BUNDLE FIBER FIXING DEVICE
    41.
    发明专利

    公开(公告)号:JPH05209789A

    公开(公告)日:1993-08-20

    申请号:JP1614792

    申请日:1992-01-31

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To enable a bundle fiber in end-face shape requiring positioning in the horizontal, vertical, and rotary directions to be mounted to a measuring instrument optical system accurately by inserting a bundle fiber tip base part into a cylindrical guide hole of a fixing material and then setting a fitting tolerance between the base and the guide hole properly. CONSTITUTION:A fiber fixing member 26 is fixed to a support member 27 which is mounted to a base 30 of an analysis instrument. A cylindrical guide hole 31 where a bundle fiber base 20 is engaged is formed at the fixing member 26. Also, an exterior thread 28 is cut concentrically with a guide hole 31 at the fixing member 26 and is screwed to an interior thread 23 which is cut in box nut 19 which is engaged to a bundle fiber. A pin 34 for positioning is press-fit and fixed to a press surface 29 of the fixing member 26. The outer diameter of the pin 34 is determined so that it is engaged to a cut-out 24 which is formed at the flange part of the base 20. Then, the base 20 is pushed into a guide hole 31 of the fixing member 26. By setting the engagement tolerance between the base 20 and the guide hole 31 properly, positioning in horizontal and vertical directions can be made.

    SPECTROPHOTOMETER
    42.
    发明专利

    公开(公告)号:JPH055697A

    公开(公告)日:1993-01-14

    申请号:JP15831291

    申请日:1991-06-28

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To measure a long size sample with double beams by fitting a sample chamber part with an optical system to refract a reference beam out of the face including the opotic axis of a spectrophotometer and an optical system to return the reference beam refracted out of the face on the face including the optic axis. CONSTITUTION:A reference beam 1 is reflected upward about the angle of about 150 degrees by a reflecting mirror 7, and the reflected reference beam 1 is reflected by a reflecting mirror 8 of which a specular surface is fitted downward and a reflecting mirror 9 inclined with the angle symmetrical against the reflecting mirror 7 and returned to the reference beam path where nothing is fitted. A film guide 6 is supported, in the space formed by the reflecting mirrors 7, 8, 9, by guide supporting member 4 penetrating from the front to the rear of a spectrophotometer so that the guide 6 becomes vertical to a measuring beam. A sample can bee kept by utilizing the space formed by the refracting, and the double-beams measurement of a long size sample can be made with out cutting the beam of the reference with the sample, because the reference beam is refracted to either the upward or downward direction of the surface including the optic axis of the spectrophotometer.

    SPECTROPHOTOMETER
    43.
    发明专利

    公开(公告)号:JPH02259547A

    公开(公告)日:1990-10-22

    申请号:JP8246189

    申请日:1989-03-31

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To position sample cells always exactly in the luminous flux position of the spectrophotometer even if there is a fluctuation in the position thereof by boring through-holes for position detection on the side face of a sample cell holder and measuring the measuring light transmitted through the through- holes. CONSTITUTION:A positioner consists of the sample cell holder 1 which holds four pieces of the square sample cells 2 in a shielded sample chamber and a driving motor 7 which is fixed to the bottom of the sample cell holder 1 and drives the sample cell holder 1 in an arrow A direction via a power transmission part 8 projecting from a front plate 3 of the sample chamber. The side face of the sample cell holder 1 is bored with the through-holes 11 for position detection in addition to the through-holes 12 for measurement bored in correspondence to the sample cells 2. The diameter of the through-holes 11 is set sufficiently smaller than the diameter of the through-holes 12. While the sample cell holder 1 is moved in the arrow A direction, the measuring light of the spectrophotometer transmitted through the through-holes 11 and the through-hole 12 is photodetected and measured by a detector 4 for measurement.

    SPECTROPHOTOMETER
    44.
    发明专利

    公开(公告)号:JPS63167240A

    公开(公告)日:1988-07-11

    申请号:JP31092286

    申请日:1986-12-29

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To measure a large-sized sample and a deformed sample which can not be put in a sample chamber directly by composing an attachment for large- sized undefined form sample measurement of a prepositioned optical system installed in the sample chamber and an external sample chamber. CONSTITUTION:When the prepositioned optical system part P is installed in the sample chamber, reference luminous flux R and luminous flux S for a sample which enter the sample chamber SC from the light source part of a spectrophotometer are reflected by mirrors M1 and M2 by 90 deg. to enter the external sample chamber OS. The reference luminous flux R is reflected by mirrors M3 and M4 and incident on an integrating sphere IS set at a standard position. The sample luminous flux S, on the other hand, is reflected by a mirror M5 by 90' and incident on the integrating sphere IS across the center of an external reagent chamber. When the transmitted light of a liquid sample is measured by using a rectangular cell, a sample cell is placed right before an incidence window WS for the sample luminous flux and a blank cell is placed right before an incidence window WR1 for the reference luminous flux to take a measurement.

