公开(公告)号：JPH07120472A

公开(公告)日：1995-05-12

申请号：JP26667493

申请日：1993-10-25

Applicant: TORAY INDUSTRIES

Inventor： HAYASHI MUTSUMI ,  MIZUTANI YAYOI ,  KURIYAMA YOSHIYUKI

IPC: G01N33/543 ,  G01N35/00 ,  G01N35/10

Abstract: PURPOSE:To restrain the waste of a sample to the minimum upon the occurrence of an improper dispensing process by continuing transferring, dispensing, and analyzing processes until the time when an improper dispensing condition is continuously detected by the prescribed frequency or more, and then interrupting dispensing operation when the improper dispensing condition is so detected. CONSTITUTION:The nozzle 96 of a sample dispensing section 56 is moved to the position of the sample tank 16 of a cartridge 14, and the piston 106A of a syringe 106 is actuated along an arrow E direction, thereby gradually sucking a sample into the nozzle 96 and piping 98. Then, the nozzle 96 is moved to the positions of reaction tanks 20, 22 and 24, thereby dispensing the sample. In this case, a frequency where pressure detected by a pressure sensor 114 continuously gives values outside the prescribed range (improper dispensing condition) is counted, and a normal inspection process is continued until the time when the frequency reaches the prescribed level (approximately two to three times). When the improper dispensing condition is continuously detected by the prescribed frequency or more, the inspection process is stopped, and a sample dispensing process 56 and an analysis process at a measurement section are interrupted.

公开(公告)号：JPH07110333A

公开(公告)日：1995-04-25

申请号：JP25604293

申请日：1993-10-13

Applicant: TORAY INDUSTRIES

Inventor： HAYASHI MUTSUMI ,  MIZUTANI YAYOI ,  KURIYAMA YOSHIYUKI

IPC: G01N33/543 ,  G01N35/00 ,  G01N35/04

Abstract: PURPOSE:To reduce error of analysis by a method wherein a working curve determined on the basis of a measured value of a physical amount of a reference sample for correction and the concentration of a specific component is corrected when a correction factor of the working curve is within a prescribed range, while the working curve is determined afresh when the factor is outside the range, and then the concentration of the specific component of each sample to be analyzed is determined. CONSTITUTION:A known concentration of an antigen of a reference sample for correction is inputted and the amount of emission of each sample is measured. Next, working curve data are taken in and a one-point correction factor is calculated. It is determined at this time whether the correction factor is within a prescribed range or not, and when the factor is within the range, a working curve is corrected thereby. Next, the amounts of emission of all samples to be analyzed are measured and converted into concentrations of a specific antigen by the corrected working curve. When the correction factor is outside the prescribed range, the working curve is prepared afresh, calculation of the one-point correction factor and determination that the factor is within the range are executed again and then the amounts of emission are converted into the concentrations of the specific antigen by the working curve corrected afresh. In this way, waste of a measuring time and the sample is avoided even when abnormality occurs, and the result of measurement having dew errors is obtained.

