公开(公告)号：EP0143282A3

公开(公告)日：1986-07-02

申请号：EP84111968

申请日：1984-10-05

Applicant: Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V.

Inventor： Tank, Volker, Dipl.-Ing.

IPC: G01J05/00 ,  G01J03/28

CPC classification number: G01J5/601

公开(公告)号：EP0175303A3

公开(公告)日：1986-06-25

申请号：EP85111610

申请日：1985-09-13

Applicant: NIPPON KOKAN KABUSHIKI KAISHA

Inventor： Makabe, Eiichi ,  Harada, Naoki ,  Imai, Kiyotaka ,  Hosoda, Yoshiro ,  Kato, Akira

IPC: G01J05/00

CPC classification number: G01J5/0022 ,  G01J5/004 ,  G01J2005/0048 ,  G01J2005/0081

Abstract: The tip of an alloy rod (5) in a vacuum chamber (1) is remelted by radiation with an electron beam (6) from an electron gun (2) and the remelted droplets (7) fall into a mold (3) where they solidify. The droplets (7) are scanned a plurality of times through a window (10) provided on the vacuum chamber (1) by an image pickup device (11) as they pass its field of view. From the signal of the maximum level obtained during these scans, temperature data of the droplet (7) is obtained by a temperature measurement control device (12).

公开(公告)号：EP0080367A3

公开(公告)日：1984-07-25

申请号：EP82306227

申请日：1982-11-23

Applicant: EXXON RESEARCH AND ENGINEERING COMPANY

Inventor： Stein, Alexander

IPC: G01J05/00

CPC classification number: G01J5/52

Abstract: Disclosed are apparatus and a method for remotely measuring the temperature of a hot gas, for example, in fired furnaces. This is achieved by adjusting the physical temperature of a black body (4) until it equals the radiation temperature of the black body (4) as determined by a pyrometer (5) viewing the black body through the hot gases (3). The radiation temperature is the equal to the line averaged temperature of the gas.

公开(公告)号：EP0081246A3

公开(公告)日：1984-07-18

申请号：EP82111382

申请日：1982-12-08

Applicant: Bethlehem Steel Corporation

Inventor： Krause, Richard H. ,  Pfeiffer, Thomas J. ,  Horvath, Vincent V.

IPC: G01J05/00 ,  C10B45/00

CPC classification number: G01J5/02 ,  C10B45/00 ,  G01J5/0044 ,  G01J5/025 ,  G01J5/026 ,  G01J5/061 ,  G01J2005/0048

Abstract: Production-worthy method and system comprising two computer-based subsystems for determining temperature of an irradiant mass movable through process means in a hostile environment exemplified as a coke guide and coke oven in a battery of ovens. First subsystem which is carried by a movable coke guide/door machine, includes one or more cote guide pyrometers arranged vertically. The second subsystem stationed in a central office having a base computer package, a line printer and a printer/plotter. Two-way data communication between the two subsystems Is exemplified by a two-way radio link. Each subsystem logs both coke level data and coke vertical and horizontal temperature profile data and alarm messages. Tabular printouts of temperature and diagnostic data are provided. Graphical displays are also provided by the base computer system of coke level, temperature and summary data, oven push schedules and/or self-diagnostic messages of various process and measurement operations.

公开(公告)号：EP0080353A3

公开(公告)日：1984-07-04

申请号：EP82306192

申请日：1982-11-22

Applicant: SCHLUMBERGER ELECTRONICS (U.K.) LIMITED

Inventor： Browning Smith, Kenneth ,  Adams, Derek William

IPC: G01J05/00 ,  H04N05/33

CPC classification number: G01J5/0022 ,  G01B15/02 ,  G01B21/045 ,  G01J5/08 ,  G01J5/0846 ,  G01J2005/0048 ,  G01J2005/0081

