公开(公告)号：EP2154512A4

公开(公告)日：2011-11-23

申请号：EP08752063

申请日：2008-04-24

Applicant: BECKMAN COULTER INC

Inventor： OGAWA YUJI

IPC: G01N21/01 ,  G01N21/25 ,  G01N21/31 ,  G01N21/77

CPC classification number: G01N21/255 ,  G01N21/31 ,  G01N2201/06153 ,  G01N2201/0627

公开(公告)号：EP1444501B1

公开(公告)日：2006-04-26

申请号：EP02785881.0

申请日：2002-11-07

Applicant: S.A.E. Afikim Computerized Dairy Management System ,  State of Israel, Ministry of Agriculture, Agricultural Research Organization

Inventor： Schmilovitch, Zeev ,  Katz, Gil ,  MALTZ, Ephraim ,  KUTSCHER, Martin I., ,  SARIG, Moran ,  HALACHMI, Ilan ,  HOFFMAN, Aharon ,  EGOZI, Haim ,  UNER, Eithan

IPC: G01N21/03 ,  G01N21/05 ,  G01N33/04 ,  G01N21/53

CPC classification number: G01N21/05 ,  G01J3/10 ,  G01N21/3577 ,  G01N21/359 ,  G01N21/532 ,  G01N33/04 ,  G01N2201/06153

Abstract: An NIR spectroscopy fluid analyzing system (1) using a series of LED's (21), each having its own preselected center wavelength, as illumination sources. These wavelengths have overlapping spectral widths, such that the measurement covers a broad spectrum. The LED's (21) illuminate the fluid sample sequentially, and subsequently the transmission absorbance through the sample and the reflectance or scattering from the sample is measured for the wavelength range of each LED. The measurements are performed using photodetectors (24,27,29). The concentrations of component parts of the fluid are expressed in the form of a polynomial, which is a function of the measured transmitted and/or reflected intensities, and of empirical coefficients, which are extracted by prior statistical analysis on measured intensities obtained from a large number of test samples having known concentrations of the component. A novel sample chamber (16), capable of performing optical absorption measurements on a flowing sample of fluid, is described.

公开(公告)号：EP0498811B1

公开(公告)日：1997-04-09

申请号：EP90915370.2

申请日：1990-09-17

Applicant: PRESSCO TECHNOLOGY INC.

Inventor： COCHRAN, Don, W. ,  AUSTIN, James, R.

IPC: G01N21/88

CPC classification number: G01N21/909 ,  G01N21/8806 ,  G01N2021/8455 ,  G01N2021/8887 ,  G01N2021/95615 ,  G01N2201/06153 ,  G01N2201/102

Abstract: An engineered video inspection lighting system includes a three-dimensional array (22) of solid-state light emitting diodes (18) focused to an inspection area. A single high-current, low-duration pulse is applied to selected elements of the array. Light thus generated is passed through a diffuser (26) and to a specimen (D). Light reflected from the specimen is received by a lens (32) of a video camera (34) disposed in an interior of the three-dimensional array (22). Data thus obtained is used to determine acceptability of the specimen in accordance with preselected standards.

公开(公告)号：EP0493487A4

公开(公告)日：1992-12-30

申请号：EP90914626

申请日：1990-09-17

Applicant: PRESSCO, INC.

Inventor： COCHRAN, DON, W. ,  AUSTIN, JAMES, R.

IPC: G01B11/30 ,  G01N21/84 ,  G01N21/88 ,  G01N21/954 ,  G01N21/956 ,  G06T1/00 ,  H04N7/18 ,  H04N7/00

CPC classification number: G01N21/909 ,  G01N21/8806 ,  G01N2021/8455 ,  G01N2021/8887 ,  G01N2021/95615 ,  G01N2201/06153 ,  G01N2201/102 ,  H04N7/18

Abstract: A video inspection system includes first and second video cameras (36 and 48) mounted along a parallel axes. A lighting array (16) is pulsed, and resultant light is reflected from a specimen to both cameras. Orientation of the specimen is determined in accordance with an image generated from a first camera (36). This data is used to isolate a selected portion of the specimen for analysis by an image generated from the second camera (48).

公开(公告)号：KR1020120109473A

公开(公告)日：2012-10-08

申请号：KR1020127009330

申请日：2010-10-25

Applicant: 사크미 코퍼라티브 메카니씨 이몰라 소시에타 코퍼라티바

Inventor： 발두치,마시모

IPC: G01N21/88 ,  G01N21/90

CPC classification number: G01N21/8806 ,  G01N21/909 ,  G01N2021/8816 ,  G01N2021/8845 ,  G01N2201/06153 ,  G01N21/88 ,  G01N21/90

