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公开(公告)号：KR1020020022881A
公开(公告)日：2002-03-28
申请号：KR1020000055421
申请日：2000-09-21
Applicant: 광주과학기술원
IPC: H04B10/00
CPC classification number: G01N21/412
Abstract: PURPOSE: A device for measuring a refractive index structure of the surface of an optical fiber or an optical waveguide is provided to project three laser beams having different wavelengths on the surface of the optical fiber or the optical waveguide as scanning the surface, and to measure reflection rate changes on the surface according to each location in the state of maintaining scanning height, so as to precisely measure a refraction rate distribution having a high signal to noise ratio. CONSTITUTION: A lens(12) induces a light coming from a reflection surface(16), which forms focal points of three laser beams(L1,L2,L3) of an optical fiber end(10a') or measures a refraction rate structure, to an optical fiber(10a) again. A PZD(PieZo electric Transducer) adjusts a distance between the optical fiber end(10a') and the lens(12) in proportion to a voltage generated by light strength differences between the laser(L1) having a short wavelength and the laser(L2) having a long wavelength. WDMs(Wavelength Division Multiplexers)(WDM1,WDM2) induce the laser beams(L1, L2, L3) through an optical fiber(10b) or make reflected lights proceed toward the laser beams(L1,L2,L3). PCs(Photo Couplers)(PC1,PC2,PC3) divide or couple the laser beams(L1,L2,L3). PDs(Photo Detectors)(PD1,PD2,PD3) measure the strength of the laser beams coming through the PCs(PC1,PC2,PC3). A DA(Differential Amplifier) subtracts the strength of a light of the PD2 from the strength of the PD1, and amplifies the light. An x-axis scanner(XSC) and a y-axis scanner(YSC) scan the reflection surface(16) to measure the strength of a light reflected from the middle-wavelength laser(L3) detected from the PD3.
Abstract translation: 目的：提供一种用于测量光纤或光波导表面的折射率结构的装置，用于在光纤或光波导的表面上投射具有不同波长的三个激光束作为扫描表面，并测量 根据保持扫描高度的状态的每个位置的表面上的反射率变化，以精确地测量具有高信噪比的折射率分布。 构成：透镜（12）引导来自反射表面（16）的光，其形成光纤端（10a'）的三个激光束（L1，L2，L3）的焦点或测量折射率结构， 再次到达光纤（10a）。 PZD（PieZo电传感器）与具有短波长的激光器（L1）和激光器（L2）之间的光强度差产生的电压成比例地调整光纤端部（10a'）和透镜（12）之间的距离 ）具有长波长。 WDM（波分复用器）（WDM1，WDM2）通过光纤（10b）引导激光束（L1，L2，L3），或使反射光朝激光束（L1，L2，L3）前进。 PC（光电耦合器）（PC1，PC2，PC3）分割或耦合激光束（L1，L2，L3）。 PD（光电探测器）（PD1，PD2，PD3）测量通过PC（PC1，PC2，PC3）的激光束的强度。 DA（差分放大器）从PD1的强度中减去PD2的光的强度，并放大光。 x轴扫描器（XSC）和y轴扫描器（YSC）扫描反射表面（16）以测量从PD3检测到的从中波长激光器（L3）反射的光的强度。
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公开(公告)号：KR1020010113272A
公开(公告)日：2001-12-28
申请号：KR1020000033540
申请日：2000-06-19
Applicant: 광주과학기술원
IPC: G01B11/24
Abstract: 본 발명은 자동 거리 유지장치를 이용한 물질 표면구조 측정장치에 관한 것으로, 서로 다른 파장을 갖는 제 1 및 제 2광원을 하나의 전송로에 다중 유도하는 파장분할 다중화수단과, 상기 다중 유도된 제 1 및 제 2광원을 특정 물질의 표면 방향(Z축 방향)으로 집중시키는 집광수단과, 상기 물질 표면이 상기 제 1광원의 광웨이스트와 상기 제 2광원의 광웨이스트 사이의 소정 위치를 유지하도록 제어하는 서보수단과, 상기 물질 표면을 X축 및 Y축 방향으로 측정하는 스캔수단과, 상기 서보수단에 의한 위치 제어값을 상기 물질 표면의 Z축 좌표로 입력받고 상기 스캔수단에 의하여 측정된 상기 물질 표면의 X축 및 Y축 좌표를 입력받아 상기 물질 표면구조를 3차원 정보로 가공하는 이미지 처리수단을 포함하여, 종래 기술과 비교할 때에 위상 측정장치 및 광분 리기 등과 같은 광학계가 사용되지 않아 안정된 구조를 가지며 구조가 간단하여 외부 충격에 매우 강한 이점이 있다.
