounted on a single rotatable shaft. The orientation of the shaft controls the rotational orientation of these directing mirror(s) to direct the beam toward any of a number of sample or reference cells. Behind each cell is a cube corner which reflects the beam back to the directing mirror(s) for reflection toward the detector. In one embodiment, a shaft encoded senses the orientation of the shaft, the encoder output being servoed against a position signal to coarsely rotate the shaft in order to direct the beam to a sample cell and thence to a spectrograph slit. A pair of slit diodes detect the beam overlap on each side of the slit and their output is used to accurately position the beam on the slit to within one second of arc and correct for deviations in beam direction.
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公开(公告)号：GB2112164B
公开(公告)日：1985-02-27
申请号：GB8208786
申请日：1982-03-25
Applicant: SHIMADZU CORP
Inventor： ICHIKAWA TETSUO , AKIYAMA OSAMU , HIRA RIKUO , NISHIMURA TAKASHI
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公开(公告)号：CA1173663A
公开(公告)日：1984-09-04
申请号：CA394444
申请日：1982-01-19
Applicant: COMMW OF AUSTRALIA
Inventor： SKINNER DAVID R , STOKES REX A , FREEMAN LEWIS O , MCNEILL ALAN R
Abstract: This invention relates to an optical system which will enable easy use in the field. Known systems either require sample and reference targets to be imaged within the telescope field or do not enable accurate identification of the measuring field in a view finder. The present invention overcomes this problem by providing a system having a first branch and a second branch which receive light from a sample and reference target respectively. A shutter sequentially allows light from the two branches to pass to a mirror having a slit, reflective portions and transparent portions. Light from the first branch passes through these portions to a detecting branch and some light is reflected through a lens to an eye piece. Similarly some light from the second branch passes through the mirror to the eye piece and some light is reflected to the detecting branch. Accordingly the measuring field can be accurately identified by looking through the eye piece whilst at the same time light is directed to the detecting branch for analysis.
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公开(公告)号：GB2112164A
公开(公告)日：1983-07-13
申请号：GB8208786
申请日：1982-03-25
Applicant: SHIMADZU CORP
Inventor： ICHIKAWA TETSUO , AKIYAMA OSAMU , HIRA RIKUO , NISHIMURA TAKASHI
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公开(公告)号：GB2110836A
公开(公告)日：1983-06-22
申请号：GB8229749
申请日：1982-10-18
Applicant: BRUKER ANALYTISCHE MESSTECHNIK
Inventor： GAST JURGEN , WUNSCH DR LUTZ , ZACHMANN GUNTER
Abstract: An auxiliary device enabling reflection measurements to be carried out by an IR spectrometer designed for the performance of transmission measurements comprises two deflecting mirrors (22, 23) to be positioned in the straight beam section of the spectrometer and two focussing reflector arrangements (26, 2, 27) of which the first forms at the location of the sample (16) to be investigated by the reflection method a reduced image of the focus (30) situated within the ray of beams (28) deflected by the first deflecting mirror (22) while the said second focussing reflector arrangement forms an enlarged image of the said reduced focus at a distance before the said second deflecting mirror (23) so that the beam of rays (33) emitted by the said second deflecting mirror forms a prolongation of the beam of rays inciding upon the said first deflecting mirror just as if the auxiliary device did not exist. Each reflector arrangement comprises a collimator mirror (26, 27) for parallelizing the divergent beam of rays emitted by the associated deflecting mirror (22, 23) and sections of a common parabolic mirror (2), the beams of rays (29, 31) emitted by the said collimator mirror (26, 27) extending in parallel to the axis of the said parabolic mirror (2) and the sample being arranged at a point coinciding with its focal point (16).
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