公开(公告)号：JPH0629782B2

公开(公告)日：1994-04-20

申请号：JP9264989

申请日：1989-04-12

Applicant: TORAY INDUSTRIES

Inventor： HAYASHI MUTSUMI ,  YAMAZAKI CHIKAYASU

IPC: G01J1/42 ,  A61N5/06

公开(公告)号：JPH063364B2

公开(公告)日：1994-01-12

申请号：JP21228285

申请日：1985-09-27

Applicant: TORAY INDUSTRIES

Inventor： TORIKAI JUN ,  YAMAZAKI CHIKAYASU ,  KUMO ICHIRO ,  HAYASHI MUTSUMI

IPC: G01B11/06

公开(公告)号：JPH04522B2

公开(公告)日：1992-01-07

申请号：JP7671285

申请日：1985-04-12

Applicant: TORAY INDUSTRIES

Inventor： YAMAZAKI CHIKAYASU ,  HAYASHI MUTSUMI ,  KUMO ICHIRO ,  TORIKAI JUN

IPC: G02B6/04 ,  G01B11/06 ,  G01J1/02

公开(公告)号：JPH0339635A

公开(公告)日：1991-02-20

申请号：JP17480389

申请日：1989-07-05

Applicant: TORAY INDUSTRIES

Inventor： MAEDA YOSHIICHI ,  HAYASHI MUTSUMI

IPC: G01N15/14

Abstract: PURPOSE:To accurately detect even ultra fine particles (of

公开(公告)号：JPH02168138A

公开(公告)日：1990-06-28

申请号：JP32449688

申请日：1988-12-21

Applicant: TORAY INDUSTRIES

Inventor： HAYASHI MUTSUMI ,  MAEDA YOSHIICHI

IPC: G01N15/02 ,  G01N15/14

Abstract: PURPOSE:To make it possible to detect easily even a superparticulate by using a flow cell having a spherical part and by aligning the optical axis of a light source and a light-sensing element with the center of the spherical part. CONSTITUTION:A fluid to be measured is made to flow continuously through a flow cell 6 from an inlet pipe 6b to an outlet pipe 6c. In this state, a light beam 7 projected from a light source 8 to the cell 6 is narrowed down most at the center of a spherical part 6a of the cell 6 and then absorbed by an extinguished in a beam block 10. When a particulate is contained in the fluid to be measured which flows through the cell 6, a scattered light is generated on the occasion when said particulate traverses the light beam 7. Out of this scattered light only a scattered light generated by the particulate passing through the center of the spherical part 6a of the cell 6 is sensed by a light- sensing element 11 through a light-receiving lens 12 and a pinhole 13 and the intensity thereof is detected. Since this intensity is relevant to the number of particulates and the distribution of particle sizes, the number of particulates and the distribution of particle sizes are determined by subjecting an output signal of the element 11 to an arithmetic processing.

公开(公告)号：JPS61246607A

公开(公告)日：1986-11-01

申请号：JP8946485

申请日：1985-04-25

Applicant: TORAY INDUSTRIES

Inventor： TORIKAI JUN ,  YAMAZAKI CHIKAYASU ,  HAYASHI MUTSUMI ,  KUMO ICHIRO

IPC: G01B11/06

Abstract: PURPOSE:To enable the highly accurate measurement of a film thickness, by determining a division pitch in accordance with an anticipated thickness of a thin film to be measured when the phenomenon of interference of light is utilized for measuring the thickness of the thin film. CONSTITUTION:A waveform of spectral intensity imaged on an image sensor 6 is read sequentially from each cell. The output of this sensor 6 is read in a microcomputer 9 through a buffer amplifier 7 and an A/D converter 8 to be subjected to arithmetic processing. On the occasion, a division pitch is determined so that one period of the waveform of spectral intensity be divided equally by a prescribed number in accordance with an anticipated thickness of a thin film to be measured. Based on the spectral intensities at wavelength positions obtained from the division by said division pitch, the position of the maximum or minimum wavelength of the spectral intensities is determined, and the thickness of the film is measured on the basis of said position. By this method, the film thickness can be measured with high accuracy.

公开(公告)号：JPS61235707A

公开(公告)日：1986-10-21

申请号：JP7671285

申请日：1985-04-12

Applicant: TORAY INDUSTRIES

Inventor： YAMAZAKI CHIKAYASU ,  HAYASHI MUTSUMI ,  KUMO ICHIRO ,  TORIKAI JUN

IPC: G02B6/04 ,  G01B11/06 ,  G01J1/02

Abstract: PURPOSE:To measure the thickness of a film even during the movement of an object of measurement by providing a photodetection part, a light projection part, and a parallel light generating means which collimates light from the light projection part into parallel light, and guiding the light from the parallel light generating means to a spectroscope. CONSTITUTION:Light from a white light source 1 is converged on a pinhole 3 by a lens group 2 and a collimator lens 4 collimates the light from the pinhole 4 into the parallel light. This parallel light illuminates a film thickness measurement point 14 at a constant angle through an incidence window 17 and is reflected by a surface to be measured. In this case, even if the direction of the reflection varies irregularly owing to wrinkles, etc., of the object of measurement, the reflected light is photodetected at any photodetection position with the same efficiency as long as the variation is within a range of + or -45 deg. abaut the the regular direction of reflection. This photodetected light is propagated in an optical fiber and projected from the end surface of the light projection part 19. When the parallel light is reflected by the measurement object surface, the light varies in spectral intensity. This variation depends upon the film thickness as long as the refractive index of the object of measurement is constant, so variation in the spectral intensity is detected to find the film thickness.

公开(公告)号：JPS60142265A

公开(公告)日：1985-07-27

申请号：JP24775083

申请日：1983-12-29

Applicant: TORAY INDUSTRIES

Inventor： HAYASHI MUTSUMI ,  YAMAZAKI CHIKAYASU ,  TORIKAI JIYUN

IPC: G01P3/36 ,  G01P3/56 ,  G01S17/58

Abstract: PURPOSE:To execute a measurement with a high accuracy without being subjected to a measuring limit by magnitude of a speed, by detecting an interference frequency generated by making reflected light from two measuring points interfere. CONSTITUTION:Light emitted from a laser 1 is divided into two by a spectroscope 2, and one light and the other light are led to an optical fiber 4 and an optical fiber 4', respectively. Also, the light led to the fiber 4 is condensed by a projecting lens 5 and irradiated at an angle theta to a measuring point of an object 6 which is moving, and the light led to the fiber 4' is condensed by a projecting lens 5', and thereafter, irradiated at an angle theta to a measuring point of an object 6' which is moving. Subsequently, only one directional component from reflected light from each measuring point is photodetected at an angle phi (phinot equal to theta) through photodetecting lenses 7, 7', respectively, led to an optical coupler 9 through optical fibers 8, 8' and coupled, and led to an optical fiber 10. In the fiber 10, two lights interfere with each other, therefore, an intensity of an interference light is detected by a photodetector 11, also sent to a frequency detector 12, and an interference frequency is detected.