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公开(公告)号：EP1031825A1
公开(公告)日：2000-08-30
申请号：EP99401773.9
申请日：1999-07-15
Applicant: ANDO ELECTRIC CO., LTD.
Inventor： Mori, Tohru , Kaneko, Tsutomu , Kojima, Manabu
IPC: G01J3/18
CPC classification number: G01J3/04 , G01J3/02 , G01J3/0229 , G01J3/18
Abstract: The present invention relates to a double pass monochromator that improves wavelength resolution and reduces the actual length thereof. A return reflection means 7 that reverses the direction of dispersion of the wavelength of the second pass light 1c, 1f emitted and incident on a diffraction grating 4 during the reflection. In addition, the angles of the incident and emitted light during separation of spectral components by the diffraction grating are identical during the first and second diffraction.
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公开(公告)号：EP0914600A1
公开(公告)日：1999-05-12
申请号：EP97935177.0
申请日：1997-07-22
Applicant: THERMA-WAVE INC.
Inventor： ASPNES, David, E. , OPSAL, Jon
CPC classification number: G01J3/02 , G01J3/0229 , G01J3/0232 , G01N21/211 , G01N2021/213
Abstract: An ellipsometer, and a method of ellipsometry, for analyzing a sample (2) using a broad range of wavelengths, includes a ligth source (4) for generating a beam of polychromatic light for interacting with the sample. A polarizer (6) polarizes the light beam before the light beam interacts with the sample. A rotating compensator (8) induces phase retardations of a polarization state of the light beam wherein the range of wavelengths and the compensator are selected such that at least a first phase retardation value is induced that is within a primary range of effective retardations of substantially 135° to 225°, and at least a second phase retardation value is induced that is outside of the primary range. An analyzer (10) interacts with the light beam after the light beam interacts with the sample. A detector (12) measures the intensity of light after interacting with the analyzer as a function of compensator angle and of wavelength, preferably at all wavelengths simultaneously. A processor (23) determines the polarization state of the analyzer from the light intensities measured by the detector.
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423.发明公开PROGRAMMABLE STANDARD FOR USE IN AN APPARATUS AND PROCESS FOR THE NONINVASIVE MEASUREMENT OF OPTICALLY ABSORBING COMPOUNDS 失效可编程标准用在设备和方法，一种非侵入性光学测量的吸收组件
公开(公告)号：EP0877919A1
公开(公告)日：1998-11-18
申请号：EP97903884.0
申请日：1997-01-30
Applicant: Abbott Laboratories
Inventor： LINDBERG, John, M. , HEINZ, Robert, E.
CPC classification number: G01J3/28 , G01J3/02 , G01J3/0208 , G01J3/0229 , G01J3/457 , G01J2003/1286 , G01J2003/2836 , G01J2003/2866
Abstract: The present invention provides a programmable filter for use as a standard in correlation spectrometers. Also provided is the use of the programmable standard in a process for determining the concentration of an optically absorbing compound. Also provided is a method and apparatus for noninvasively determining the concentration of an optically absorbing biological sample which incorporates the programmable standard of the invention. In one embodiment the programmable standard (20) contains a dispersive element (106a) and a transmissive spatial light modulator (108). Because the position of each light beam correlates to its wavelength, spatial filter (108) controllably and selectively attenuates desired wavelengths of the input beam.
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公开(公告)号：EP0807811A2
公开(公告)日：1997-11-19
申请号：EP97302639.6
申请日：1997-04-17
Applicant: PFIZER INC. , Pfizer Limited
Inventor： Aldridge, Paul, K. , Hammond, Stephen Victor , Axon, Tony Grahan
CPC classification number: G01N21/51 , G01J3/02 , G01J3/0229 , G01N21/4738
Abstract: Apparatus for spectrophotometric analysis of a material P in a container 16 by reflectance of a beam 4 applied to the material through aperture 11 in a primary mask 9. A restricted beam 12 resulting from the mask 9 is applied through a port 13 in an opaque secondary mask 10 to the material P. The beam 12 is wholly within the port 13 and radiation reflected from the material P passes through the port 13 to detectors 7 for analysis. The mask 10 defines by its port 13 an area on the base 17 of the container through which the beam 12 is applied to the material P and is not subjected to spurious reflections and refractions otherwise created by the container 16 between its base 17 and side wall 18. The container 16 may be spaced from the mask 10 and inclined relative thereto so that the mask 10 shields the top and bottom ends of the container 16.
