SYSTEM AND METHOD FOR WORK PIECE INSPECTION
    45.
    发明申请

    公开(公告)号:US20200175669A1

    公开(公告)日:2020-06-04

    申请号:US16208668

    申请日:2018-12-04

    Abstract: An inspection system includes one or more imaging devices and one or more processors. The imaging devices generate a first set of images of a work piece at a first position relative to the work piece and a second set of images of the work piece at a second position relative to the work piece. At least some of the images in the first and second sets are acquired using different light settings. The processors analyze the first set of images to generate a first prediction image associated with the first position, and analyze the second set of images to generate a second prediction image associated with the second position. The first and second prediction images include respective candidate regions. The processors merge the first and second prediction images to detect at least one predicted defect in the work piece depicted in at least one of the candidate regions.

    Coating quality inspection system and method

    公开(公告)号:US10670539B1

    公开(公告)日:2020-06-02

    申请号:US16216527

    申请日:2018-12-11

    Abstract: An inspection system includes a light source, an imaging device, and one or more processors. The light source is configured to direct an illumination light having a controlled light characteristic towards a surface of a thermal barrier coating of a work piece. The imaging device is configured to capture image data of the surface of the thermal barrier coating by monitoring the illumination light reflected off the surface. The one or more processors are operably connected to the imaging device and configured to analyze the image data of the surface by comparing the image data to reference image data depicting a first designated microstructure. The first designated microstructure has an associated coating quality value. The one or more processors are configured to determine that the thermal barrier coating of the work piece has the first designated microstructure based on the analysis.

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