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公开(公告)号：KR1020010081775A
公开(公告)日：2001-08-29
申请号：KR1020000007881
申请日：2000-02-18
Applicant: 광주과학기술원
IPC: G01J3/46
CPC classification number: G01J3/462 , G01J3/0208 , G01J3/502
Abstract: PURPOSE: A measuring device for a color distribution of an optical fiber is provided to precisely measure the color distribution for the short optical fiber by using an optical fine distance measuring function and a fourie spectroscopy. CONSTITUTION: A beam generated from a light source(110) is divided into first and second optical signals by a first direction binder(115). The first signal is supplied to an optical collimator element(120-1) in a first collimator unit(120), and the second signal penetrates an optical fiber(135). The first signal passes through a scan system for being transferred to an optical fiber polarization adjuster(130) by passing through a first optical fiber collimator element(125-1) in a second optical fiber collimator unit(125). Thus, the optical signals are combined by a third direction binder(140). A first optical detector(145) measures an interference pattern data for transferring to a computer(155) through a low pass filter(150). A second direction binder(175) combines first and second helium-neon optical signals for transferring to a second optical detector(185). Thus, the second optical detector measures an interference pattern data from the helium-neon optical signal. Then, the computer measures the color distribution of the optical fiber by using the interference pattern data.
Abstract translation: 目的：提供一种用于光纤颜色分布的测量装置，通过使用光学精细距离测量功能和四维光谱来精确测量短光纤的颜色分布。 构成：由光源（110）产生的光束通过第一方向装订器（115）被分成第一和第二光信号。 第一信号被提供给第一准直器单元（120）中的准直器元件（120-1），并且第二信号穿透光纤（135）。 第一信号通过扫描系统，以通过穿过第二光纤准直器单元（125）中的第一光纤准直元件（125-1）传送到光纤偏振调节器（130）。 因此，光信号由第三方向装订器（140）组合。 第一光学检测器（145）测量通过低通滤波器（150）传送到计算机（155）的干涉图案数据。 第二方向装订器（175）组合第一和第二氦氖光信号以转移到第二光学检测器（185）。 因此，第二光学检测器测量来自氦氖光信号的干涉图案数据。 然后，计算机通过使用干涉图案数据来测量光纤的颜色分布。
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公开(公告)号：KR101147487B1
公开(公告)日：2012-05-21
申请号：KR1020100067446
申请日：2010-07-13
Applicant: 광주과학기술원
IPC: G01N21/64 , G01N29/38 , G01N33/483
Abstract: 본 발명은 형광 수명 이미징을 위한 형광 수명 계산 시스템 및 그 방법에 관한 것이다. 본 발명은 시료를 통과한 형광 신호 및 기준 신호를 각각 필터링시키는 필터링부; 필터링된 형광 신호의 제1 중심점과 필터링된 기준 신호의 제2 중심점을 측정하는 중심점 측정부; 및 제1 중심점과 제2 중심점을 비교하여 얻은 시간차를 이용하여 형광 수명을 계산하는 형광 수명 계산부를 포함하는 것을 특징으로 하는 형광 수명 계산 시스템을 제공한다. 본 발명에 따르면, 실시간 형광 수명 이미징이 가능하며, 데이터 수집 속도가 빨라져 빠른 동적 현상 분석이 가능해진다.
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公开(公告)号：KR1020110029475A
公开(公告)日：2011-03-23
申请号：KR1020090087159
申请日：2009-09-15
Applicant: 광주과학기술원
CPC classification number: G02B21/0036 , G02B21/0052 , G02B21/008 , G02B21/02 , G02B21/08
Abstract: PURPOSE: A confocal laser scanning microscope is provided to minimize the distortion and damage to the image of a sample which is generated in changing a scanning direction by using an optical mask. CONSTITUTION: A confocal laser scanning microscope(1) comprise: an excited light generator(10) generating an excited light; an optical scanning unit(30) guiding the excited to a sample to scan it; a collimation part(40); a optical mask part(50) guiding the excited light to the predetermined region of the sample; a condenser lens(60); an optical distribution part(20); and an optical detecting part(70) detecting distributed light from the optical distribution part and obtaining a sample image.
