Apparatus and method for obtaining information indicative of uniformity of projection system of lithographic apparatus
    33.
    发明专利
    Apparatus and method for obtaining information indicative of uniformity of projection system of lithographic apparatus 审中-公开
    用于获取表示平面设备投影系统均匀性的信息的装置和方法

    公开(公告)号:JP2009116322A

    公开(公告)日:2009-05-28

    申请号:JP2008263556

    申请日:2008-10-10

    Inventor: STREEFKERK BOB

    CPC classification number: G03B27/52 G03F7/70591

    Abstract: PROBLEM TO BE SOLVED: To provide an apparatus and a method used to obtain information indicative of the uniformity of a projection system of a lithographic apparatus. SOLUTION: An electromagnetic radiation beam is directed toward a projection system such that the radiation beam passes from a first end of the projection system to a second end of the projection system. The electromagnetic radiation beam is subsequently directed back toward the projection system such that the electromagnetic radiation beam passes from the second end of the projection system to the first end of the projection system. At least a part of the electromagnetic radiation beam is detected after the electromagnetic radiation beam has passed back through the projection system to obtain information indicative of the uniformity of the projection system. COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种用于获得指示光刻设备的投影系统的均匀性的信息的装置和方法。 解决方案:电磁辐射束被引向投影系统,使得辐射束从投影系统的第一端传播到投影系统的第二端。 电磁辐射束随后被引导回投影系统,使得电磁辐射束从投影系统的第二端延伸到投影系统的第一端。 在电磁辐射束已经通过投影系统返回之​​后,检测到电磁辐射束的至少一部分,以获得指示投影系统的均匀性的信息。 版权所有(C)2009,JPO&INPIT

    Lithographic apparatus, device manufacturing method, and substrate
    37.
    发明专利
    Lithographic apparatus, device manufacturing method, and substrate 有权
    光刻设备,器件制造方法和基板

    公开(公告)号:JP2008098681A

    公开(公告)日:2008-04-24

    申请号:JP2008001122

    申请日:2008-01-08

    Abstract: PROBLEM TO BE SOLVED: To provide a lithographic apparatus, a device manufacturing method and a substrate. SOLUTION: A substrate W is provided with a coating 4 of a material which is substantially transparent to a wavelength of a projection beam. The coating may be thicker than the wavelength of the projection beam and have a refractive index of the coating 4 such that the wavelength of the projection beam is shortened as the projection beam passes through the coating. This allows the imaging of smaller features on the substrate. Alternatively, the coating may be used with a liquid supply system and act to keep bubbles away from a radiation sensitive layer of the substrate. COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题:提供光刻设备,器件制造方法和衬底。 解决方案:衬底W设置有对投影光束的波长基本透明的材料的涂层4。 涂层可以比投影光束的波长厚,并且具有涂层4的折射率,使得当投影光束通过涂层时,投影光束的波长被缩短。 这允许在衬底上成像较小的特征。 或者,涂层可以与液体供应系统一起使用,并且用于保持气泡远离基底的辐射敏感层。 版权所有(C)2008,JPO&INPIT

    Lithographic apparatus and method of manufacturing device
    40.
    发明专利
    Lithographic apparatus and method of manufacturing device 有权
    光刻设备及其制造方法

    公开(公告)号:JP2005340815A

    公开(公告)日:2005-12-08

    申请号:JP2005147548

    申请日:2005-05-20

    CPC classification number: G03F7/70341 G03F7/70641 G03F7/70783

    Abstract: PROBLEM TO BE SOLVED: To provide a lithographic apparatus and a method of manufacturing a device configured to introduce an immersion liquid and a liquid supply system associated therewith into the lithographic apparatus so as to solve the problem of causing degradation in the accuracy of focus at the substrate and in the precision with which other parameters critical to imaging are controlled.
    SOLUTION: The immersion lithographic apparatus includes a liquid supply system member configured to contain a liquid in a space between a projection system of the lithographic apparatus and the substrate and a liquid supply system member compensator arranged to compensate an interaction between the liquid supply system member and substrate table.
    COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:提供一种光刻设备和一种制造器件的方法,该器件被配置为将与其相关联的浸没液体和液体供应系统引入到光刻设备中,以解决导致其精度降低的问题 在基板上的焦点和控制成像关键的其他参数的精度。 浸没式光刻设备包括液体供应系统构件,其配置为在光刻设备的投影系统和基板之间的空间中容纳液体,液体供应系统构件补偿器被布置成补偿液体供应 系统构件和衬底台。 版权所有(C)2006,JPO&NCIPI

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