公开(公告)号：EP2761269A1

公开(公告)日：2014-08-06

申请号：EP11873395.5

申请日：2011-09-30

Applicant: Hewlett Packard Development Company, L.P.

Inventor： WU, Wei ,  LI, Zhiyong ,  KIM, Ansoon ,  HU, Min ,  STUKE, Michael Josef

IPC: G01N1/36 ,  G01N21/64 ,  G01N21/65 ,  G01N33/00

CPC classification number: G01N31/22 ,  B01L3/5085 ,  B01L3/50853 ,  B01L2200/141 ,  B01L2300/0636 ,  B01L2300/069 ,  B01L2300/0819 ,  B82Y15/00 ,  G01N21/648 ,  G01N21/658 ,  G01N2201/0227 ,  G01N2201/023 ,  Y10T436/25

Abstract: Devices to detect a substance and methods of producing such a device are disclosed. An example device to detect a substance includes a housing defining an externally accessible chamber and a seal to enclose at least a portion of the chamber. The example device also includes a substrate includes nanoparticles positioned within the chamber. The nanoparticles to react to the substance when exposed thereto. The example device also includes a non-analytic solution within the chamber to protect the nanoparticles from premature exposure.

公开(公告)号：EP2373978A4

公开(公告)日：2012-10-24

申请号：EP09837058

申请日：2009-12-24

Applicant: SPECTRASENSORS INC

Inventor： HU XUEJIAO ,  FEITISCH ALFRED

IPC: G01N21/39 ,  G01N21/35 ,  G01N21/53

CPC classification number: G01N21/39 ,  G01N2201/022 ,  G01N2201/023 ,  G01N2201/0231

公开(公告)号：EP1643240A4

公开(公告)日：2010-09-22

申请号：EP04746180

申请日：2004-06-21

Applicant: WAKO PURE CHEM IND LTD

Inventor： FUJITA TAKASHI ,  YAMAMOTO SACHIKO ,  YAMADA HIROYUKI ,  AKAHANE WATARU

IPC: G01N21/78 ,  G01N21/76

CPC classification number: G01N21/76 ,  G01N2201/023

公开(公告)号：JP2018513965A

公开(公告)日：2018-05-31

申请号：JP2017546180

申请日：2016-03-02

Applicant: メカニック・アナリティック・インコーポレーテッド

Inventor： ガマシェ,イヴ

IPC: G01N21/67 ,  H05H1/24

CPC classification number: G01N21/67 ,  G01N21/01 ,  G01N2201/023

Abstract: ガス試料の当該成分を分析するために光学分光技法を用いるプラズマ式検出器が提供される。当該検出器は、プラズマ発生機構、およびプラズマ局在化機構を備える。電子注入電極は、当該検出器の当該プラズマチャンバ内に設けることができる。適宜、圧力制御機構ならびにドーピングモジュールが備えられてもよい。いくつかの実施によれば、当該プラズマから抽出された光の当該収集、検出、および分析は、発光モード、吸収モード、および間接検出モードまたは一定発光モードなどの様々な動作モードのうちの1つまたは複数のモードを可能にすることができる。【選択図】図1

公开(公告)号：JP2010008099A

公开(公告)日：2010-01-14

申请号：JP2008164896

申请日：2008-06-24

Applicant: Ja Woollam Japan Kk ,  National Institute Of Advanced Industrial & Technology ,  Tokyo Institute Of Technology ,  ジェー・エー・ウーラム・ジャパン株式会社 ,  国立大学法人東京工業大学 ,  独立行政法人産業技術総合研究所

Inventor： KUWABARA MASASHI ,  FUKAYA TOSHIO ,  SHIMA TAKAYUKI ,  TOMINAGA JUNJI ,  ENDO RIE ,  SUSA MASAHIRO ,  SUZUKI MICHIO ,  TSUTSUMI KOICHI

IPC: G01N21/41 ,  G01N21/47 ,  G01N21/59

CPC classification number: G01N21/211 ,  G01N21/0332 ,  G01N2201/0227 ,  G01N2201/023 ,  G01N2201/0231

Abstract: PROBLEM TO BE SOLVED: To provide an optical measuring instrument for easily and optically measuring a flat measuring surface even if the amount of a liquid or molten material being a measuring target is little and for measuring the physical properties of the liquid or molten material by causing no transpiration or no reaction with another substance, and an optical measuring method.
SOLUTION: The optical measuring instrument includes a base transparent container 6 which houses a measuring target material and keeps at least the base 6a flat and transparent and an optical device which projects light on the base 6a of the container 6 and detects and measures the reflected light 11 from the base. The base of the transparent container 6 housing the liquid or molten material 13 is irradiated with incident light 10 from a light source 1 and the reflected light component from the liquid or molten material 13 in the reflected light 11 is detected and measured.
COPYRIGHT: (C)2010,JPO&INPIT

