Abstract:
PROBLEM TO BE SOLVED: To provide a flip chip mounted structure for preventing inter-bump short circuit. SOLUTION: A solder bump 3 is formed on a device side electrode 4 formed on the lower face of a semiconductor device 1. A substrate side electrode 5 is formed at the site of a substrate for mounting corresponding to the solder bump 3, and a recess 6 is formed at each substrate side electrode 5. In this case, the face of the semiconductor device 1 on which the device side electrode 4 is formed is faced to the substrate 2 for mounting, the positions of the device side electrode 4 and the substrate side electrode 5 formed at the substrate 2 for mounting are matched, the semiconductor device 1 is placed on the substrate 2 for mounting, and the solar bump 3 is heated and melted so that the device side electrode 4 of the semiconductor device 1 and the substrate side electrode 5 of the substrate 2 for mounting can be electrically and mechanically connected. Any surplus solder is allowed to flow in the recess 6 formed at the substrate side electrode 5.
Abstract:
PROBLEM TO BE SOLVED: To provide a flit-chip mounting structure preventing short circuits between bumps. SOLUTION: In this flip-chip mounting structure, solder bumps 3 are respectively formed in a plurality of element side electrodes, provided in a semiconductor element 1. Substrate side electrodes 4 are respectively formed at portions of a mounting substrate 2, corresponding to each solder bump 3, and pairs of grooves 5 are formed at portions between each substrate side electrode 4 in the mounting substrate 2. Here, the plane of the semiconductor element 1 forming the solder bump 3 is made to confront the mounting substrate 2, and the substrate side electrode 4 formed in the solder bump 3 and the mounting substrate 2 is positioned, and the semiconductor element 1 is mounted on the mounting substrate 2. Thereafter, if the solder bump 3 is heated and bused, an element side electrode of the semiconductor element 1 is connected electrically and mechanically To the substrate side electrode 4 of the mounting substrate 2. At This time, since surplus solder runs over from the substrate side electrode 4 and flows into the groove 5 provided in the mounting substrate 2, short-circuiting the space between adjacent solder bumps 3 is prevented.
Abstract:
PROBLEM TO BE SOLVED: To provide a light transmitting element with extended angular range which can transmit and receive an optical signal with an equipment on the other side. SOLUTION: A light emitting element, light receiving element, and IC for signal processing are bare chip-mounted on a mounting board, and the light emitting element, light receiving element, and IC are sealed by translucent sealing resin, and a flood lens 6 and a light receiving lens 7 are formed in the optical axial direction of the light emitting element and the light receiving element by the sealing resin so that a light transmitting element A can be constituted. The light receiving lens 7 is constituted of a spherical lens, and the vertical and horizontal beam width of a received beam is made almost the same. The flood lens 6 is constituted of a cylindrical lens or the like, and the vertical and horizontal beam width of a projected beam is made different. The beam width in a direction orthogonally crossing the array direction of the light emitting element and the light receiving element is made wider than the beam width in a direction in parallel to the array direction of the light emitting element and the light receiving element.
Abstract:
PROBLEM TO BE SOLVED: To obtain a detection method that detects stress distribution in an on-board inspection process for semiconductor chips mounted flip chips on using a relative low cost and an easy inspection method. SOLUTION: Pattern P for detecting Moire interference is formed on the surface of a semiconductor chip 1 to detect deformation of the chip 1 caused from stress occurred by Moire interference method using the pattern. The pattern P for detecting Moire interference formed on the surface of the chip 1 is preferably chosen one from among linear-, fringe-, concentration-, or grid-like shapes. Also, a forming method that forms the pattern P for Moire interference on the chip 1 is chosen either a method that digs a ditch on a wafer by anisotropy etching or a method that adds pattern by printing and imprinting on the surface of the chip 1 already mounted a flip chip on.
