Abstract:
A semiconductor device having a substrate including a plurality of external terminals on a rear surface and a plurality of bonding terminals electrically connected to the plurality of external terminals on a front surface, a semiconductor chip mounted on the front surface of the substrate, a surface of the chip including a plurality of bonding pads, a plurality of bonding wires connecting between the plurality of bonding pads or between the plurality of bonding terminals and the plurality of bonding wires respectively, a first sealing layer sealing the front surface of the substrate, the plurality of bonding wires and the semiconductor chip, and a second sealing layer comprised of the same material as the first sealing, the second sealing layer being formed above the first sealing layer.
Abstract:
A semiconductor device (100), having an insulating substrate (102); a semiconductor element (101) which is mounted on one main surface of the insulating substrate via adhesive (103), with an element circuit surface of the semiconductor element facing upwards; a first insulating material layer (104a) which seals the element circuit surface of the semiconductor element and the insulating substrate peripheral thereto; a first metal thin film wire layer (105) which is provided on the first insulating material layer (104a) and a portion of which is exposed to an external surface; a first insulating material layer (104b) which is provided on the first metal thin film wire layer (105); a second insulating material layer (107) which is provided on a main surface of the insulating substrate (102) where the semiconductor element is not mounted; a second metal thin film wire layer (106) which is provided inside the second insulating material layer and a portion of which is exposed to an external surface; a via (108) which passes through the insulating substrate and which electrically connects the first metal thin film wire layer (105) in the first insulating material layer (104a) and the second metal thin film wire layer (106); and an external electrode (109) which is formed on the first metal thin film wire layer (105), the semiconductor device having a structure in which the second metal thin film wire layer, an electrode arranged on the element circuit surface of the semiconductor element, the first metal thin film wire layer, the via and the external electrode formed on the first metal thin film wire layer are electrically connected.
Abstract:
A semiconductor module, having a semiconductor package, which is obtained by mounting and resin-sealing a semiconductor bare chip on a first package substrate; a semiconductor bare chip; and a second package substrate; wherein the semiconductor package is mounted on the second package substrate and the semiconductor bare chip is mounted on the semiconductor package, wherein the semiconductor package is bonded to the second package substrate at the resin surface and electrically connected to the second package substrate by wire bonding.
Abstract:
In the semiconductor module comprising a package substrate, a first semiconductor package, and a semiconductor bare chip, such problems as the occurrence of a wire short caused by warpage of the first semiconductor package and non-filling and the like at the time of resin sealing can be solved. A semiconductor module (10), having: a semiconductor package (6), which is obtained by mounting and resin-sealing a semiconductor bare chip (1) on a first package substrate (4); a semiconductor bare chip 2; and a second package substrate (12), the semiconductor module being characterized in that the semiconductor package (6) is mounted on the second package substrate (12) and the semiconductor bare chip (2) is mounted on the semiconductor package (6).
Abstract:
A semiconductor device having a substrate including a plurality of external terminals on a rear surface and a plurality of bonding terminals electrically connected to the plurality of external terminals on a front surface, a semiconductor chip mounted on the front surface of the substrate, a surface of the chip including a plurality of bonding pads, a plurality of bonding wires connecting between the plurality of bonding pads or between the plurality of bonding terminals and the plurality of bonding wires respectively, a first sealing layer sealing the front surface of the substrate, the plurality of bonding wires and the semiconductor chip, and a second sealing layer comprised of the same material as the first sealing, the second sealing layer being formed above the first sealing layer.
Abstract:
A semiconductor storage device (100) includes a controller package (110) having a BGA terminal on a bottom surface thereof; and one or a plurality of memory packages (120) each including a plurality of semiconductor storage elements and mounted on the controller package. The controller package includes a bottom substrate having the BGA terminal on a bottom surface thereof; a power supply IC, mounted on the bottom substrate, for supplying a plurality of power supplies; and a controller mounted on the bottom substrate and operable by the plurality of power supplies supplied from the power supply IC. The controller provides an interface with an external system via the BGA terminal and controls a read operation from the semiconductor storage elements and a write operation to the semiconductor storage elements.
Abstract:
A semiconductor device, comprising: a semiconductor element; a support substrate (1); an insulating material layer (4) for sealing the semiconductor element (2a, 2b) and a periphery thereof; a metal thin film wiring layer provided in the insulating material layer (4), with a part thereof being exposed on an external surface; and metal vias (9) provided in the insulating material layer (4) and electrically connected to the metal thin film wiring layer, wherein the semiconductor element (2a, 2b) is provided in a plurality, and the respective semiconductor elements (2a, 2b) are stacked via an insulating material (4) such that a circuit surface of each semiconductor element (2a, 2b) faces the metal thin film wiring layer, and electrode pads of each semiconductor element (2a) are exposed without being hidden by the semiconductor element (2b) stacked thereabove, and electrically connected to the metal thin film wiring layer. The semiconductor device can be manufactured in a smaller and thinner size and the number of manufacturing steps can be reduced by causing a plurality of semiconductor chips to be a vertically-stacked structure.
Abstract:
A semiconductor module, having a semiconductor package, which is obtained by mounting and resin-sealing a semiconductor bare chip on a first package substrate; a semiconductor bare chip; and a second package substrate; wherein the semiconductor package is mounted on the second package substrate and the semiconductor bare chip is mounted on the semiconductor package, wherein the semiconductor package is bonded to the second package substrate at the resin surface and electrically connected to the second package substrate by wire bonding.
Abstract:
A semiconductor device, comprising: a semiconductor element; a support substrate (1); an insulating material layer (4) for sealing the semiconductor element (2a, 2b) and a periphery thereof; a metal thin film wiring layer provided in the insulating material layer (4), with a part thereof being exposed on an external surface; and metal vias (9) provided in the insulating material layer (4) and electrically connected to the metal thin film wiring layer, wherein the semiconductor element (2a, 2b) is provided in a plurality, and the respective semiconductor elements (2a, 2b) are stacked via an insulating material (4) such that a circuit surface of each semiconductor element (2a, 2b) faces the metal thin film wiring layer, and electrode pads of each semiconductor element (2a) are exposed without being hidden by the semiconductor element (2b) stacked thereabove, and electrically connected to the metal thin film wiring layer. The semiconductor device can be manufactured in a smaller and thinner size and the number of manufacturing steps can be reduced by causing a plurality of semiconductor chips to be a vertically-stacked structure.