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    Silicon optical bench OCT probe for medical imaging
    71.
    发明授权
    Silicon optical bench OCT probe for medical imaging 有权
    硅光学台用于医学成像的OCT探针

    公开(公告)号：US08781287B2

    公开(公告)日：2014-07-15

    申请号：US13946214

    申请日：2013-07-19

    Applicant: Axsun Technologies, Inc.

    Inventor： Dale C. Flanders ,  James W. Getz ,  Walid A. Atia ,  Peter S. Whitney ,  Mark E. Kuznetsov

    IPC: G02B6/36

    CPC classification number: G01Q60/22 ,  A61B5/0066 ,  A61B5/0084 ,  A61B5/02007 ,  A61B2562/12 ,  G02B23/2469

    Abstract: An optical probe for emitting and/or receiving light within a body comprises an optical fiber that transmits and/or receives an optical signal, a silicon optical bench including a fiber groove running longitudinally that holds an optical fiber termination of the optical fiber and a reflecting surface that optically couples an endface of the optical fiber termination to a lateral side of the optical bench. The fiber groove is fabricated using silicon anisotropic etching techniques. Some examples use a housing around the optical bench that is fabricated using LIGA or other electroforming technology. A method for forming lens structure is also described that comprises forming a refractive lens in a first layer of a composite wafer material, such as SOI (silicon on insulator) wafers and forming an optical port through a backside of the composite wafer material along an optical axis of the refractive lens. The refractive lens is preferably formed using grey-scale lithography and dry etching the first layer.

    Abstract translation: 用于在体内发射和/或接收光的光学探针包括透射和/或接收光信号的光纤，包括纵向延伸的光纤槽的硅光学台，其保持光纤的光纤终端和反射 表面，其将光纤端接件的端面光学耦合到光学平台的侧面。 使用硅各向异性蚀刻技术制造纤维槽。 一些例子使用使用LIGA或其他电铸技术制造的光学平台周围的外壳。 还描述了一种用于形成透镜结构的方法，其包括在诸如SOI（绝缘体上硅）晶片的复合晶片材料的第一层中形成折射透镜，并沿着光学器件通过复合晶片材料的背面形成光学端口 折射透镜的轴线。 折射透镜优选使用灰度光刻形成并且对第一层进行干蚀刻。

    Integrated Dual Swept Source for OCT Medical Imaging
    73.
    发明申请
    Integrated Dual Swept Source for OCT Medical Imaging 有权
    用于OCT医疗成像的集成双扫描源

    公开(公告)号：US20140168658A1

    公开(公告)日：2014-06-19

    申请号：US14159748

    申请日：2014-01-21

    Applicant: Axsun Technologies, Inc.

    Inventor： Bartley C. Johnson ,  Walid A. Atia ,  Mark E. Kuznetsov ,  Dale C. Flanders

    IPC: G01B9/02

    CPC classification number: G01B9/02091 ,  G01B9/02004 ,  G01B9/02007 ,  G01B9/02069 ,  H01S3/1062 ,  H01S3/2383 ,  H01S5/141

    Abstract: An optical coherence analysis system comprising: a first swept source that generates a first optical signal that is tuned over a first spectral scan band, a second swept source that generates a second optical signal that is tuned over a second spectral scan band, a combiner for combining the first optical signal and the second optical signal to form a combined optical signal, an interferometer for dividing the combined optical signal between a reference arm leading to a reference reflector and a sample arm leading to a sample, and a detector system for detecting an interference signal generated from the combined optical signal from the reference arm and from the sample arm.

    Abstract translation: 一种光学相干分析系统，包括：第一扫描光源，其产生在第一光谱扫描带上调谐的第一光信号，产生在第二光谱扫描带上调谐的第二光信号的第二扫描光源， 组合第一光信号和第二光信号以形成组合的光信号;干涉仪，用于将导通到参考反射器的参考臂与通向样本的采样臂之间的组合光信号分开;以及检测器系统，用于检测 由来自参考臂和来自采样臂的组合光信号产生的干扰信号。

    Filtered ASE Swept Source for OCT Medical Imaging
    74.
    发明申请
    Filtered ASE Swept Source for OCT Medical Imaging 有权
    用于OCT医疗成像的过滤ASE扫描源

    公开(公告)号：US20130215432A1

    公开(公告)日：2013-08-22

    申请号：US13847616

    申请日：2013-03-20

    Applicant: Axsun Technologies, Inc.

    Inventor： Dale C. Flanders ,  Walid A. Atia ,  Mark E. Kuznetsov

    IPC: G02B5/22 ,  G01B9/02

    CPC classification number: G02B5/22 ,  G01B9/02004 ,  G01B9/02091 ,  G01J3/10 ,  G01J3/26 ,  G01J3/4338 ,  G01N21/4795

    Abstract: An integrated swept wavelength optical source uses a filtered ASE signal with an optical amplifier and tracking filter. This source comprises a micro optical bench, a source for generating broadband light, a first tunable Fabry Perot filter, installed on the bench, for spectrally filtering the broadband light from the broadband source to generate a narrowband tunable signal, an amplifier, installed on the bench, for amplifying the tunable signal, and a second tunable Fabry Perot filter, installed on the bench, for spectrally filtering the amplified tunable signal from the amplifier. A self-tracking arrangement is also possible where a single tunable filter both generates the narrowband signal and spectrally filters the amplified signal. In some examples, two-stage amplification is provided. The use of a single bench implementation yields a low cost high performance system. For example, polarization control between components is no longer necessary.

