公开(公告)号：AU8615701A

公开(公告)日：2002-05-27

申请号：AU8615701

申请日：2001-09-17

Applicant: IBM

Inventor： BINNIG GERD K ,  DURIG URS T

IPC: G01B7/34 ,  G01D5/16 ,  G01Q20/00 ,  G11B9/00 ,  G11B19/04

Abstract: Described is a method for reading an array of sensors having a set of row conductors each connected to the sensors in a corresponding row of the array and a set of column conductors each connected to the sensors in a corresponding column of the array such that each sensor is connected between a row conductor and a column conductor. The method comprises: for each row of sensors in the array, performing a read cycle comprising applying an activation pulse to the corresponding row conductor to activate the sensors in the row, applying a reading pulse to the row conductor on expiry of a predetermined time interval from an edge of the activation pulse, and during the reading pulse, detecting, for each sensor in the row, a value dependent on a variable characteristic of that sensor. The read cycle for at least one row is commenced during the predetermined time interval of the read cycle for another row. In a preferred example described in detail, the sensors are thermal resistance sensors, the activation pulse is a heating pulse to heat the sensors, and the variable characteristic is resistance.

公开(公告)号：CA1270132A

公开(公告)日：1990-06-12

申请号：CA519172

申请日：1986-09-26

Applicant: IBM

Inventor： BINNIG GERD K

IPC: G01B7/34 ,  G01B21/30 ,  G01N37/00 ,  G01Q20/00 ,  G01Q60/24 ,  G01N27/00 ,  G01L1/00 ,  H01J37/28

Abstract: Method and Atomic Force Microscope for Imaging Surfaces with Atomic Resolution A sharp point (5) is brought so close to the surface of a sample (4) to be investigated that the forces occurring between the atoms at the apex of the point (5) and those at the surface cause a spring-like cantilever (7) to deflect. The cantilever (7) forms one electrode of a tunneling microscope, the other electrode being a sharp tip (8). The deflection of the cantilever (7) provokes a variation of the tunnel current, and that variation is used to generate a correction signal which can be employed to control the distance between said point (5) and the sample (4), in order, for example, to maintain the force between them constant as the point (5) is scanned across the surface of the sample (4) by means of an xyz-drive (3). In certain modes of operation, either the sample (4) of the cantilever (7) may be excited to oscillate in z-direction. If the oscillation is at the resonance frequency of the cantilever (7), the resolution is enhanced.