Abstract:
PROBLEM TO BE SOLVED: To provide an appliance control system wherein operation of each home appliance becomes natural operation as if residents are at home even when not at home, allowing easy setting of a control pattern of each home appliance when residents are not at home. SOLUTION: A control module 8a has: a control means transmitting control information to a dimming control module 8d controlling a luminaire and a wireless communication module 8e controlling a remote control reception function-equipped television 201 to control the operation of the home appliance; a mode setting means changeably setting a home presence mode wherein a person is present inside a home and an absence mode wherein the person is absent inside the home; a recording means recording a control situation of each home appliance when the home presence mode is set by the mode setting means; and a control pattern generation means generating the control pattern of each home appliance on the basis of a recording result of the recording means. When the absence mode is set by the mode setting means, the control means controls the operation of each home appliance by the control pattern generated by the control pattern generation means. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an arrangement grid creation system and a hall using the same, in which various equipment arrangement works are made easy and its work time is significantly reduced, by dispensing with the work of calculating arrangement positions of various equipment by measurement and work of providing a mark. SOLUTION: A user creates arrangement grid data for projecting to a floor face F of the hall by using an arrangement grid creating device 1. A distortion correction device 2 corrects distortion of the arrangement grid data created by the arrangement grid creating device 1, based on a shape of the floor F and a tilt angle with respect to the floor face F of a light axis and a distance to the floor face F of a projector 3, and a video signal is generated from the corrected arrangement grid data and output to the projector 3. A shape of the arrangement grid displayed by an image which is projected from the projector 3 to the floor face F by the video signal is indicated by a real scale and turns into a rectangular shape due to the distortion correction. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a transportation condition detection device easily recoverable without needing to be incorporated in a transportable article and capable of detecting and obtaining a transportation condition of every individual transportable article. SOLUTION: In this transportation condition detection device A, a device body mounted on a surface of a detection object load X by attachment is composed of a casing 6, and a circuit board 10 constituting a back lid of the casing 6; and, on the circuit board, a measuring measurement part 1 comprising an acceleration sensor for sensing impact applied during transportation of the load X, a data processing part 2 for obtaining the magnitude of the impact applied to the load X from the measurement data of the measurement part 1, a data recording part 3 comprising a removable memory for constantly recording the magnitude data of the impact obtained by the data processing part 2, a display part 4 for displaying, in the form of a bar, the maximum value of the impact at the present moment, a battery 6 as an operation power source, and a starting switch SW are mounted. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an electrostatic drive type actuator which is adapted to an optical switch or particularly to a matrix optical switch and which has a small size/low power. SOLUTION: This electrostatic drive type actuator includes a movable member deformed by an electrostatic attraction force, a fixed member connected to the movable member, and a magnetic force attraction member for holding a shape in the state that the movable member is attracted. The fixed member has a connector connected to the movable member, and a fixed electrode part connected to the connector and having the form that a distance to the movable member gets longer toward the distal end of the movable member in a length direction. The movable member has a movable electrode part deformed by connecting to the connector, and a magnetic part mounted at the distal end of the movable electrode part at the opposite side of the connector and made of a soft magnetic plate. The magnetic force attraction member has a permanent magnet part for holding the magnetic part by a magnetic attraction force in the state that the movable electrode part is attracted to the fixed electrode part by the electromagnetic attraction force, and an electromagnet part for weakening the magnetic field of permanent magnet part. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a measuring jig and a measuring method of a semiconductor element capable of realizing characteristic measurement in the state of the semiconductor element, and heightening measurement efficiency. SOLUTION: This measuring jig of the semiconductor element has a frame 104 comprising a semiconductor substrate, a cantilever 106 supported inside rockably by an elastic beam part 105, a piezo resistance 107 provided on the beam part 105 and having a resistance value changing by applied acceleration, and an electrode 108 provided on the frame 104, for taking out a signal from the piezo resistance 107. The jig is equipped with a tray 1 having a holding part 11 projecting from the surface on one side, for suppressing play of the semiconductor element, and a cover 2 engaged with the tray 1, for covering its surface. In the jig, a terminal 3 capable of abutting oppositely on the electrode 108 held by the holding part 11 is provided on the surface of the cover 2, facing to the tray, and wiring 4 connected to the terminal 3 and enabling electric connection to the outside is provided. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To prevent deterioration of an output characteristic caused by the influence of a stress generated in a package by an external force or a heat, and to miniaturize the package. SOLUTION: A recessed part 5 is provided in the package 4, and another acceleration sensor chip 1 excluding an integrated circuit chip 2 having the largest size and a memory cell chip 3 are stored in the recessed part 5, and the integrated circuit chip 2 is arranged in piles relative to the acceleration sensor chip 1 and the memory cell chip 3 stored in the recessed part 5. Hereby, the acceleration sensor chip 1 can be arranged on the center of the package 4. Consequently, the influence of the stress to the external force applied to the package 4 or a thermal stress generated in the package 4 is hardly exerted on the acceleration sensor chip 1, and the influence of the stress is changed to be isotropic to prevent deterioration of the output characteristic. In addition, the package 4 can be miniaturized by mounting and arranging stereoscopically a plurality of chips 1-3. COPYRIGHT: (C)2004,JPO