公开(公告)号：AT399977T

公开(公告)日：2008-07-15

申请号：AT06709067

申请日：2006-01-11

Applicant: ESSILOR INT ,  MB OPTIQUE

Inventor： DUBOIS FREDERIC ,  BRAY MICHEL

IPC: G01B11/06 ,  G01B11/00 ,  G02B21/00

Abstract: The probe comprises a light source (20), means for shaping (24, 25, 21) the beam emitted by said light source and the beam coming from a surface arranged close to a target distance, an optical detector unit (22), comprising a pinhole diaphragm (26) and a photoelectric detector (28), providing a voltage peak (31) when said surface is at said target distance and further comprising a diaphragm (27) with a hole larger than said pinhole and a photoelectric detector (29), providing a voltage greater than that produced by said detection sensor (28), except when said surface is a the target distance. The method uses the probe to measure the thickness of an optical lens.