Abstract:
The present invention relates to a slurry process for preparing an ethylene polymer having a melt flow ratio F/P, which is the ratio among the melt index value measured according to ASTM 1238 condition "F" and the melt index value measured according to ASTM 1238 condition "P" of equal to or lower than 27, carried out in two or more stages of polymerization at temperatures in the range from 60 to 120°C, in which at least two of the said two or more polymerization stages are carried out under different amounts of molecular weight regulator, said process being carried out in the presence of (A) a solid catalyst component comprising Ti, Mg, halogen, having a porosity (P F ), measured by the mercury method and due to pores with radius equal to, or lower than, 1µm, of at least 0.3 cm 3 /g and a surface area determined by BET method, of lower than 100 m 2 /g, and being further characterized by the fact that more than 50% of the titanium atoms are in a valence state lower than 4 and (B) of an organoaluminum compound.
Abstract:
A solid catalyst component for olefin polymerization, and in particular for the preparation of LLDPE, comprising Mg, Ti, halogen and an electron donor compound (ID) belonging to cyclic ethers having 3-6 carbon atoms, characterized by having the molar ratio Mg/Ti higher than 5, the molar ratio Mg/ID lower than 3, and by a specific X-ray diffraction spectrum.
Abstract:
Catalyst component comprising Mg, Ti, and halogen atoms, and is characterized in that (a) the Ti atoms are present in an amount higher than 4% based on the total weight of the said catalyst component, (b) the amount of Mg and Ti atoms is such that the Mg/Ti molar ratio is higher than 2 and (c) by a X-ray diffraction spectrum, in which, in the range of 2θ diffraction angles between 47° and 52°, at least two diffraction lines are present at diffraction angles 2θ of 48.3 ± 0.2°, and 50.0 ± 0.2°, the most intense diffraction lines being the one at 2θ of 50.0 ± 0.2°, the intensity of the other diffraction line being equal to or lower than the intensity of the most intense diffraction line.