Abstract:
A method of selecting components for a multivariate optical computing and analysis system to isolate a spectral region includes selecting a spectral region of interest; selecting a spectral element with a predetermined transmission characteristic to control a spectral range of an illumination source; illuminating a sample with the illumination source; and analyzing an optical frequency returned by the sample relative to the spectral region of interest.
Abstract:
A method of developing a multivariate optical element for an optical analysis system includes forming an optically absorptive spectral element having an optically absorptive material, the optically absorptive material being absorbing in a predetermined spectral region; and utilizing the optically absorptive spectral element in the optical analysis system.
Abstract:
A method and apparatus is disclosed for using below deep ultra-violet (DUV) wavelength reflectometry for measuring properties of diffracting and/or scattering structures on semiconductor work-pieces is disclosed. The system can use polarized light in any incidence configuration, but one technique disclosed herein advantageously uses un-polarized light in a normal incidence configuration. The system thus provides enhanced optical measurement capabilities using below deep ultra-violet (DUV) radiation, while maintaining a small optical module that is easily integrated into other process tools. A further refinement utilizes an r-θ stage to further reduce the footprint.
Abstract:
The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.
Abstract:
A fluorescence detection system comprises a light source configured to produce an excitation light, an optical lens and a fiber bundle. The optical lens is configured to focus the excitation light to a sample to emit fluorescence and to collect the fluorescence. The fiber bundle probe comprises a transmitting fiber configured to transmit the excitation light to the optical lens, and a first receiving fiber configured to deliver the collected fluorescence. The fluorescence detection system further comprises a first detector configured to detect the fluorescence delivered by the receiving fiber to generate a response signal, and a processing unit configured to determine information about the samples by analyzing the response signal. Additionally, a fluorescence detection method is also presented.
Abstract:
This invention relates to a spectroscopic apparatus for measuring at least two spectrally shifted spectral distributions of a light beam, said apparatus comprises a dispersive element adapted to generate a spatial dispersion of the spectral components in a light beam when said dispersive element is being illuminated by said light beam; and a detector adapted to measure the intensity of at least a part of said dispersed spectral components where said apparatus further comprises an optical shifting means adapted to illuminate said dispersive element in at least two different ways, such that said light beam hits said dispersive element differently, and whereby said dispersive element generates at least two spatially shifted spatial dispersions of the spectral components in said light beam. The invention further relates to a probing system comprising said spectroscopic apparatus for measuring at least two spectrally shifted spectral distributions of a light beam, and a method for measuring at least two spectrally shifted spectral distributions of a light beam.
Abstract:
Disclosed is a system and methodologies for providing self-calibration in an optical analysis system. Illumination light is directed toward a material to be sampled while provisions are made to modify the characteristics of at least a portion of the illumination light falling on a reference detector. The modified characteristics may include light presence and/or spectral characteristics. Light presence may be modified by rotating or moving mirror assemblies to cause light to fall on either a sample detector or a reference detector while spectral characteristics may be modified by placing materials having known spectral characteristics in the path of the illumination light.
Abstract:
A time-domain pulsed spectroscopy apparatus which has a pulsed laser light source; a splitting unit to split pulsed laser light; a pulsed-light emitting unit; a detector; a sample holder; and a sample-unit entrance and exit optical systems; wherein the time-domain pulsed spectroscopy apparatus further comprises: at least one optical-path-length varying unit for setting a photometric range; at least one optical delay unit for the wave form signal measurement; and, at least one gate member to pass or block the pulsed light to a reflector.
Abstract:
The present invention provides a spectral filter for an optical sensor. The spectral filter includes a substrate having a focus region and a defocus region, a panchromatic filter region disposed on the focus region of the substrate and a multi-spectral filter region disposed on the defocus region of the substrate. The panchromatic filter region includes a plurality of panchromatic pixels, while the multi-spectral filter region includes a plurality of multi-spectral pixels. Each of the multi-spectral pixels includes a plurality of color pixels.
Abstract:
A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.