公开(公告)号：US20180321483A1

公开(公告)日：2018-11-08

申请号：US15589542

申请日：2017-05-08

Applicant: STMicroelectronics Ltd

Inventor： Elik Haran

IPC: G02B26/08 ,  G02B26/10 ,  B81B7/00

CPC classification number: G02B26/085 ,  B81B7/008 ,  G02B26/101 ,  G02B26/105

Abstract: An electronic device disclosed herein includes a mirror controller configured to generate a drive control signal, with a drive circuit configured to generate a drive signal for a movable mirror based upon the drive control signal. A sensing circuit is configured to sense the drive signal. The mirror controller is further configured to adjust the drive control signal as a function of the sensed drive signal.

公开(公告)号：US09942531B2

公开(公告)日：2018-04-10

申请号：US15458192

申请日：2017-03-14

Applicant: STMicroelectronics Ltd

Inventor： Sason Sourani

IPC: H04N9/68 ,  H04N9/31 ,  G02B27/14

CPC classification number: H04N9/3194 ,  G02B27/141 ,  H04N9/3129 ,  H04N9/3158 ,  H04N9/3161 ,  H04N9/3182 ,  H04N9/3185

Abstract: A color calibration device for a laser scanning apparatus includes a compensation unit configured to electronically compensate for positional errors of the three-color laser source. The compensation unit includes an emitted light detector configured to measure a power of an emitted light beam. A calibration unit coupled to the emitted light detector has a controller configured to generate a quantity correction value for the three-color laser source. A laser source control element is configured to generate a control quantity for the three-color laser source, based on the quantity correction value. A dominant color detector is configured to detect any dominant color in the light beam being projected and actuate the controller for the dominant color.

公开(公告)号：US20180067303A1

公开(公告)日：2018-03-08

申请号：US15256909

申请日：2016-09-06

Applicant: STMicroelectronics Ltd

Inventor： Sason Sourani

IPC: G02B26/08

CPC classification number: G02B26/0841 ,  B81B2201/042 ,  B81B2203/0136 ,  G09G3/346 ,  H02P25/032

Abstract: The present disclosure provides a system and method for controlling operation of a resonance MEMS mirror. The system and method includes activating either an in-plane or staggered MEMS mirror via sets of activation pulses applied to the MEMS mirror, detecting current at the MEMS mirror, generating a window for detecting a change in a direction of the current at the MEMS mirror, and terminating the window and the activation pulse if a change in the current direction is detected during the window. In some embodiments, two sets of activation pulses are applied to the MEMS mirror.

公开(公告)号：US20170363506A1

公开(公告)日：2017-12-21

申请号：US15188455

申请日：2016-06-21

Applicant: STMicroelectronics LTD

Inventor： Sason Sourani

IPC: G01M11/00 ,  G08B21/18 ,  G02B26/08

CPC classification number: G01M11/005 ,  B81B3/00 ,  B81B7/008 ,  B81B2201/042 ,  G02B26/0833 ,  G02B26/0841 ,  G08B21/185

Abstract: Disclosed herein is a circuit for determining failure of a movable MEMS mirror. The circuit includes an integrator receiving an opening angle signal representing an opening angle of the movable MEMS mirror, and a differentiator receiving the opening angle signal. A summing circuit is configured to sum the integrator output and the differentiator output. A comparison circuit is configured to determine whether the sum of the integrator output and differentiator output is not within a threshold window. An indicator circuit is configured to generate an indicator signal indicating that the movable MEMS mirror has failed based on the comparison circuit indicating that the sum of the integrator output and differentiator output is not within the threshold window.

公开(公告)号：US20130083501A1

公开(公告)日：2013-04-04

申请号：US13630872

申请日：2012-09-28

Applicant: STMicroelectronics Ltd (Malta)

Inventor： Mark A. Azzopardi ,  Kevin Formosa ,  Ivan Ellul

IPC: B32B1/02 ,  B32B15/01 ,  H05K5/03 ,  B23K1/20

CPC classification number: H01L23/10 ,  B81C1/00269 ,  B81C2203/019 ,  H01L2924/0002 ,  H01L2924/16152 ,  Y10T428/1241 ,  Y10T428/13 ,  H01L2924/00

Abstract: One embodiment discloses a method for soldering a cap for an integrated electronic device to a support layer, including the steps of: providing a support layer; providing a cap including a core of a first material and a coating layer of a second material, the first and second material being respectively wettable and non-wettable with respect to a solder, the coating layer being arranged so as to expose a surface of the core; coupling the cap with the support layer; and soldering the surface of the core to the support layer, by means of the solder.

Abstract translation: 一个实施例公开了一种用于将集成电子设备的盖焊接到支撑层的方法，包括以下步骤：提供支撑层; 提供包括第一材料的芯和第二材料的涂层的盖，所述第一和第二材料分别相对于焊料可润湿和不可湿润，所述涂层被布置为暴露所述第一材料的表面 核心; 将盖与支撑层联接; 并通过焊料将芯的表面焊接到支撑层。

公开(公告)号：US20130082258A1

公开(公告)日：2013-04-04

申请号：US13629157

申请日：2012-09-27

Applicant: STMicroelectronics S.r.l. ,  STMicroelectronics Ltd (Malta)

Inventor： Mark Anthony Azzopardi ,  Conrad Cachia ,  Stefano Pozzi

IPC: H01L21/50 ,  H01L23/58

CPC classification number: B81C99/004 ,  H01L24/97 ,  H01L2224/48091 ,  H01L2224/49109 ,  H01L2224/73265 ,  H01L2924/181 ,  H01L2924/00014 ,  H01L2924/00

Abstract: A method for testing a strip of MEMS devices, the MEMS devices including at least a respective die of semiconductor material coupled to an internal surface of a common substrate and covered by a protection material; the method envisages: detecting electrical values generated by the MEMS devices in response to at least a testing stimulus; and, before the step of detecting, at least partially separating contiguous MEMS devices in the strip. The step of separating includes defining a separation trench between the contiguous MEMS devices, the separation trench extending through the whole thickness of the protection material and through a surface portion of the substrate, starting from the internal surface of the substrate.