    Abstract translation: 集成扫描波长光源使用经滤波的ASE信号与光放大器和跟踪滤波器。 该源包括安装在工作台上的用于产生宽带光源的微型光学平台，用于产生宽带光源的第一可调谐法布里珀罗滤波器，用于对来自宽带源的宽带光进行频谱滤波以产生窄带可调谐信号，放大器，安装在 用于放大可调信号的工作台，以及安装在工作台上的第二个可调谐法布里珀罗滤波器，用于对来自放大器的放大的可调谐信号进行频谱滤波。 单个可调谐滤波器既可以生成窄带信号又对放大的信号进行频谱滤波，则自我跟踪装置也是可能的。 在一些实例中，提供了两级放大。 使用单台实现产生低成本的高性能系统。 例如，不再需要组件之间的极化控制。

    System and method for optical spectrum fast peak reporting
    75.
    发明申请
    System and method for optical spectrum fast peak reporting 有权

    公开(公告)号：US20040227946A1

    公开(公告)日：2004-11-18

    申请号：US10868319

    申请日：2004-06-15

    Applicant: Axsun Technologies, Inc.

    Inventor： Yu Li ,  Peter S. Whitney ,  Jeffrey A. Korn

    IPC: G01J003/51 ,  G01N021/25

    CPC classification number: G01J3/26 ,  G01J3/02 ,  G01J3/0264 ,  G01J3/28

    Abstract: A system and method for fast peak finding in an optical spectrum prioritizes the information it first generates and how the information is then forwarded from the system to a host computer, for example. A spectrum detection subsystem generates a spectrum of an optical signal. An analog-to-digital converter converts the spectrum into sample data. Finally, a data processing subsystem first detects the spectral locations of peaks in the spectrum using the sample data and then uploads the peak information to a host computer before performing processing to determine the shapes of the peaks and/or noise information for the optical signal, for example. The system is thus able to quickly find some information, such as whether or not channels or carriers are present, at what frequency the carriers are operating, and the carriers' power level, and send this information to the host computer. In contrast, information concerning spectral shape or the noise floor sent later in time.

    MEMS tunable optical filter system with moisture getter for frequency stability
    76.
    发明申请
    MEMS tunable optical filter system with moisture getter for frequency stability 有权
    MEMS可调谐滤光系统，带有吸湿剂，用于频率稳定

    公开(公告)号：US20030108306A1

    公开(公告)日：2003-06-12

    申请号：US10021765

    申请日：2001-12-12

    Applicant: AXSUN Technologies, Inc.

    Inventor： Peter S. Whitney ,  Jeffrey A. Korn ,  Michael F. Miller ,  Raymond V. Pourmand

    IPC: G02B006/42

    CPC classification number: G02B6/29362 ,  G02B6/29395 ,  G02B6/4215 ,  G02B6/4251 ,  G02B6/4265 ,  G02B6/4271 ,  G02B6/4285 ,  G02B6/4286

    Abstract: In optoelectronic systems, package moisture can affect stress levels in dielectric coatings on MEMS devices. Specifically, as the moisture content in these dielectric coatings changes, there are concomitant changes in the material stress. These changes in material stress can affect the operation of the overall MEMS device. Specifically, in the context of tunable filters, moisture can lead to a drift in the size of the optical resonant cavity over time as changes in material stress affect the MEMS structures. According to the invention, a getter is added to the package to absorb moisture, and thereby stabilize the operation of the optical filter, and specifically prevent uncontrolled drift in the size of its optical cavity.

    Abstract translation: 在光电子系统中，封装湿度可以影响MEMS器件上的介电涂层中的应力水平。 具体来说，随着这些电介质涂层中的水分含量发生变化，材料应力随之发生变化。 材料应力的这些变化可能会影响整个MEMS器件的运行。 具体地说，在可调滤波器的上下文中，随着材料应力的变化影响MEMS结构，水分会随着时间的推移导致光学谐振腔的尺寸的漂移。 根据本发明，将吸气剂添加到包装中以吸收水分，从而稳定滤光器的操作，并且特别地防止其光腔的尺寸的不受控制的漂移。

    Precision alignment feature using a rod with controlled diameter in a silicon V-groove array
    77.
    发明申请
    Precision alignment feature using a rod with controlled diameter in a silicon V-groove array 有权
    精密对准特征使用在硅V形槽阵列中具有受控直径的杆

    公开(公告)号：US20020176688A1

    公开(公告)日：2002-11-28

    申请号：US09864659

    申请日：2001-05-24

    Applicant: Axsun Technologies, Inc.

