Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus which improves the calibration precision of stage position measurement. SOLUTION: A calibration method of a stage system includes moving a stage to an encoder grid in response to a set point signal and measuring the position of the stage by a sensor head cooperating with the encoder grid. The position of the stage is controlled by a stage controller. A signal showing a difference between the position of the state measured by the sensor head and the set point signal is registered. The stage system is calibrated on the basis of the registered signal showing the difference. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To reduce a possible impact of acoustic vibration to a part of a lithographic apparatus, and to thereby enhance the precision of the lithographic apparatus, overlay, or all other parameters. SOLUTION: A lithographic apparatus may be provided with an acoustic resonator to attenuate acoustic vibration in the lithographic apparatus. The acoustic resonator may include a Helmholtz resonator. The Helmholtz resonator may be provided with an active element to provide active damping and/or altering a spring characteristic of the mass spring assembly formed by the resonator. The resonator may be provided at a slit in a shield between the patterning device stage and the projection system to suppress the transfer of acoustical vibration caused by e.g. the movement of the patterning device stage to the projection system. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus in which imaging accuracy and/or throughput is improved. SOLUTION: The lithographic apparatus comprises a projection system housing for supporting internally one or more lens elements, and a movement damper for damping the movement of the projection system housing at a natural frequency of at least one of the lens elements and/or the projection system housing. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a drive system for a substrate support of the lithographic apparatus or the support of a patterning device, which is compact and requires no thermal conditioning. SOLUTION: A component 11 is moved relative to a reference within a lithographic apparatus by a first actuator 12. A second actuator 15 that exerts force between the component 11 and a reaction mass 13 is used to adjust at least one from among the position, velocity, and acceleration of the component 11, relative to the reference within the lithographic apparatus. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To compensate a change of a motor constant caused by a temperature change of permanent magnet in a motor control system for positioning a lithography device. SOLUTION: A positioning system positions a patterning support and a substrate support. The positioning system has a motor including a stator and a mover connected to the supports, and the motor control system including a controller for providing an output for controlling a current applied to the motor. The motor control system determines a controller output required for compensating for the weights of the mover and the related supports, determines a deviation from an output required for compensating for weights applied to the mover and the related supports, and corrects a current applied to the motor based on the deviation. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion type lithography projection apparatus with improved functionality. SOLUTION: The lithography projection apparatus includes: a radiation system Ex, IL also equipped with a radiation source LA, for providing the projection beams PB of radiation; a first object table (mask table) MT connected to a first positioning means, for correctly positioning a mask with respect to a member PL; a second object table (substrate table) WT connected to a second positioning means, for correctly positioning a substrate with respect to the member PL; and a projection system PL for forming an image of the radiated part of the mask MA on the target part C of the substrate W. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus, a projection apparatus and a method of manufacturing the same. SOLUTION: A lithographic apparatus has a control system to control a position of a substrate table. The control system includes: a first detection device for generating a projection system position signal showing a position of a projection system; a second detection device for generating a projection system feed/forward signal; a comparison unit for deducting a signal showing the actual position of the substrate table from a substrate table position reference signal, and generating a servo error signal by adding the projection system position signal; a control unit for generating a first control signal based on the servo error signal; an addition unit for generating a second control signal by adding the feed/forward signal and the first control signal; and an actuator unit for driving the substrate table to a desired substrate table position based on a second control signal. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a vibration isolation device with a small rigidity and a lithography equipment. SOLUTION: To adequately transport a pattern to a substrate or any other pattern with a micro structure, the vibration isolation device like an air mount is used to minimize vibration from an external support structure like a floor. To improve the vibration isolation property of the air mount, a pressure controller is provided that can reduce pressure gas pressure variation within a gas chamber, resulting in decrease in air mount (positive) rigidity. The volume of the above gas chamber changes due to vibration. In addition, the corresponding pressure variation is decreased through the use of a rigidity reduction device and a force applied to the supported object itself is additionally reduced, so that the air mount rigidity can be reduced. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic device for making full use of a desired exposure function, namely an optimum exposure function, and also to provide a control system and a device manufacturing method. SOLUTION: The lithographic device comprises: a lighting system IL for providing radiation beams; a support MT for supporting a patterning device MA to give a pattern onto a cross section of the radiation beams; a substrate table WT for retaining the substrate; a projection system PL for projecting patterned beams to a target portion on the substrate; a measurement system for generating an information signal containing information regarding at least one position of a patterning device, the substrate, the projection system, and a component in the projection system; and a control system for controlling a position. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a lithography device which has an improved focus control system. SOLUTION: The lithography device comprises servo units which position board holders, sensor units which determine the distance of at least one positional point on the surface of a board from a reference surface, a memory unit which stores the surface information of the board, on the basis of each distance of at least one positional point on the surface of the board from the reference distance, and computing units which determine a feed-forward setting point signal, on the basis of the memorized surface information. The feed-forward setting signal is supplied in forward direction to the servo units to position the board holders. COPYRIGHT: (C)2005,JPO&NCIPI