The invention also includes a conversion kit with masks 9 and 10 for fitting to existing spectrophotometers and an apparatus by which an array of containers 16 can be fed successively and automatically to overlie port 13 for analysis and thereafter removed.Abstract translation: 用于通过在主掩模9中通过孔11施加到材料上的光束4的反射率对容器16中的材料P进行分光光度分析的装置。由掩模9产生的受限束12通过不透明次级 掩模10到材料P.梁12完全在端口13内，并且从材料P反射的辐射通过端口13到达检测器7用于分析。 掩模10由其端口13限定容器的基部17上的区域，梁12通过该区域施加到材料P，并且不会受到容器16在其基部17和侧壁之间产生的假反射和折射 容器16可以与掩模10间隔开并相对于其倾斜，使得掩模10屏蔽容器16的顶端和底端。本发明还包括具有掩模9和10的转换套件，用于装配到现有的分光光度计和 容器16的阵列可以连续地并且自动地供给以覆盖端口13用于分析并随后被移除的装置。
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公开(公告)号：EP0548830B1
公开(公告)日：1997-03-12
申请号：EP92121566.1
申请日：1992-12-18
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor： Stafford, Ronald E.
IPC: G01J3/28
CPC classification number: G01J3/28 , G01J3/021 , G01J3/0229 , G01J2003/2866 , G01N2201/0675
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Patent Agency Ranking
公开(公告)号：EP0426040B1
公开(公告)日：1996-03-06
申请号：EP90120609.4
申请日：1990-10-26
Applicant: HORIBA, LTD.
Inventor： Ukon, Juichiro
CPC classification number: G01J3/02 , G01J3/0229 , G01J3/0237 , G01J3/0248 , G01J3/0289 , G01J3/04 , G02B21/0096 , G02B21/18
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427.发明授权
公开(公告)号：EP0535753B1
公开(公告)日：1995-06-28
申请号：EP92203010.1
申请日：1992-09-30
Applicant: DILOR
Inventor： Delhaye, Michel , Da Silva, Edouard , Martinez, Gérard
CPC classification number: G01J3/02 , G01J3/021 , G01J3/0229 , G01J3/0262 , G01J3/44 , G01J2003/1814 , G01N2021/6417 , G01N2201/0642 , G02B5/005
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428.发明公开
公开(公告)号：EP0653051A1
公开(公告)日：1995-05-17
申请号：EP93917331.0
申请日：1993-07-27
Applicant: PATCHEN CALIFORNIA, INC.
CPC classification number: G01J3/50 , A01M7/0089 , A01M21/00 , G01J1/44 , G01J3/0229 , G01J3/42 , G01J3/501 , G01J2001/4242
Abstract: An apparatus and a method are provided for selectively eliminating weeds in agriculture operations. To provide selective elimination, at least two light (radiation) emitters (201, 202), powered by an internal power source, are modulated to switch on and off at very high speeds. Each emitter emits radiation of a different emitter wavelength. The on/off modulation of one emitter is phase shifted by approximately 90 degrees with respect to the modulation of the particular spot on the ground. The light beams (203, 204), provided by the emitters, are reflected off a plant (206) or the soil and are intercepted by a photodetector. Because plants have a characteristic spectral reflectance in regions of the electromagnetic spectrum which can be discriminated from the spectral reflectance of the background earth, the relative amplitudes of the reflected radiation at the two emitter wavelengths varies depending on whether the radiation is reflected off a plant or the soil. A ratio of the radiation at the two emitter wavelengths received by the photodetector is converted to phase. This phase is compared to an initial reference phase of the modulation of one of the emitters. A controller (221) uses this phase information to determine the presence or absence of a plant and then eliminates the weed.
