Reflective grating for optical diffraction, and manufacturing methods
    41.
    发明授权
    Reflective grating for optical diffraction, and manufacturing methods 失效
    光学衍射用反射光栅及其制造方法

    公开(公告)号:US5949578A

    公开(公告)日:1999-09-07

    申请号:US26071

    申请日:1998-02-19

    Inventor: Bernard Sermage

    CPC classification number: G02B5/1847 G02B5/1861

    Abstract: A reflective grating for the optical diffraction of light rays comprises k juxtaposed, grooved, plane sub-gratings, the planes of the sub-gratings being offset in terms of height with respect to one another along the normal to the plane of the reflective surface of the grooves, enabling the difference in optical path of the grating to be reduced to the difference in optical path between the two ends of a sub-grating.

    Abstract translation: 用于光线的光学衍射的反射光栅包括k并置的,带槽的平面子光栅,子光栅的平面相对于彼此沿着与反射表面的平面的法线相对于彼此偏移 能够使光栅的光路的差异减小到子光栅的两端之间的光路的差。

    分光分析装置
    42.
    发明专利
    分光分析装置 有权
    光谱分析仪

    公开(公告)号:JP2015227858A

    公开(公告)日:2015-12-17

    申请号:JP2014114576

    申请日:2014-06-03

    Inventor: 植村 英生

    Abstract: 【課題】特定の透過波長帯のSN比の劣化を抑制すること。 【解決手段】分光分析装置は、試料からの透過光束または反射光束が入射される光学フィルタ15を備えている。光学フィルタ15は、入光面32の面積および透過波長帯が相異なる複数の光学フィルタ部33であって、入光面32への入射光束のうち、自身の透過波長帯の光を透過させる複数の光学フィルタ部33を、含む。光学フィルタ15が無いと仮定した場合に、光源から光検出器までの光路上の少なくとも一か所で得られる分光特性、または前記光検出器で得られる分光スペクトルにおいて、複数の透過波長帯に含まれる第一透過波長帯の信号強度が第二透過波長帯の信号強度よりも大きい場合、該第一透過波長帯を有する光学フィルタ部33の入光面32の面積は、該第二透過波長帯を有する光学フィルタ部33の入光面32の面積よりも小さい。 【選択図】図4

    Abstract translation: 要解决的问题:抑制特定透射波长带的SN比的恶化。解决方案:光谱分析仪包括其中透射光束或反射光通量从样品入射的滤光器15。 滤光器15是与光入射面32的面积和透射波长带相互不同的多个滤光器部33,并且具有使自身的透过波长带的光成为的多个滤光器部33 在入射光入射到光入射面之间。 当假设滤光器15不可用时,如果包含在多个透射波长带中的第一透射波长带的信号强度大于在至少在...的光谱特性中的第二透射波长带的信号强度 从光源到光学检测器的光路上的一个位置或由光学检测器获得的分光光谱,具有第一透射波长带的光学膜部分33的光入射表面32的面积小于区域 具有第二透射波长带的光滤波器部分33的光入射表面32。

    SPECTROSCOPE, AND LIGHT WAVELENGTH MULTIPLEXER USING THE SAME

    公开(公告)号:JP2002148115A

    公开(公告)日:2002-05-22

    申请号:JP2000341836

    申请日:2000-11-09

    Abstract: PROBLEM TO BE SOLVED: To reduce an insertion loss and polarization dependency, to widen a wavelength band width, to compactify a size, and to reduce a cost. SOLUTION: A grating used for this multiplexer is constituted to make incident light to each groove reflective, to make emitted lights from the respective grooves intensified each other in a direction of the incident light by an interference effect, to make a wave front of an evanescent wave in the groove parallel to a normal direction of the grating, and to make a migration of the evanescent wave in the groove matched by a groove tube. High diffraction efficiencies are obtained thereby in both TM polarization and TE polarization even in the diffraction order not more than several order, the wavelength band width is widen resultingly, and the polarization dependency is allowed to get small without using a compensation means.