Abstract: 본 발명은 검사 대상 요소, 특히 금속 뚜껑(70)의 결함을 검출하기 위한 장치(1)와 관련되어 있으며, 검사 대상 요소(70)를 비추기 위한 수단(30), 상기 조명 수단(30)에 의해 비춰진 상기 검사 대상 요소(70)의 이미지 검출을 가능하게 하는 카메라(40) 등과 같은 이미지 획득을 위한 이미지 획득 유닛, 상기 결함 검출에 적합한, 상기 이미지 획득 유닛에 의해 얻어진 이미지를 처리하기 위한 유닛을 포함하는 본 발명은, 스침 최소 입사각과 산란 최대 입사각 사이에 포함되면서, 검사 대상 요소의 표면에 대한 입사각을 특징을 파악하면서, 광학적인 경로에 따라 상기 검사 대상 요소(70)를 비추는 상기 각각의 복사 빔, 조명 수단(30)에 의해 발광되는 상기의 각 복사 빔의 광학적 경로에 의해 실현되는 입사각이, 상대 발광 주파수(f
1 , f
2 , f
3 )에 대하여, 비례 또는 반비례하도록 하기 위하여 제공되는 조명 수단(30)을 특징으로 한다.
본 발명은 또한 결함 검출을 위한 시스템 그리고 방법과도 관련되어 있다.

公开(公告)号：KR100345001B1

公开(公告)日：2002-07-19

申请号：KR1019990030511

申请日：1999-07-27

Applicant: 삼성전자주식회사

Inventor： 김재선

IPC: H05K13/08

CPC classification number: G01N21/8806 ,  G01N21/95684 ,  G01N2021/8835 ,  G01N2021/95646 ,  G01N2201/06153 ,  G01N2201/062 ,  H05K13/08

Abstract: 개시된조명및 광학장치는표면실장장치에서기판의표면에납땜된각종전자부품들의장착및 납땜상태를자동으로검사할수 있도록균일하게조명하고검사할전자부품의크기에따라적절한시야로촬영하는것이다. 상면이수평면을이루고측면에경사면을이루는고정부재의상면에서로다른직경및 동일한높이를가지고복수의램프가복수의링 형상으로배열된제 1 조명수단을설치하여검사대상부품을조명함과아울러고정부재의경사면에설치되어서로다른직경및 상이한높이를가지고복수의램프가복수의링 형상으로배열된제 2 조명수단을설치하여제 1 조명수단에의하여얻어지는영상에대하여음영이반전된영상을얻을수 있도록검사대상부품을조명하고, 조절수단으로제 1 및제 2 조명수단의밝기와전원단속을단속하며, 고정부재의상부에는광학수단이설치되어조절수단에의해제 1 및제 2 조명수단이선택적으로조명하는검사대상부품을대시야및 소시야로촬영한다.

公开(公告)号：KR101844079B1

公开(公告)日：2018-05-14

申请号：KR1020127009330

申请日：2010-10-25

Applicant: 사크미 코퍼라티브 메카니씨 이몰라 소시에타 코퍼라티바

Inventor： 발두치,마시모

IPC: G01N21/88 ,  G01N21/90

CPC classification number: G01N21/8806 ,  G01N21/909 ,  G01N2021/8816 ,  G01N2021/8845 ,  G01N2201/06153

Abstract: 본발명은검사대상요소, 특히금속뚜껑(70)의결함을검출하기위한장치(1)와관련되어있으며, 검사대상요소(70)를비추기위한수단(30), 상기조명수단(30)에의해비춰진상기검사대상요소(70)의이미지검출을가능하게하는카메라(40) 등과같은이미지획득을위한이미지획득유닛, 상기결함검출에적합한, 상기이미지획득유닛에의해얻어진이미지를처리하기위한유닛을포함하는본 발명은, 스침최소입사각과산란최대입사각사이에포함되면서, 검사대상요소의표면에대한입사각특징을파악하면서, 광학적인경로에따라상기검사대상요소(70)를비추는상기각각의복사빔, 조명수단(30)에의해발광되는상기의각 복사빔의광학적경로에의해실현되는입사각이, 상대발광주파수(f, f, f)에대하여, 비례또는반비례하도록하기위하여제공되는조명수단(30)을특징으로한다.본발명은또한결함검출을위한시스템그리고방법과도관련되어있다.

公开(公告)号：KR1020100017098A

公开(公告)日：2010-02-16

申请号：KR1020097023233

申请日：2008-04-24

Applicant: 베크만 컬터, 인코포레이티드

Inventor： 오가와,유지

IPC: G01N21/01 ,  G01N35/04 ,  G01N21/78

CPC classification number: G01N21/255 ,  G01N21/31 ,  G01N2201/06153 ,  G01N2201/0627

Abstract: Provided is an automated analyzer having a light source device by which light having a prescribed wavelength can be obtained even when an LED is used as a light source. The automated analyzer for measuring optical characteristics of a liquid stored in a container is provided with a light source device (12). The light source device is provided with a plurality of light sources (12a, 12b), which output light having different peak wavelengths, respectively, and each light source permit the peak wavelength of light outputted from the other light source to exist in the wavelength region of the outputted light. The light source device is also provided with a lens (12c) or a half mirror which mixes a plurality of beams of light outputted from the light sources, respectively, and outputs light having a desired mixed peak wavelength different from each peak wavelength.