    Inventor： Xiaomei Wang

    IPC: G02B006/00

    CPC classification number: G02B6/4231 ,  G02B6/3636 ,  G02B6/3652 ,  G02B6/423 ,  G02B6/4249

    Abstract: An bench assembly alignment apparatus and method provides for precision alignment of the assembly with an alignment feature on a substrate. The bench assembly may comprise, for example, a fiber array to be mounted to, and aligned with, an opto-electronic device within a device package. Passive alignment of the bench position and orientation is achieved in a manner that affords improved device yield and increased precision in an economical process that eliminates the need to fabricate an additional alignment surface on the side wall of the bench.

    Abstract translation: 台式组件对准装置和方法提供了组件与衬底上的对准特征的精确对准。 台架组件可以包括例如要安装到设备封装内的光电器件并与其对准的光纤阵列。 实现了台座位置和取向的被动对准，其方式是提供了改进的装置产量并且在经济过程中提高了精度，从而消除了在工作台的侧壁上制造附加对准表面的需要。

    Reentrant alignment features for optical components
    78.
    发明申请
    Reentrant alignment features for optical components 失效
    光学元件的可重入对准功能

    公开(公告)号：US20020048446A1

    公开(公告)日：2002-04-25

    申请号：US09935156

    申请日：2001-08-23

    Applicant: AXSUN Technologies, Inc.

    Inventor： Mona Masghati ,  Livia M. Racz

    IPC: G02B006/00 ,  G02B006/26

    CPC classification number: G02B7/003 ,  G02B6/3636 ,  G02B6/3656 ,  G02B6/3692 ,  G02B6/4226 ,  G02B6/4237 ,  G02B6/4238 ,  G02B6/4239 ,  G02B27/62

    Abstract: An optical component 100 adapted for attachment to an optical bench or submount has an alignment feature 310 that is used in the positioning of the optical component 100 relative to the optical bench. This alignment feature 310 is formed in an exterior wall 210 of the optical component. Further, according to the preferred embodiment, the alignment feature 310 has a re-entrant sidewall 320. This last characteristic facilitates the identification of precise location of the alignment by a vision system, for example, thus, allowing the accurate placement and installation of the optical component on the optical bench 10.

    Abstract translation: 适于附接到光学台或基座的光学部件100具有对准特征310，该对准特征310用于光学部件100相对于光学台的定位。 该对准特征310形成在光学部件的外壁210中。 此外，根据优选实施例，对准特征310具有入口侧壁320.该最后特征有助于通过视觉系统识别对准的精确位置，从而允许准确地布置和安装 光学平台10上的光学部件。

    Controlled source for material processing
    79.
    发明申请
    Controlled source for material processing 审中-公开
    材料加工的控制源

    公开(公告)号：US20020011201A1

    公开(公告)日：2002-01-31

    申请号：US09908237

    申请日：2001-07-18

    Applicant: AXSUN Technologies, Inc.

    Inventor： Zong-Long Liau ,  Margaret B. Stern

    IPC: C30B028/12 ,  C30B023/00 ,  C30B028/14 ,  C30B025/00

    CPC classification number: C30B29/40 ,  C23C16/4481 ,  C30B23/002

    Abstract: An apparatus and method for creating a supply of group V vapor required for various material processing applications such as crystal growth or the mass transport process, when applied to III-V materials (e.g., GaP) comprises a stable source of group V material (e.g., a GaP wafer), a process tube, and inner tube, a three-zone furnace incorporating a cold trap zone for the group III material, and a nullloosenull plug for the process tube. The phosphorus vapor is generated by using a source GaP wafer placed at a higher temperature than that of the main process wafer in the mass transport process. When high phosphorous vapor concentration is desired, other solid sources such as InP or red P can be used. To minimize vapor loss to the ambient, both wafers are enclosed in a quartz tube equipped with a quartz plug. However, the source wafer generates not only phosphorus but also gallium vapor. The latter interferes with mass transport and needs to be filtered out. This is conveniently accomplished by employing a larger (longer) process tube and by further placing the source in a smaller inner tube within the main process tube. The source inner tube first directs the vapor to a cooler region, where gallium is selectively condensed out before it reaches the process wafer.

    Abstract translation: 当应用于III-V材料（例如GaP）时，用于产生各种材料处理应用如晶体生长或质量传输过程所需的V族蒸气的供应的装置和方法包括稳定的V族材料源（例如 ，GaP晶片），工艺管和内管，三区域炉，其中包含用于组III材料的冷阱区和用于处理管的“松散”塞。 通过在质量传输过程中使用放置在比主工艺晶片更高的温度的源GaP晶片来产生磷蒸汽。 当需要高磷蒸气浓度时，可以使用其它固体源，例如InP或红P。 为了最小化对环境的蒸汽损失，将两个晶片封装在配备有石英塞的石英管中。 然而，源晶片不仅产生磷而且还产生镓蒸气。 后者干扰群众运输，需要过滤掉。 这通过采用较大的（较长）的工艺管并且进一步将源放置在主工艺管内较小的内管中而方便地完成。 源内管首先将蒸气引导到较冷的区域，其中镓在其到达处理晶片之前选择性地冷凝出来。

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