Abstract translation: 要解决的问题：即使用作测量对象的液体或熔融材料的量很少并且用于测量液体的物理性能或熔融的物理性能来提供用于容易且光学地测量平坦测量表面的光学测量仪器 材料不产生蒸发或与其他物质无反应，以及光学测量方法。 解决方案：光学测量仪器包括容纳测量目标材料并且至少保持基座6a平坦和透明的基部透明容器6以及将光投射到容器6的基座6a上并检测并测量的光学装置 来自基座的反射光11。 容纳液体或熔融材料13的透明容器6的底部被来自光源1的入射光10照射，并且检测和测量来自反射光11中的液体或熔融材料13的反射光分量。 版权所有（C）2010，JPO＆INPIT

公开(公告)号：JP3959318B2

公开(公告)日：2007-08-15

申请号：JP2002241454

申请日：2002-08-22

Applicant: 東京エレクトロン株式会社

Inventor： 秀樹 田中

IPC: C23C16/505 ,  H01L21/3065 ,  G01J1/00 ,  G01N21/68 ,  G01R31/26 ,  G01T1/24 ,  H01J37/32 ,  H01L21/00 ,  H01L21/66

CPC classification number: H01J37/32935 ,  G01N21/68 ,  G01N2201/0227 ,  G01N2201/023

公开(公告)号：US20240060873A1

公开(公告)日：2024-02-22

申请号：US18382047

申请日：2023-10-19

Applicant: iSud Solutions GmbH

Inventor： Joachim Mannhardt

IPC: G01N21/01 ,  G01N21/31

CPC classification number: G01N21/01 ,  G01N21/31 ,  G01N2201/022 ,  G01N2201/127 ,  G01N2201/023

Abstract: An optical analysis device for determining at least one characteristic of a medium in a process environment or a laboratory environment is provided. The optical analysis device includes an optical measuring arrangement with a plurality of components arranged in an interior space of a housing. The housing has at least one entry/exit area for the entry and/or exit of optical radiation, and a mechanical interface for a positionally accurate detachable attachment of the optical analysis device to a location of operation, in particular in a process environment. Advantageously, the mechanical interface spatially overlaps with the optical radiation entry/exit area. This enables fast assembly and disassembly of the optical analysis device in different locations of use.

公开(公告)号：US11852582B2

公开(公告)日：2023-12-26

申请号：US17879665

申请日：2022-08-02

Applicant: East China Normal University

Inventor： Liangqing Zhu ,  Junli Wang ,  Liyan Shang ,  Le Wang ,  Zhigao Hu

IPC: G01N21/35 ,  G01N21/3563 ,  G01N21/01

CPC classification number: G01N21/3563 ,  G01N21/01 ,  G01N2021/3595 ,  G01N2201/023

Abstract: An automatic photocurrent spectrum measurement system based on a Fourier infrared spectrometer, including a light source component, an environment control component, a measuring module, and a control module. The system is configured to evaluate photoelectric performance semiconductor materials or devices under different temperatures, voltage biases or current biases.

公开(公告)号：US20230304936A1

公开(公告)日：2023-09-28

申请号：US18318045

申请日：2023-05-16

Applicant: SHENYANG INSTITUTE OF AUTOMATION, CHINESE ACADEMY OF SCIENCES

Inventor： Lanxiang SUN ,  Haibin YU ,  Shuo LI ,  Zhibo CONG ,  Yang LI ,  Wei DONG

IPC: G01N21/71

CPC classification number: G01N21/718 ,  G01N2201/023 ,  G01N2201/0218

Abstract: An online detection device underwater elements includes an LIBS system in a sealing pressure chamber and an external airflow control system. The airflow control system has a gas probe bin and a gas source. An opening is formed at one end of the gas probe bin while the other end and the sealing pressure chamber are hermetically partitioned through a glass window. A laser in the LIES system outputs laser to an underwater object surface to be detected for generating plasma spectra. A spectrometer collects plasma spectra returned along an original optical path. When the device operates in water, the balance gas storage tank produces gas with the same pressure as underwater. A flow model is invoked according to the current water pressure to accurately control the air flow rate to form a stable gas environment in the gas probe, which improves the plasma excitation and collection efficiency.

公开(公告)号：US20180224357A1

公开(公告)日：2018-08-09

申请号：US15873847

申请日：2018-01-17

Applicant: Christopher James Hintz ,  Kenneth J. Hintz

Inventor： Christopher James Hintz ,  Kenneth J. Hintz

IPC: G01N1/28 ,  G01N21/3577

CPC classification number: G01N1/286 ,  G01N21/3504 ,  G01N21/3577 ,  G01N2021/1723 ,  G01N2201/023

Abstract: Embodiments of the present disclosure demonstrate cavitating measuring devices. A liquid sample is cavitated to generate bubbles of gas. A frequency-specific radiation is emitted and passes through at least one bubble of gas. The frequency-specific radiation emerges from the bubble of gas as an absorption signal comprising the frequency-specific radiation. The absorption signal is detected and communicated to a system processor. The system processor analyzes the absorption signal data and determines the chemical components present in the liquid sample. Embodiments of the present disclosure describe both static and dynamic liquid samples. The liquid samples can be measured at the sample site.