Abstract: A camera 20 contains a row of diodes 22 sensitive to infrared radiation and mounted on a turntable 24 for rotation about the optical axis of the camera. The signals from the diodes provide a temperature profile of a band across the width of a strip 10 of hot rolled steel moving in a direction orthogonal to the optical axis 30 and to the lenght of the row of diodes 22. Since the diodes are low accurancy devices, their measurements are compensated by normalizing co-efficients derived by comparison with the signal provided by an optical pyrometer 28 viewing the central part of the steel strip in the region of the optical axis 30. To enable all diodes to be calibrated, calibration is effected with the turntable 24 rotated 90° to align all the diodes with the central part of the strip as viewed by the pyrometer 28. The camera may be mounted on one arm of a C-frame 12 having X-ray tubes in an arm 14 and X-ray detectors in the other arm 16 forthe purpose of measuring the thickness profile of the strip 10 in known way. The compensated temperature measurements can then be used to correct the corresponding thickness measurements to take account of the variation in apparent thickness with density, and hence temperature.

公开(公告)号：EP0080368A3

公开(公告)日：1984-06-27

申请号：EP82306228

申请日：1982-11-23

Applicant: EXXON RESEARCH AND ENGINEERING COMPANY

Inventor： Stein, Alexander

IPC: G01J05/00

CPC classification number: G01J5/522 ,  G01J5/0044 ,  G01J5/602 ,  G01J2005/0051

Abstract: Amethod is disclosed for measuring the temperature of remote hot samples (4) in the presence of ambient radiation (7). A portion of the surface of the sample (4) is for example treated (6), to obtain a spectral emissivity different from the untreated surface (5). The spectral radiances of the treated (6) and untreated (5) surface portions are measured and the temperature calculated from these values and the known emissivities.

公开(公告)号：EP0030773A3

公开(公告)日：1982-04-14

申请号：EP80201196

申请日：1980-12-15

Applicant: CENTRE DE RECHERCHES METALLURGIQUES CENTRUM VOOR RESEARCH IN DE METALLURGIE Association sans but lucratif

Inventor： Fischbach, Jean-Paul François

IPC: G01J05/00 ,  G01N21/62

CPC classification number: G01J5/0022 ,  G01J5/0003

公开(公告)号：WO1997042474A1

公开(公告)日：1997-11-13

申请号：PCT/US1997007589

申请日：1997-05-05

Applicant: RAYTEK SUBSIDIARY, INC., doing business as RAYTEK, INC.

Inventor： RAYTEK SUBSIDIARY, INC., doing business as RAYTEK, INC. ,  HEINKE, Thomas ,  YSAGUIRRE, Jose ,  KING, Steve ,  CARLSON, Paul

IPC: G01J05/00

CPC classification number: G01J5/22

Abstract: An improved ratio type infrared thermometer utilizes integrating amplifiers (20) for each waveband having the integration time automatically set so that the output voltage utilizes the full range of an analog to digital convertor (26). The gain and offset of the amplifiers (20) is not ambient temperature dependent so accurate digital representations of the signal for each waveband are provided. The linearized output of each detector is optionally provided so that special or proprietary algorithms for computing the temperature of colored objects can be utilized. A special feature for downloading of updated new programs utilizes a "programming jumper" (54) and an attenuation warning signal is provided for selected levels of attenuation.

Abstract translation: 改进的比率型红外温度计利用积分时间自动设置的每个波段的积分放大器（20），使得输出电压利用模数转换器（26）的全范围。 放大器（20）的增益和偏移不是环境温度依赖性的，因此提供了每个波段的信号的精确数字表示。 可选地提供每个检测器的线性化输出，使得可以利用用于计算有色物体的温度的特殊或专有算法。 用于下载更新的新程序的特殊功能使用“编程跳线”（54），并且为选定的衰减水平提供衰减警告信号。

公开(公告)号：WO1994012857A1

公开(公告)日：1994-06-09

申请号：PCT/FR1993001142

申请日：1993-11-19

Applicant: ECOLE CENTRALE DE LYON ,  JOSEPH, Jacques ,  HU, Yao-Zhi ,  IRENE, Eugène

