Spectrum measuring device
    376.
    发明专利
    Spectrum measuring device 有权
    光谱测量装置

    公开(公告)号:JP2011220867A

    公开(公告)日:2011-11-04

    申请号:JP2010090879

    申请日:2010-04-09

    Abstract: PROBLEM TO BE SOLVED: To provide a spectrum measuring device that can, despite a simple configuration, remove or reduce the influences of environmental light contained in the spectrum of an object of measurement and thereby enhance the accuracy of recognition of the object.SOLUTION: A spectrum measuring device 11 recognizes an object of measurement on the basis of spectrum data S0 of observation light detected by a spectrum sensor 14 that is capable of measuring wavelength information and light intensity information. The spectrum measuring device 11 has a first recognition unit 30 dividing or subtracting, by or from the other, one of two sets of spectrum data detected at two different positions by the spectrum sensor 14 to calculate one set of correlation spectrum data correlating to the two original sets of spectrum data, and identifies at the same time the object of measurement corresponding to the two different positions on the basis of the calculated set of correlation spectrum data.

    Abstract translation: 要解决的问题:提供一种频谱测量装置,尽管结构简单,但可以消除或减少包含在测量对象的光谱中的环境光的影响,从而提高对象的识别精度。 解决方案:光谱测量装置11基于能够测量波长信息和光强度信息的光谱传感器14检测到的观察光的光谱数据S0,识别测量对象。 频谱测量装置11具有第一识别单元30,其通过频谱传感器14在两个不同位置处检测的两组频谱数据中的一组分频或相减,以计算与两者相关的一组相关频谱数据 原始的频谱数据集合,并且基于所计算的相关频谱数据集合,同时识别与两个不同位置相对应的测量对象。 版权所有(C)2012,JPO&INPIT

    Raman signal measuring method and raman signal measuring instrument
    378.
    发明专利
    Raman signal measuring method and raman signal measuring instrument 有权
    拉曼信号测量方法和拉曼信号测量仪器

    公开(公告)号:JP2009236548A

    公开(公告)日:2009-10-15

    申请号:JP2008080217

    申请日:2008-03-26

    CPC classification number: G01J3/44 G01J3/0205 G01J3/0264 G01J3/027 G01N21/65

    Abstract: PROBLEM TO BE SOLVED: To provide a Raman signal measuring method which enables a reduction in the irregularity of signal intensity between fine structure substrates.
    SOLUTION: A target specimen is brought into contact with the detection surface of the fine structure substrate irradiated with exciting light to produce an electric field increasing field or the target specimen is positioned in the vicinity of the detection surface; the detection surface, with which the target specimen is in contact or in the vicinity of which the target specimen is present, is irradiated with the exciting light; the Raman scattered light produced from the detection surface or from the vicinity thereof is increased; the increased Raman scattered light is detected to obtain the Raman signal produced from the target specimen and a background signal becoming reference; and the intensity of the obtained Raman signal of the target specimen is divided by the intensity of the background signal obtained as the reference to standardize the Raman signal of the target specimen.
    COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 解决的问题:提供能够减少精细结构基板之间的信号强度的不规则性的拉曼信号测量方法。 解决方案:使目标样品与被激发的光照射的精细结构基板的检测面接触,产生电场增加场,或者将目标样本置于检测面附近; 与目标试样接触的检测面或其附近存在目标试样的检测面用激发光照射; 从检测面或其附近产生的拉曼散射光增加; 检测增加的拉曼散射光以获得从目标样品产生的拉曼信号和背景信号变为参考; 将目标样品的拉曼信号的强度除以作为基准的背景信号的强度,标准化目标样品的拉曼信号。 版权所有(C)2010,JPO&INPIT

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