Charged-particle multi-beam exposure apparatus
    61.
    发明申请
    Charged-particle multi-beam exposure apparatus 有权
    带电粒子多光束曝光装置

    公开(公告)号:US20050104013A1

    公开(公告)日:2005-05-19

    申请号:US10969493

    申请日:2004-10-20

    CPC classification number: H01J37/3174 B82Y10/00 B82Y40/00 H01J37/3177

    Abstract: A charged-particle multi-beam exposure apparatus (1) for exposure of a target (41) uses a plurality of beams of electrically charged particles, which propagate along parallel beam paths towards the target (41). For each particle beam an illumination system (10), a pattern definition means (20) and a projection optics system (30) are provided. The illuminating system (10) and/or the projection optics system (30) comprise particle-optical lenses having lens elements (L1, L2, L3, L4, L5) common to more than one particle beam. The pattern definition means (20) defines a multitude of beamlets in the respective particle beam, forming its shape into a desired pattern which is projected onto the target (41), by allowing it to pass only through a plurality of apertures defining the shape of beamlets permeating said apertures, and further comprises a blanking means to switch off the passage of selected beamlets from the respective paths of the beamlets.

    Abstract translation: 用于曝光目标(41)的带电粒子多光束曝光装置(1)使用沿平行光束路径朝向目标(41)传播的多个带电粒子束。 对于每个粒子束,提供照明系统(10),图案定义装置(20)和投影光学系统(30)。 照明系统(10)和/或投影光学系统(30)包括具有多于一个粒子束共有的透镜元件(L 1,L 2,L 3,L 4,L 5)的粒子 - 光学透镜。 图案定义装置(20)在相应的粒子束中限定多个子束,通过使其仅通过限定形状的多个孔而将其形状形成为投射到目标(41)上的期望图案 子束穿透所述孔,并且还包括消隐装置,以切断所选子束从子束的相应路径的通过。

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