    MEASUREMENT UNIT FOR SPECTROPHOTOMETER

    公开(公告)号:JP2000088740A

    公开(公告)日:2000-03-31

    申请号:JP25486598

    申请日:1998-09-09

    Abstract: PROBLEM TO BE SOLVED: To improve working efficiency when performing the spectral measurement of a sample being installed in a closed container. SOLUTION: In a measurement unit 30, measurement light that is introduced from an optical fiber 11 being fitted from an upper part is bent at right angle by a reflection mirror 43 and is applied from the side surface of a flow cell 31 being extended in a vertical direction. Transmission light through a sample solution in the flow cell 31 is bent at right angle again by a reflection mirror 44 and is sent to an optical fiber 13. As a result, the optical fiber 11 can be connected measurement unit 30 nearly straightly from a through hole being provided on the top surface of a closed container, thus improving a working efficiency without occupying the space in the closed container uselessly.

    SPECTROMETRIC SYSTEM
    46.
    发明专利

    公开(公告)号:JPH10307062A

    公开(公告)日:1998-11-17

    申请号:JP13289597

    申请日:1997-05-06

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PROBLEM TO BE SOLVED: To quickly repair a failure, etc., of a spectrometric apparatus. SOLUTION: A detection signal of each part of a measuring part 10, etc., is sent to a maintenance management apparatus 4 via a communication line 3. A diagnosis part 41 judges the received signal, and a data formation part 42 forms data such as a message and the like if necessary and sends to a spectroscopic apparatus 1 via the communication line 3. Therefore, if the apparatus needs a simple repair or an exchange of parts that can be handled by a measuring person, the measuring person makes the repair in compliance with the message displayed at a display part 17. If a professional maintenance person is to be dispatched, a direct indication is made at the maintenance management apparatus 4.

    SPECTROPHOTOMETER
    47.
    发明专利

    公开(公告)号:JPH10160571A

    公开(公告)日:1998-06-19

    申请号:JP33499896

    申请日:1996-11-29

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PROBLEM TO BE SOLVED: To improve the measuring accuracy by an integrating sphere. SOLUTION: The integrating sphere 10 includes a light-incident window 11 for sample measuring light flux LS, a reflection window 12, a light detecting window 13, and a sample-side light detector 23 which detects diffused reflection light. Reference light flux LR is detected by a reference-side light detector 24 attached outside of the integrating sphere 10. These two detecting signals are added with an adding amplifier, and processed to calculate reflectance and others. Thus, since the numerical aperture of the integrating sphere 10 can be made smaller, the collecting efficiency of diffused light is improved, and since the number of windows can be made smaller, the designing of the integrating sphere 10 is facilitated.

    SPECTRAL ANALYZING DEVICE
    48.
    发明专利

    公开(公告)号:JPH08101119A

    公开(公告)日:1996-04-16

    申请号:JP23801394

    申请日:1994-09-30

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE: To provide a spectral analyzing device which can serve widely from a short wavelength to a long wavelength region by using a bundle type optical fiber formed by bundling together two or more types of optical fibers having different characteristics. CONSTITUTION: A bundle type optical fiber 40 for irradiation and light reception is formed from optical fibers of alkali silica glass 41, non-alkali silica glass 42, and Ge-doped silica glass 43 which are bundled together in an appropriate proportion, and is fixed by a base metal piece 44. When bundled, the element wires are dispersed evenly so that the light transmittance does not become out of uniformity in the cross-section. Thereby, it is established that light is transmitted by optical fiber 40 which has combined nature of element wires. If this optical fiber 40 is connected with the light source part and a photo- measuring part and put in operation, a wide wavelength region covering 200-2500mn is made measurable using one optical fiber 40. A proper setting of the combination and proportion of element wires enables to make measurement with the desired transmittance characteristics.

    REFLECTANCE MEASURING APPARATUS
    49.
    发明专利

    公开(公告)号:JPH07325016A

    公开(公告)日:1995-12-12

    申请号:JP11870094

    申请日:1994-05-31

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

    Abstract: PURPOSE:To carry out measurement for an unknown specimen while the incident angle of luminous fluxes to be measured being set correctly by setting an optical axis correctly by using an adjusting mark having a small hole and a reflection standard mirror before the measurement. CONSTITUTION:An adjusting mark 24 having a small hole 25 is set at a prescribed position in a reflecting optical measuring system 10. At that time, positioning is so carried out by moving the whole body of the reflecting optical measuring system 10 as to make the luminous fluxes to be measured pass the small hole 25. Meanwhile, a reflection standard mirror 21 is set at a position at which a specimen is to be installed. That is, if the angle between the specimen standard face 14 and the impinging light is 30 degrees, the reflection angle of the reflection standard mirror 21 is set precisely at 30 degrees. If there is difference, the reflected light comes out of the impinging light route and impinges against a wall face of the adjusting mark 24 without passing the small hole 25. Consequently, the incident angle of the light to the specimen can be corrected precisely by positioning the reflecting optical measuring system 10 while observing the reflected light of the wall face of the adjusting mark 24.

    50.
    发明专利
    失效

    公开(公告)号:JPH0765930B2

    公开(公告)日:1995-07-19

    申请号:JP10884285

    申请日:1985-05-20

    Applicant: SHIMADZU CORP

    Inventor: ANDO OSAMU

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