Abstract translation: 一种用于测试MEMS器件条的方法，所述MEMS器件至少包括耦合到公共衬底的内表面并由保护材料覆盖的半导体材料的相应裸片; 该方法设想：响应于至少一个测试刺激来检测由MEMS器件产生的电值; 并且在所述检测步骤之前，至少部分地分离所述条带中的连续的MEMS器件。 分离步骤包括在连续的MEMS器件之间限定分离沟槽，分离沟槽从衬底的内表面开始延伸穿过保护材料的整个厚度并穿过衬底的表面部分。

公开(公告)号：US20040188728A1

公开(公告)日：2004-09-30

申请号：US10781977

申请日：2004-02-19

Applicant: STMicroelectronics Ltd.

Inventor： Lindsay Grant

IPC: H01L031/062 ,  H01L031/113 ,  C30B001/00 ,  H01L021/20 ,  H01L021/36

CPC classification number: H01L27/14609 ,  H01L27/1462

Abstract: A CMOS image sensor and method for making such a sensor includes a coating over the photosensing parts, wherein the coating performs a dual function. In fabrication, the coating prevents the formation of silicide, which is not optically opaque, on the photosensing parts. When the CMOS sensor is in use, the coating helps to couple light onto the photosensing parts, and therefore acts as an anti-reflective layer. The method of fabrication uses a self-aligning technique, which ensures pixel-to-pixel uniformity.

Abstract translation: 用于制造这种传感器的CMOS图像传感器和方法包括在光敏部件上的涂层，其中涂层执行双重功能。 在制造中，涂层防止在光敏部件上形成不是光学不透明的硅化物。 当使用CMOS传感器时，涂层有助于将光耦合到光敏部件上，因此用作抗反射层。 制造方法使用自对准技术，其确保像素到像素的均匀性。

公开(公告)号：US20040027470A1

公开(公告)日：2004-02-12

申请号：US10407871

申请日：2003-04-04

Applicant: STMicroelectronics Ltd

Inventor： Robert Henderson ,  Jonathan Ephriam David Hurwitz

IPC: H04N005/335

CPC classification number: H04N5/3653 ,  H04N5/3575

Abstract: An image sensor has an array of pixels read by column circuits to provide reset and read samples on a pair of sample capacitors. To alleviate the effects of parasitic capacitance in the region of the sample capacitors, a modified timing arrangement is used. Both sample switches are operated simultaneously to pre-charge both sample capacitors with a pixel signal value. One sample switch is operated after reset to apply a reset value to one of the pre-charged sample capacitors.

Abstract translation: 图像传感器具有由列电路读取的像素阵列，以在一对采样电容器上提供复位和读取样本。 为了减轻样品电容器区域中的寄生电容的影响，使用修正的定时装置。 两个采样开关同时工作，以预先给像素信号值的两个采样电容器预充电。 一个采样开关在复位后运行，将一个复位值应用于一个预充电采样电容。

公开(公告)号：US20030227040A1

公开(公告)日：2003-12-11

申请号：US10405101

申请日：2003-04-01

Applicant: STMicroelectronics Ltd

Inventor： Robert Henderson

IPC: H01L031/062

CPC classification number: H04N5/3575 ,  H04N5/363 ,  H04N5/374

Abstract: A solid state image sensor has an array of pixels in which each column has a reset voltage line and a read line. The sensor is reset and read a row at a time, with reset-related values held in a frame buffer for subsequent subtraction from read values. Reset-related values are derived in each column by sampling the voltage during reset on one capacitor and the voltage on release of reset on a second capacitor, and differencing these values to provide an output for the frame buffer. This provides a reduction in the size of frame buffer which would otherwise be required.

Abstract translation: 固态图像传感器具有其中每列具有复位电压线和读取线的像素阵列。 传感器一次复位并读取一行，复位相关值保持在帧缓冲器中，以便随后从读取值中减去。 通过在一个电容器的复位期间对电压进行采样，在第二个电容器上进行复位时的电压，并对这些值进行差分以提供帧缓冲器的输出，从而在每列中得到复位相关值。 这样可以减少否则将需要的帧缓冲区的大小。

公开(公告)号：US20030020531A1

公开(公告)日：2003-01-30

申请号：US10206135

申请日：2002-07-26

Applicant: STMicroelectronics Ltd.

Inventor： Rajesh Kaushik

IPC: H03K017/16

CPC classification number: H03K17/166

Abstract: A CMOS output buffer uses feedback from a ground node to reduce ground bounce by utilizing a tolerable ground bounce limit, making it less sensitive to operating conditions and processing parameters. An input to the NMOS device of the output buffer is provided by the output of a control element which receives a first input from a pre-driver and a second input (i.e., the feedback) from the ground node.

Abstract translation: CMOS输出缓冲器使用来自接地节点的反馈，通过利用可容忍的接地反弹限制来减少接地反弹，使其对工作条件和处理参数的敏感性降低。 输出缓冲器的NMOS器件的输入由从接地节点接收来自预驱动器的第一输入和第二输入（即，反馈）的控制元件的输出提供。