Abstract:
PROBLEM TO BE SOLVED: To provide a pattern forming method that has excellent uniformity and exposure latitude of a local pattern dimension in formation of a fine pattern such as a hole pattern with a pore diameter of 45 nm or smaller and suppresses the occurrence of a water residue defect, an actinic ray-sensitive or radiation-sensitive resin composition used for the same, a resist film, a manufacturing method of an electronic device, and an electronic device; in particular, a pattern forming method suitable for liquid immersion exposure, an actinic ray-sensitive or radiation-sensitive resin composition used for the same, a resist film, a manufacturing method of an electronic device, and an electronic device.SOLUTION: A pattern forming method includes: (a) a step of forming a film by an actinic ray-sensitive or radiation-sensitive resin composition containing a resin (A) that increases polarity by the action of acid and decreases solubility to a developing solution containing an organic solvent, a compound (B) that generates acid by irradiation with an actinic ray or radiation, a solvent (C), and a resin (D) that is different from the resin (A) and substantially does not contain fluorine atoms and silicon atoms; (b) a step of exposing the film; and (c) a step of developing the film by using a developing liquid containing an organic solvent to form a negative pattern. The content of the resin (D) relative to the total solid content of the actinic ray-sensitive or radiation-sensitive resin composition is 0.1 mass% or more and less than 10 mass%; and the mass content of a CHpartial structure of a side chain part in the resin (D) accounts for 12.0% or more of the resin (D).
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition, capable of forming a resist film that is excellent in a pattern cross-sectional shape and in suppressing occurrence of pattern collapse and defects attributed to residual water and is never deteriorated in performance of suppressing occurrence of the defects attributed to residual water and obtaining the excellent pattern cross-sectional shape even when the resist film is produced by using a resist solution left to stand for a certain time, to provide a resist film formed by using the composition, a pattern forming method using the composition, and to provide a method for manufacturing an electronic device and an electronic device.SOLUTION: There is provided an actinic ray-sensitive or radiation-sensitive resin composition including: (A) a resin having a repeating unit expressed by general formula (1) and a repeating unit that is decomposed by an action of an acid to generate an alkali-soluble group; (B) a compound that generates an acid by irradiation with actinic rays or radiation; and (C) a resin having at least any of a fluorine atom and a silicon atom. In general formula (1), L represents a single bond or a divalent connecting group, and Z represents a cyclic acid anhydride group.
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray sensitive or radiation sensitive resin composition capable of suppressing occurrence of pattern collapse and improving line edge roughness, and to provide an actinic ray sensitive or radiation sensitive film and pattern forming method using the same.SOLUTION: An actinic ray sensitive or radiation sensitive resin composition includes: (A) a resin comprising a repeating unit represented by the following general formula (1) and a repeating unit that is decomposed by action of an acid to generate an alkali-soluble group; and (B) a compound generating an acid by irradiation with an actinic ray or radiation. In the general formula (1), L represents a divalent linking group. Rrepresents a hydrogen atom or an alkyl group, and Z represents a cyclic acid anhydride structure.
Abstract:
PROBLEM TO BE SOLVED: To provide a colored curable composition capable of forming a colored cured film with less dependence on developing time in pattern formation and with high light resistance.SOLUTION: A colored curable composition includes at least (A-1) a complex including a compound and a metal atom or a metal compound expressed by the following general formula (I) and (A-2) a phthalocyanine pigment, (B) a dispersant, (C) a polymerizable compound, (D) a photoinitiator, and (E) an organic solvent.
Abstract:
PROBLEM TO BE SOLVED: To provide a colored curable composition, resist liquid, inkjet ink, color filter, method for producing the color filter, solid image element, liquid crystal display, organic EL display, image display device, and a pigment compound suitable for these products. SOLUTION: The colored curable composition contains at least one of compounds represented by general formula (1) and tautomers thereof, wherein -L 1 - or -L 2 - substitutes to a dipyrromethene skeleton through R 1 -R 6 or directly. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a colored curable composition which can form a colored cured film excellent in heat resistance. SOLUTION: The colored curable composition includes a metal complex having a specific pyrromethene structure, a polymerizable compound, a photopolymerization initiator of formula (8), and an organic solvent, wherein R 1' represents a substituent containing an aromatic ring or a hetero aromatic ring; R 1a represents alkyl having a specific substituent; and R 2a represents alkanoyl, alkenoyl, aryloyl or the like. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a colored curable composition in a color from magenta to violet useful for a color filter and having excellent color purity, a high absorption coefficient and excellent pattern forming property. SOLUTION: The colored curable composition includes at least one of compounds expressed by general formula (A) or (B) or tautomers thereof. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method for forming a negative pattern, in which a pattern excellent in the depth of focus (DOF), uniformity in a local pattern dimension and resolution can be formed even when a pattern having various features including a contact hole pattern is to be formed, and to provide a method for manufacturing an electronic device including the above pattern forming method, an electronic device, and an actinic ray-sensitive or radiation-sensitive resin composition.SOLUTION: The method for forming a negative pattern includes steps of (1) forming a film comprising an actinic ray-sensitive or radiation-sensitive resin composition, (2) exposing the film and (3) developing the exposed film by using a developing solution containing an organic solvent. The actinic ray-sensitive or radiation-sensitive resin composition comprises (G) a non-polymeric compound having a molecular weight of 500 or more and containing a nitrogen atom and either a fluorine atom or a silicon atom.
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray sensitive resin composition which is excellent in exposure latitude and generates little scum, a resist film formed using the composition, and a pattern forming method using the composition, and to provide a method for manufacturing an electronic device and an electronic device.SOLUTION: An actinic ray sensitive resin composition contains (A) a resin having a repeating unit represented by the following general formula (1) and a repeating unit which is decomposed by an action of an acid to generate an alkali-soluble group, and (B) a compound, represented by the following general formula (Z-1), which generates an acid by irradiation with an actinic ray. K represents a cyclic acid anhydride group, and A represents a cyclic organic group.