Abstract translation: 目的：提供共聚焦激光扫描显微镜，以最小化通过使用光学掩模改变扫描方向而产生的样品的图像的变形和损伤。 构成：共焦激光扫描显微镜（1）包括：产生激发光的激发光发生器（10）; 光学扫描单元（30），引导被激发到样品进行扫描; 准直部分（40）; 光学掩模部分（50），其将激发的光引导到样品的预定区域; 聚光透镜（60）; 光分配部（20）; 以及光学检测部（70），其检测来自所述光分布部的分布光，得到样本图像。
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Patent Agency Ranking
公开(公告)号：KR1020110019149A
公开(公告)日：2011-02-25
申请号：KR1020090076745
申请日：2009-08-19
Applicant: 광주과학기술원
CPC classification number: G02B21/0004 , G06T7/593 , G06T2207/10012 , G06T2207/20056 , H04N13/25
Abstract: PURPOSE: A fast imaging device using an image sensor and a method thereof are provided to obtain an accurate high quality 3D image even though an existing microscope is used. CONSTITUTION: A fast imaging device comprises the following units. A photographing unit(110) obtains 2D images by scanning and photographing a sample in a depth direction several times. An image reconfiguration unit(120) generates a 3D image from the sample using 2D images.
Abstract translation: 目的：提供使用图像传感器的快速成像装置及其方法，以便即使使用现有的显微镜也能获得准确的高质量3D图像。 构成：快速成像装置包括以下装置。 拍摄单元（110）通过在深度方向上扫描和拍摄样本数次来获得2D图像。 图像重构单元（120）使用2D图像从样本生成3D图像。
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公开(公告)号：KR100924574B1
公开(公告)日：2009-10-30
申请号：KR1020080005810
申请日：2008-01-18
Applicant: 광주과학기술원
CPC classification number: G02B21/0092 , G02B21/14
Abstract: 본 발명은 표본을 정밀하게 관찰하기 위한 편광 위상 현미경에 관한 것이다. 보다 상세하게는 생체 세포의 구성요소들을 통과하는 빛의 위상 차이를 이용하여 생체 세포의 구조 및 변화를 관찰하는 것이 가능한 편광 위상 현미경에 관한 것이다. 본 발명은 관찰하고자 하는 표본에 대한 상을 획득하는 광학이미지 발생부와,상기 광학 이미지 발생부에서 획득한 상의 광선이 유입되는 물체 평면; 상기 물체 평면을 통과한 광선에 대한 1차 퓨리에 변환이 발생하는 제1 변환렌즈; 상기 제1 변환렌즈로부터 상기 제1 변환렌즈의 초점거리만큼 이격되어 위치한 λ/4 파장판;상기 λ/4 파장판을 통과한 광선에 대한 2차 퓨리에 변환이 발생하는 제2 변환렌즈; 및 상기 2차 퓨리에 변환이 이루어진 광선의 상이 맺히는 광검출기를 포함하는 위상 이미지 발생부를 포함하는 것을 특징으로 한다.
본 발명에 의하면 생체 세포와 같은 생물 표본에 대한 정량적인(quantitative) 위상 정보를 획득하여 상기 생체 세포의 구조 및 움직임을 관찰하는 것이 가능한 효과를 가진다.
광학 현미경, 편광, 위상, 간섭-
公开(公告)号：KR1020090083162A
公开(公告)日：2009-08-03
申请号：KR1020080009161
申请日：2008-01-29
Applicant: 광주과학기술원
Abstract: A method and a device for measuring a character of a material and a method and a device for imaging the material are provided to survey the minute change of the specific molecule or organization without the decolorization phenomenon or the extinction of a cell. A method for measuring a character of a material comprises followings. A nano particle is attached in the appointed area of the sample to measuring. The outside stimulus is authorized in the neighboring of the nano particle. The reaction of the nano particle neighboring of the nano particle according to the applied outside stimulus or the sample is measured. The nano particle is one among the metal nanoparticle, the magnetic nanoparticle, and the semiconductor quantum dot. A device for measuring a character of the material comprises a nano particle attach unit(10), an outside stimulus application unit(20), and a reaction measurement part(30). The material imaging unit comprises a picturizing unit(40).