Abstract translation: 提供了一种具有光源装置的自动分析装置，即使在使用LED作为光源的情况下，也可以获得具有规定波长的光。 用于测量储存在容器中的液体的光学特性的自动分析器设置有光源装置（12）。 光源装置设置有分别输出具有不同峰值波长的光的多个光源（12a，12b），并且每个光源允许从另一个光源输出的光的峰值波长存在于波长区域 的输出光。 光源装置还设置有分别混合从光源输出的多个光束的透镜（12c）或半反射镜，并输出具有与每个峰值波长不同的期望的混合峰值波长的光。

公开(公告)号：KR1020000016969A

公开(公告)日：2000-03-25

申请号：KR1019990030511

申请日：1999-07-27

Applicant: 삼성전자주식회사

Inventor： 김재선

IPC: H05K13/08

CPC classification number: G01N21/8806 ,  G01N21/95684 ,  G01N2021/8835 ,  G01N2021/95646 ,  G01N2201/06153 ,  G01N2201/062 ,  H05K13/08

Abstract: PURPOSE: An optical apparatus for a substrate soldering tester is provided to improve a text speed and a test reliability corresponding to a size variation of a text object part by taking a picture of the test object part through two cameras having different magnification. CONSTITUTION: The optical apparatus for a substrate soldering tester comprises: a first light part (31) which lights a test object part attached to a substrate, vertically on the basis of a little inclined axis from a view axis of a camera; a second light part (32) which is installed so as to light almost horizontally differently from a light angle of the first light part; a reflected light transfer part (43) which divides and outputs a reflected light from the test object part by two and has an adjustment part for controlling an intensity of illumination of the first and second light parts and a power on/off; a large view camera and a small view camera which take a picture of reflected lights divided by the transfer part, respectively; a large view lens and a small view lens which adjust a size of a view taken by the cameras into a large view and a small view.

Abstract translation: 目的：提供一种用于基板焊接测试仪的光学装置，通过通过具有不同放大倍数的两个相机拍摄测试对象部分的图片来提高与文本对象部分的尺寸变化相对应的文本速度和测试可靠性。 构成：基板焊接试验机的光学装置包括：第一光部（31），其基于相机的视轴的一点倾斜的轴垂直地点亮附着于基板的被检体部; 第二光部件（32），其安装成几乎水平地与第一光部件的光角不同地发光; 反射光传输部分43，其将来自测试对象部分的反射光分离并输出两个，并具有用于控制第一和第二光部分的照明强度的调节部分和电源开/关; 分别通过转印部分分别反射的照片的大型观看照相机和小型照相机; 将相机拍摄的视野的大小调整为大视野和小视野的大视角透镜和小视野镜。

公开(公告)号：KR1019960006968B1

公开(公告)日：1996-05-25

申请号：KR1019920021628

申请日：1992-11-18

Applicant: 가부시키가이샤 신가와

Inventor： 스가하라겐지

IPC: H01L21/60

CPC classification number: H01L24/85 ,  G01N21/8806 ,  G01N2021/8822 ,  G01N2021/8887 ,  G01N2201/06153 ,  G01N2201/102 ,  G01R31/2853 ,  G01R31/311 ,  H01L24/48 ,  H01L24/49 ,  H01L24/78 ,  H01L2224/05554 ,  H01L2224/05599 ,  H01L2224/45144 ,  H01L2224/48245 ,  H01L2224/48247 ,  H01L2224/48465 ,  H01L2224/48599 ,  H01L2224/49171 ,  H01L2224/73265 ,  H01L2224/78 ,  H01L2224/859 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01019 ,  H01L2924/01039 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/3025 ,  H01L2224/45099 ,  H01L2924/00 ,  H01L2224/85399

Abstract: An apparatus for inspecting wires bonded between the pads of a semiconductor chip and the leads of a lead frame including: an illuminating assembly that emits lights, via LED's that are arranged in a ring-shape, onto the object of inspection such as the ball at the end of a bonded wire; an optical assembly that images the object of inspection which is illuminated by the illumination assembly, and cameras that photograph the image taken in by the optical assembly. When the ball, particularly its shape, is inspected, a dark field illumination circumstance is created by the illuminating assembly so that only the ball can appear bright. In this case, a diaphragm of the optical assembly is also adjusted so as to create a shallow focal depth for the ball.

Abstract translation: 一种用于检查接合在半导体芯片的焊盘和引线框的引线之间的引线的装置，包括：照亮组件，其通过LED被布置成环形，发光到检查对象上，例如球 接合线的末端; 对由照明组件照明的检查对象进行成像的光学组件，以及照相由光学组件拍摄的图像的照相机。 当检查球，特别是其形状时，照明组件产生暗场照明环境，使得只有球可以看起来明亮。 在这种情况下，还调整光学组件的光阑以产生球的浅焦深。