APPARATUS FOR EQUIPMENT MONITORING
    32.
    发明申请

    公开(公告)号:US20220236144A2

    公开(公告)日:2022-07-28

    申请号:US17480163

    申请日:2021-09-21

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for equipment monitoring includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with batches of temporal sensor data for an item of equipment. Each batch of temporal sensor data includes temporal sensor values as a function of time. The processing unit is configured to process the batches of temporal sensor data to determine batches of spectral sensor data. Each batch of spectral sensor data includes spectral sensor values as a function of frequency. The processing unit is configured to implement at least one statistical process algorithm to process the spectral sensor values for the batches of spectral sensor data to determine index values. For each batch of spectral sensor data there is an index value determined by each of the statistical process algorithms.

    APPARATUS FOR EQUIPMENT MONITORING
    33.
    发明申请

    公开(公告)号:US20220003637A1

    公开(公告)日:2022-01-06

    申请号:US17480163

    申请日:2021-09-21

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for equipment monitoring includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with batches of temporal sensor data for an item of equipment. Each batch of temporal sensor data includes temporal sensor values as a function of time. The processing unit is configured to process the batches of temporal sensor data to determine batches of spectral sensor data. Each batch of spectral sensor data includes spectral sensor values as a function of frequency. The processing unit is configured to implement at least one statistical process algorithm to process the spectral sensor values for the batches of spectral sensor data to determine index values. For each batch of spectral sensor data there is an index value determined by each of the statistical process algorithms.

    METHOD AND A SYSTEM FOR APPLYING MACHINE LEARNING TO AN APPLICATION

    公开(公告)号:US20210264317A1

    公开(公告)日:2021-08-26

    申请号:US17317926

    申请日:2021-05-12

    Applicant: ABB Schweiz AG

    Abstract: A method for applying machine learning to an application includes: a) generating a candidate policy by a learner; b) executing a program in at least one simulated application based on a set of candidate parameters provided based on the candidate policy and a state of the at least one simulated application, execution of the program providing interim results of tested sets of candidate parameters based on a measured performance information of the execution of the program; c) collecting a predetermined number of interim results and providing an end result based on a combination of the candidate parameters and/or the state with the measured performances information by a trainer; and d) generating a new candidate policy by the learner based on the end result.

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