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    DETECTION DEVICE
    53.
    发明申请
    DETECTION DEVICE 有权

    公开(公告)号：US20170138859A1

    公开(公告)日：2017-05-18

    申请号：US15320099

    申请日：2015-06-16

    Applicant: Konica Minolta, Inc.

    Inventor： Ichiro FUJIYO ,  Tetsuya NODA

    IPC: G01N21/64

    CPC classification number: G01N21/6428 ,  G01N21/645 ,  G01N21/648 ,  G01N2021/6439 ,  G01N2021/6471 ,  G01N2201/0806

    Abstract: A detection device comprises a chip holder, a light source, a light-guide rod, a wavelength separation filter, and an optical sensor. Given the relationship between the angle of incidence and light intensity of fluorescence on a light reception surface of the optical sensor, the optical transmittance of the wavelength separation filter at the dominant wavelength of the rays of fluorescence incident on the light reception surface at a peak angle of incidence at which the light intensity is the highest is greater than the optical transmittance of the wavelength separation filter at the dominant wavelength of the rays of excitation light incident on the light reception surface at the peak angle of incidence and is higher than the optical transmittance of the wavelength separation filter at the dominant wavelength of the rays of fluorescence incident on the light reception surface at an angle of incidence of 0 DEG.

    DEVICE FOR DETERMINING THE CONCENTRATION OF AT LEAST ONE GAS IN A SAMPLE GAS STREAM
    54.
    发明申请
    DEVICE FOR DETERMINING THE CONCENTRATION OF AT LEAST ONE GAS IN A SAMPLE GAS STREAM 有权
    用于确定气体流中最少一种气体的浓度的装置

    公开(公告)号：US20150125345A1

    公开(公告)日：2015-05-07

    申请号：US14396388

    申请日：2013-03-12

    Applicant: AVL EMISSION TEST SYSTEMS GMBH

    Inventor： Norbert Kreft

    IPC: G01N21/76 ,  G01N33/00

    CPC classification number: G01N21/766 ,  G01N33/0037 ,  G01N2201/0636 ,  G01N2201/0806 ,  G01N2201/084 ,  G01N2201/0846 ,  Y02A50/245

    Abstract: A device for determining a concentration of at least one gas in a sample gas stream includes an analysis chamber, a detector, and a connecting channel. The analysis chamber is configured to have the sample gas stream and a reaction gas stream be introduced therein. The sample gas stream and the reaction gas stream are mixed to a gas mixture which reacts so as to emit an optical radiation. The detector is configured to measure the optical radiation. The connecting channel is configured to connect the analysis chamber to the detector. The connecting channel is configured as a light conductor extending from the analysis chamber to the detector.

    Abstract translation: 用于确定样品气流中的至少一种气体的浓度的装置包括分析室，检测器和连接通道。 分析室被构造成具有样品气流并且反应气流被引入其中。 将样品气流和反应气流混合到反应以发射光辐射的气体混合物中。 检测器被配置成测量光辐射。 连接通道被配置为将分析室连接到检测器。 连接通道被配置为从分析室延伸到检测器的光导体。

    Sample measurement system
    55.
    发明授权
    Sample measurement system 有权
    样品测量系统

    公开(公告)号：US09006684B2

    公开(公告)日：2015-04-14

    申请号：US12738843

    申请日：2008-10-08

    Applicant: Jyrki Laitinen ,  Petri Kivelä

    Inventor： Jyrki Laitinen ,  Petri Kivelä

    IPC: G01J1/58 ,  G01N21/64 ,  G01J3/02 ,  G01J3/10 ,  G01J3/18 ,  G01J3/44 ,  G01N21/25

    CPC classification number: G01N21/6452 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0297 ,  G01J3/10 ,  G01J3/18 ,  G01J3/4406 ,  G01N21/253 ,  G01N21/6428 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2021/6471 ,  G01N2021/6484 ,  G01N2201/0627 ,  G01N2201/0806

    Abstract: The invention relates to an apparatus and method for optically analyzing samples contained in sample sites of a sample holder by means of fluorescence. The apparatus comprises a first light source comprising a plurality of individual light sources having narrow wavelength bands, means for further limiting wavelength bands of the light emitted by the individual light sources, means for guiding the reduced-wavelength light to the sample sites of the sample holder, and a detector for detecting light from the sample sites. According to the invention said means for further reducing the wavelength bands emitted by the individual light sources comprise a wavelength-tunable single monochromator. The invention allows manufacturing of a microplate reader having the capability for fluorescence measurements at a continuous wavelength range, while maintaining the cost of the device at a reasonable level.

    Abstract translation: 本发明涉及一种用于通过荧光光学分析样品保持器的样品位点中包含的样品的装置和方法。 该装置包括：第一光源，其包括具有窄波长带的多个单独的光源;用于进一步限制由各个光源发射的光的波长带的装置;用于将所述还原波长的光引导到所述样品的样品位置的装置 支架和用于检测来自样品位点的光的检测器。 根据本发明，用于进一步减少由各个光源发射的波长带的装置包括波长可调单色器。 本发明允许制造具有在连续波长范围内的荧光测量能力的酶标仪，同时将装置的成本保持在合理的水平。

    Fault inspection device and fault inspection method
    56.
    发明授权
    Fault inspection device and fault inspection method 有权
    故障检查装置及故障检查方法

    公开(公告)号：US08804110B2

    公开(公告)日：2014-08-12

    申请号：US13703414

    申请日：2011-05-20

    Applicant: Yuta Urano ,  Shigenobu Maruyama ,  Toshiyuki Nakao ,  Toshifumi Honda ,  Yukihiro Shibata

    Inventor： Yuta Urano ,  Shigenobu Maruyama ,  Toshiyuki Nakao ,  Toshifumi Honda ,  Yukihiro Shibata