Inventor： ECOLE CENTRALE DE LYON

IPC: G01J05/00

CPC classification number: G01K11/12 ,  G01B11/065

Abstract: The method for measuring the surface temperature of an object comprises: taking ellipsometry measurements on the object in order to determine at least a first energy (E1) and a second energy (E2) of photons of an electromagnetic beam, energies for which the measurements are respectively substantially independent and dependent of the temperature; creating and directing towards the object an incident electromagnetic beam comprising at least the first (E1) and the second (E2) energies of photons; measuring the polarization change for the first photon energy (E1) and determining, from said measurement, the thickness of the material layer; determining the temperature of the object surface from the measurement of the polarization change for the second photon energy (E2) of the beam while taking into account the thickness of the material layer.

Abstract translation: 用于测量物体的表面温度的方法包括：对物体进行椭圆测量测量，以便确定电磁波束的光子的至少第一能量（E1）和第二能量（E2），测量值 分别基本上独立和依赖于温度; 向所述物体产生和引导至少包括光子的第一（E1）和第二（E2）能量的入射电磁束; 测量第一光子能量（E1）的偏振变化，并从所述测量确定材料层的厚度; 在考虑到材料层的厚度的同时，测量束的第二光子能量（E2）的偏振变化的测量来确定物体表面的温度。

公开(公告)号：WO1993004345A1

公开(公告)日：1993-03-04

申请号：PCT/GB1992001550

申请日：1992-08-21

Applicant: GRASEBY PLC ,  FOX, Nigel, Paul

Inventor： GRASEBY PLC

IPC: G01J05/00

CPC classification number: G01J5/20 ,  G01J1/42 ,  G01J5/04 ,  G01J5/046 ,  G01J5/08 ,  G01J5/0846 ,  G01J5/0853

Abstract: A radiation detector (2) for detecting infrared radiation, which radiation detector (2) comprises: (i) an enclosure (4) having means (6) through which a radiation beam can enter the enclosure (4); (ii) at least two radiation-sensitive devices (10, 12) which produce electrical signals responsive to impinging radiation, and which are positioned inside the enclosure (4) such that (a) the radiation beam can impinge upon a first one of the radiation-sensitive devices (10, 12) and be partially absorbed by that radiation sensitive device, (b) any non-absorbed radiation is reflected from the first radiation-sensitive device to the next radiation sensitive device, and (c) the non-absorbed radiation from the last radiation-sensitive device is reflected back over the same path towards the first one of the radiation-sensitive devices; and (iii) an output means (22) for providing external access to an electrical signal produced by the radiation-sensitive devices (10, 12); and the radiation detector (2) being such that the radiation-sensitive devices (10, 12) are indium/gallium/arsenide radiation-sensitive devices which enable the radiation detector (2) to detect infrared radiation in the wavelength region of 980-1640 nm.

Abstract translation: 一种用于检测红外辐射的辐射检测器（2），该辐射检测器（2）包括：（i）具有装置（6）的外壳（4），辐射束可通过该装置进入外壳（4）; （ii）至少两个辐射敏感设备（10,12），其产生响应于入射辐射的电信号，并且其被定位在所述外壳（4）内，使得（a）所述辐射束可以撞击所述辐射敏感设备 辐射敏感设备（10,12）并被该辐射敏感设备部分地吸收，（b）任何未被吸收的辐射从第一辐射敏感设备反射到下一个辐射敏感设备，以及（c） 来自最后一个辐射敏感装置的吸收的辐射被反射回朝向第一个辐射敏感装置的相同路径; 和（iii）用于提供对由所述辐射敏感设备（10,12）产生的电信号的外部访问的输出装置（22）。 并且所述辐射检测器（2）使得所述辐射敏感装置（10,12）是使得所述辐射检测器（2）能够检测在980-1640的波长区域中的红外辐射的铟/镓/砷化物辐射敏感装置 纳米。