Automated scanning systems for non-destructive inspection of curved cylinder-like workpieces

    公开(公告)号:US10239641B2

    公开(公告)日:2019-03-26

    申请号:US15809376

    申请日:2017-11-10

    Abstract: Systems and methods for high-speed non-destructive inspection of a half- or full-barrel-shaped workpiece, such as a barrel-shaped section of an aircraft fuselage. Such workpieces can be scanned externally using a mobile (e.g., translating) arch gantry system comprising a translatable arch frame disposed outside the fuselage section, a carriage that can travel along a curved track carried by the arch frame, a radially inward-extending telescopic arm having a proximal end fixedly coupled to the carriage, and an NDI sensor unit coupled to a distal end of the telescoping arm. The stiffeners of the fuselage sections can be scanned using a mobile scanner platform disposed inside the fuselage section, which platform comprises a radially outward-extending telescopic arm rotatably coupled to a mobile (e.g., holonomic or linear motion) platform and an NDI sensor unit coupled to a distal end of the telescoping arm. The scan data is matched with position data acquired using any one of a plurality of tracking systems to enable the display of NDI features/flaws on a three-dimensional representation of the workpiece.

    Automated detection of fatigue cracks around fasteners using millimeter waveguide probe

    公开(公告)号:US10168287B2

    公开(公告)日:2019-01-01

    申请号:US14738359

    申请日:2015-06-12

    Abstract: An automated high-speed method for inspecting metal around fasteners and a computer-controlled apparatus for performing that inspection method. The apparatus comprises a multi-motion inspection head mounted on a scanning bridge, a robotic arm, or a robotic crawler vehicle. The multi-motion inspection head comprises a millimeter waveguide probe and a motorized multi-stage probe placement head that is operable for displacing the waveguide probe along X, Y and Z axes to achieve multiple sequenced motions. The waveguide probe is attached to a mandrel that is rotatably coupled to an X-axis (or Y-axis) stage for rotation about the Z axis. Smart servo or stepper motors with feedback control are used to move the waveguide probe into place and then scan across or around a fastener head to inspect for cracks that may be under paint.

    NANOSTRUCTURES FOR PROCESS MONITORING AND FEEDBACK CONTROL

    公开(公告)号:US20180304549A1

    公开(公告)日:2018-10-25

    申请号:US15495925

    申请日:2017-04-24

    Abstract: Various techniques are provided to utilize nanostructures for process monitoring and feedback control. In one example, a method includes forming a layer of material including nanostructures distributed therein. Each nanostructure includes a quantum dot and a shell encompassing the quantum dot. The shells and quantum dots are configured to emit a first and second wavelength, respectively, in response to an excitation signal. The method further includes applying the excitation signal to at least a portion of the layer of material. The method further includes detecting an emitted signal from the portion of the layer of material, where the emitted signal is provided by at least a subset of the nanostructures in response to the excitation signal. The method further includes determining whether a manufacturing characteristic has been satisfied based at least on a wavelength of the emitted signal. Related systems and products are also provided.

Patent Agency Ranking