    IPC: G01N21/00 ,  G01N21/95 ,  G01N21/94 ,  G01N21/956

    CPC classification number: G01N21/94 ,  G01N21/47 ,  G01N21/8806 ,  G01N21/9501 ,  G01N21/956 ,  G01N2021/4711 ,  G01N2021/8867 ,  G01N2021/8874 ,  G01N2201/0806 ,  G01N2201/10

    Abstract: Proposed is a defect inspection method whereby: illuminating light having a substantially uniform illumination intensity distribution in one direction of a sample surface irradiated on the sample surface; multiple scattered light components, which are output in multiple independent directions, are detected among the scattered light from the sample surface and multiple corresponding scattered light detection signals are obtained; at least one of the multiple scattered light detection signals is processed and the presence of defects is determined; at least one of the multiple scattered light detection signals that correspond to each of the points determined by the processing as a defect is processed and the dimensions of the defect are determined; and the position and dimensions of the defect on the sample surface, at each of the points determined as a defect, are displayed.

    Abstract translation: 提出了一种缺陷检查方法，其中：照射在样品表面上的样品表面的一个方向具有基本上均匀的照明强度分布的光; 在来自样品表面的散射光中检测多个独立方向输出的多个散射光分量，并获得多个相应的散射光检测信号; 处理多个散射光检测信号中的至少一个并确定缺陷的存在; 处理与通过处理确定的每个点对应的多个散射光检测信号中的至少一个作为缺陷，并确定缺陷的尺寸; 并且显示在被确定为缺陷的每个点处的样品表面上的缺陷的位置和尺寸。

    Method and apparatus for measuring purity of noble gases
    58.
    发明授权
    Method and apparatus for measuring purity of noble gases 失效
    用于测量稀有气体纯度的方法和装置

    公开(公告)号：US07351981B2

    公开(公告)日：2008-04-01

    申请号：US11350240

    申请日：2006-02-08

    Applicant: Robert Austin

    Inventor： Robert Austin

    IPC: G01J1/42

    CPC classification number: G01N21/03 ,  G01N21/33 ,  G01N23/227 ,  G01N2201/0806

    Abstract: A device for detecting impurities in a noble gas includes a detection chamber and a source of pulsed ultraviolet light. The pulse of the ultraviolet light is transferred into the detection chamber and onto a photocathode, thereby emitting a cloud of free electrons into the noble gas within the detection chamber. The cloud of electrons is attracted to the opposite end of the detection chamber by a high positive voltage potential at that end and focused onto a sensing anode. If there are impurities in the noble gas, some or all of the electrons within the cloud will bond with the impurity molecules and not reach the sensing anode. Therefore, measuring a lower signal at the sensing anode indicates a higher level of impurities while sensing a higher signal indicates fewer impurities. Impurities in the range of one part per billion can be measured by this device.

    Abstract translation: 用于检测惰性气体中的杂质的装置包括检测室和脉冲紫外光源。 紫外光的脉冲被传送到检测室和光电阴极上，从而将自由电子云发射到检测室内的惰性气体中。 电子云被吸收到检测室的另一端，在该端处具有高的正电压电位并聚焦到感测阳极上。 如果稀有气体中存在杂质，云中的部分或全部电子将与杂质分子结合，而不会到达感应阳极。 因此，在感测阳极处测量较低的信号指示较高水平的杂质，同时感测较高的信号表示较少的杂质。 该装置可以测量十亿分之一的杂质。

    Spectrophotometric image scrambler for full aperture microspectroscopy
    60.
    发明授权
    Spectrophotometric image scrambler for full aperture microspectroscopy 失效
    分光光度图像加扰器，用于全孔径显微光谱

    公开(公告)号：US4712912A

    公开(公告)日：1987-12-15

    申请号：US837672

    申请日：1986-03-10

    Applicant: Robert G. Messerschmidt

    Inventor： Robert G. Messerschmidt

    IPC: G01J3/02 ,  G01N21/25 ,  G01N21/55 ,  G01N21/59

    CPC classification number: G01N21/255 ,  G01J3/02 ,  G01N21/474 ,  G01N2201/0806

    Abstract: The optical system of the present invention comtemplates directing a beam of radiant energy to either an aperture beam splitter or polarizing beam splitter. Radiant energy from the beam splitter forms a first remote image at an entrance to an image scrambler so that any image information which the beam contains is destroyed. The output of the scrambler fills the full aperture of a focusing objective that reproduces the image of the output of the scrambler onto a sample. A mask, positioned at a remote image between the output of the scrambler and focusing objective, determines the geometrical shape of the sample image. The focusing objective images the radiant energy that is reflected from the sample to a second remote image at the scrambler so that the scrambler destroys image information while retaining spectroscopic information. The beam splitter reflects a portion of the radiant energy from the scrambler to the detector. The absence of image information in the radiant energy from the sample reduces measurement errors by producing a predictable dispersion of radiant energy at the detector.

    Abstract translation: 本发明的光学系统旨在将辐射能束照射到孔径分束器或偏振分束器。 来自分束器的辐射能量在图像加扰器的入口处形成第一远程图像，使得束包含的任何图像信息被破坏。 加扰器的输出填充聚焦目标的全孔径，其将扰频器的输出的图像再现到样本上。 位于加扰器的输出端和聚焦目标之间的远程图像处的掩模确定样本图像的几何形状。 聚焦目标将从样本反射的辐射能量图像化成加扰器处的第二远程图像，使得加扰器在保留光谱信息的同时破坏图像信息。 分束器将辐射能量的一部分从扰频器反射到检测器。 来自样品的辐射能中不存在图像信息通过在检测器处产生可预测的辐射能的色散来降低测量误差。

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