    ECHELLE TYPE SPECTROSCOPE
    46.
    发明专利

    公开(公告)号:JPH11264762A

    公开(公告)日:1999-09-28

    申请号:JP8923298

    申请日:1998-03-17

    Applicant: SHIMADZU CORP

    Abstract: PROBLEM TO BE SOLVED: To provide the totally uniform and bright spectral image without affected by the shading by a plane mirror for converting an optical path. SOLUTION: A reflection type Schmidt plate 5 is used, a rotary shaft y1 forming a curved surface of a reflection face of the Schmidt plate and a rotary shaft y2 forming a curved surface of a reflection face of a spherical mirror 6 are same as each other, and the arrangement of the optical elements is determined so that the rotary shaft y2 is shifted from an axis of the incident light of the spherical mirror 6. A spectral image is focused on a detection surface of an optical-detector 7 through the spherical mirror 6, when the luminous flux including the two-dimensional spectral of which the wavelength is dispersed by the echelle diffraction grating 3 and diffraction grating 4 is introduced to the Schmidt plate.

    ECHELLE SPECTROSCOPE
    47.
    发明专利

    公开(公告)号:JPH11230828A

    公开(公告)日:1999-08-27

    申请号:JP2951798

    申请日:1998-02-12

    Applicant: SHIMADZU CORP

    Abstract: PROBLEM TO BE SOLVED: To provide a highly stable echelle spectroscope having high wavelength resolution over a wide wavelength range. SOLUTION: An echelle spectroscope is provided with echelle diffraction gratings 4a and 4b, a single image detector 10, degree separating elements 7a and 7b, and an image forming means 9, and the element constants of the gratings 4a and 4b are decided in accordance with a wavelength range to be covered. The spectroscope is also provided with a shutter 5 for selecting each wavelength range, and the gratings 4a and 4b, elements 7a and 7b, and means 9 are optically arranged so that the spectral light in any wavelength range selected by means of the shutter 5 may form an image in the detector 10.

    Diffraction gating and its manufacture
    48.
    发明专利
    Diffraction gating and its manufacture 失效
    衍射加工及其制造

    公开(公告)号:JPS6120001A

    公开(公告)日:1986-01-28

    申请号:JP14066584

    申请日:1984-07-09

    Abstract: PURPOSE: To obtain the diffraction grating which reflects only a basic wave on Bragg diffraction condition and does not reflect waves of high order by using a material consisting of plural elements and laminating one element in a film thickness direction at a constant period so that a sine-functional density distribution is obtained for other elements.
    CONSTITUTION: A glass substrate 30 is placed on the substrate holder 14 of a vacuum bell jar 11 and then 180g rhenium 40a and 150g beryllium 40b are put in crucibles 12a and 12b respectively. Then programs of mutual density distributions of the rhenium and beryllium to be vapor-deposited on the substrate in the film thickness direction are recorded in controllers 21a and 21b and then electron guns 13a and 13b are put in operation to emit an electron beam to the rhenium 40a and beryllium 40b, thereby forming alternate phases of the vapor-phase deposited film of those elements which have constant period length R. Consequently, the diffraction grating which has alternate layers where density distributions of the rhenium and beryllium vary in the film thickness direction according to a sine function to the constant period length R is manufactured.
    COPYRIGHT: (C)1986,JPO&Japio

    Abstract translation: 目的:为了获得在布拉格衍射条件下仅反射基波的衍射光栅,并且通过使用由多个元件组成的材料并且以恒定的周期在膜厚度方向上层压一个元件而不反射高阶波浪,使得正弦 为其他元件获得功能密度分布。 构成:将玻璃基板30放置在真空钟罩11的基板支架14上,然后将180g铼40a和150g铍40b分别放入坩埚12a和12b中。 然后在控制器21a和21b中记录要在膜厚度方向上气相沉积在基板上的铼和铍的相互密度分布的程序,然后电子枪13a和13b被操作以向铼发射电子束 40a和铍40b,从而形成具有恒定周期长度R的那些元件的气相沉积膜的交替相位。因此,具有交替层的衍射光栅,其中铼和铍的密度分布在膜厚度方向上变化,根据 达到恒定周期长度R的正弦函数。

    50.
    实用新型
    失效

    公开(公告)号:JPS5313399Y1

    公开(公告)日:1978-04-11

    申请号:JP13364173

    申请日:1973-11-19

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