Abstract translation: 提供了一种装置和方法，用于选择性地消除农业作业中的杂草。 为了提供选择性消除，至少两个由内部电源供电的光（辐射）发射器（201,202）被调制成以非常高的速度开启和关闭。 每个发射器发射不同发射器波长的辐射。 一个发射器的开/关调制相对于地面上特定点的调制相移约90度。 由发射器提供的光束（203,204）被植物（206）或土壤反射并被光电探测器拦截。 由于植物在可以与背景地球的光谱反射率区分的电磁波谱区域中具有特征光谱反射率，所以在两个发射器波长处的反射辐射的相对振幅取决于辐射是否从植物反射或 土壤。 由光电探测器接收的两个发射器波长的辐射比率被转换成相位。 该阶段与其中一个发射器的调制的初始参考阶段进行比较。 控制器（221）使用该阶段信息来确定植物的存在或不存在，然后消除杂草。
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公开(公告)号：EP0609428A1
公开(公告)日：1994-08-10
申请号：EP93920200.0
申请日：1993-08-17
Applicant: EASTMAN KODAK COMPANY
Inventor： MILCH, James, R. c/o EASTMAN KODAK CO.
CPC classification number: G03B27/735 , G01J3/02 , G01J3/0229 , G01J3/0291 , G01J3/28 , H04N1/603
Abstract: Un spectromètre pour étalonner un numériseur d'image couleur comporte un élément opaque, présentant une fente optique, mobile pour venir en position sur un axe optique du numériseur entre sa source de lumière polychromatique et sa lentille dans un plan occupé par une image couleur en cours de numérisation. Un réseau de diffraction est de la même manière mobile sur l'axe optique entre la fente et la lentille. Le réseau étant à proximité de la fente, l'élément opaque et le réseau peuvent faire partie d'un ensemble unique pouvant être facilement amené dans l'axe optique en un point approprié à proximité du plan d'exploration du numériseur d'image. La source de lumière éclaire la fente, et le réseau de diffraction disperse les spectres en double en dehors de l'axe sur les moitiés respectives du détecteur d'image, ce qui permet l'obtention de données d'étalonnage.
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公开(公告)号：EP0548830A1
公开(公告)日：1993-06-30
申请号：EP92121566.1
申请日：1992-12-18
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor： Stafford, Ronald E.
IPC: G01J3/28
CPC classification number: G01J3/28 , G01J3/021 , G01J3/0229 , G01J2003/2866 , G01N2201/0675
Abstract: A SLM spectrometer is provided that employs an entrance slit (40) or a collimator (42) to provide parallel rays of radiation to a prism (44) which disperses the incident radiation into an associated wavelength spectrum. The resulting spectrum from the prism (44) is incident upon a spatial light modulator (SLM) (46), such as a deformable mirror device (DMD). By selectively activating (or deactivating) a small portion of the surface of the SLM, i.e. a cell on the SLM, it is possible to selectively reflect or transmit a portion of the spectrum incident upon the SLM onto a focusing device, such as a parabolic focusing mirror (48). The focusing device in turn focuses the portion of the spectrum reflected by the selected cells on the SLM to a sensor (50). The wavelength selected is a function of which row of cells are activated (or deactivated) in the SLM. The SLM spectrometer of the present invention may be used to analyze visible light and light that is near visible, such as the near infrared or ultraviolet regions. The output of the sensor or detector may be appropriately amplified and after appropriate calibration employed to determine the amount of energy in a particular wavelength or band of wavelengths.
Abstract translation: 提供SLM光谱仪，其使用入射狭缝（40）或准直器（42）向棱镜（44）提供平行射线，其将入射的辐射分散到相关的波长光谱中。 来自棱镜（44）的所得光谱入射到诸如可变形反射镜装置（DMD）的空间光调制器（SLM）（46）上。 通过选择性地激活（或去激活）SLM的表面的一小部分，即SLM上的单元，可以选择性地将入射到SLM上的频谱的一部分反射或发射到聚焦装置上，例如抛物线 聚焦镜（48）。 聚焦装置又将由SLM上选定的单元反射的光谱的一部分聚焦到传感器（50）上。 选择的波长是在SLM中激活（或停用）单元格行的功能。 本发明的SLM光谱仪可以用于分析近似可见光的可见光和近红外或紫外线区域的光。 传感器或检测器的输出可以被适当地放大，并且在适当的校准之后，用于确定特定波长或波段的能量的量。
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