Abstract translation: 提供了用于测量材料特性的方法和装置，以及用于成像该材料的方法和装置的装置，用于调查特定分子或组织的微小变化，而不会出现脱色现象或细胞消失。 用于测量材料特征的方法包括以下。 将纳米颗粒附着在样品的指定区域进行测量。 外部刺激被授权在纳米颗粒的邻近处。 测量与应用的外部刺激或样品相邻的纳米颗粒的纳米颗粒的反应。 纳米颗粒是金属纳米颗粒，磁性纳米颗粒和半导体量子点之一。 用于测量材料特性的装置包括纳米颗粒附着单元（10），外部刺激施加单元（20）和反应测量部分（30）。 该材料成像单元包括一个吸引单元（40）。
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公开(公告)号：KR100885927B1
公开(公告)日：2009-02-26
申请号：KR1020070104132
申请日：2007-10-16
Applicant: 광주과학기술원
CPC classification number: G01N21/6408
Abstract: A method and an apparatus for measuring the fluorescent lifetime of a fluorescent material are provided to rapidly measure the fluorescent lifetime with accuracy according to simple calculation. An apparatus for measuring the fluorescent lifetime of a fluorescent material includes an excited light generator(110) generating excited light, a fluorescent photon collector(200) collecting fluorescent photon generated by irradiating the excited light to a sample, a photo-sensor(300) amplifying the collected fluorescent photon to convert the photon into a first electric signal, and a signal processor(400) calculating the fluorescent lifetime by using a difference between the average time of the first electric signal and the average time of a second electric signal converted from excited light when the excited light does not pass through the sample.
Abstract translation: 提供了用于测量荧光材料的荧光寿命的方法和装置，以便根据简单的计算来快速测量荧光寿命。 用于测量荧光材料的荧光寿命的装置包括产生激发光的激发光发生器（110），收集通过将激发光照射到样品产生的荧光光子的荧光光子收集器（200），光传感器（300） 放大收集的荧光光子以将光子转换成第一电信号;以及信号处理器（400），通过使用第一电信号的平均时间与从第一电信号转换的第二电信号的平均时间之间的差来计算荧光寿命 当激发的光不通过样品时激发光。
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公开(公告)号：KR100725211B1
公开(公告)日：2007-06-04
申请号：KR1020060007737
申请日：2006-01-25
Applicant: 광주과학기술원
Abstract: A multi-mode differential time delay measurement device of a multi-mode wave guide and a measurement method thereof are provided to measure interference patterns caused by displacement differences of light passing through the wave guide and a reference light path by configuring an interference system using a light source and a wavelength component photo detector, thereby measuring differential time delay between modes. A light source(10) is in certain width. A light distributor(20) inputs light emitted from the light source(10), and distributes the light to a multi-mode wave guide and a reference light path. A reflector(30) reflects an optical signal passing through the reference light path to the distributor(20). A wavelength component detector(40) detects signals by interference which are generated by a combination of an optical signal returning from a cut surface of the wave guide and the optical signal returning by being reflected from the reflector(30), according to each optical strength by wavelength component, and sends the detected signals to a computer(50). The computer(50) is mounted with a program consisting of a frequency component conversion process of converting the detected signals into frequency components, a process of analyzing interference patterns into differential time mode delay information, and a process of displaying measured results.
Abstract translation: 提供了一种多模波导的多模式差分时间延迟测量装置及其测量方法，以通过使用一个干涉系统配置干涉系统来测量由通过波导和参考光路的光的位移差引起的干涉图案 光源和波长成分光电检测器，从而测量模式之间的差分时间延迟。 光源（10）具有一定的宽度。 光分配器（20）输入从光源（10）发射的光，并将光分配到多模波导和参考光路。 反射器（30）将通过参考光路的光信号反射到分配器（20）。 波长分量检测器（40）根据每个光强度，检测由从波导的切割面返回的光信号和通过从反射器（30）反射而返回的光信号的组合而产生的干扰的信号 通过波长分量，并将检测到的信号发送到计算机（50）。 计算机（50）安装有由将检测信号转换成频率分量的频率分量转换处理，将干涉图案分析为差分时间模式延迟信息的处理和显示测量结果的处理组成的程序。
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