公开(公告)号：WO2011144632A1

公开(公告)日：2011-11-24

申请号：PCT/EP2011/057997

申请日：2011-05-17

Applicant: LLTECH MANAGEMENT ,  BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

IPC: G01B9/02 ,  G01B21/00 ,  G01N21/45

CPC classification number: G01B9/02 ,  G01B9/02068 ,  G01B9/02082 ,  G01B9/02091 ,  G01B9/04 ,  G02B21/0056 ,  G02B26/06

Abstract: The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.

Abstract translation: 本发明涉及一种用于体积散射样品（106）成像的非相干光全场干涉显微镜装置。 该装置包括通过由干涉装置的参考臂的反射表面（105）反射入射波而产生的参考波（401）和由后向散射产生的物体波（402）之间的干涉装置（100） 通过一个采样片的入射波的采样装置（108），用于至少第一干扰信号的采集装置（108）和由参考和对象波的干扰产生的至少第二干扰信号，所述至少两个干扰信号具有 相位差，用于基于所述干扰信号计算样本片的图像的处理单元（403）。 所述干涉装置还包括用于修改所述波前相位的光学元件（404），并且所述显微镜装置包括与所述处理单元（403）连接的用于所述光学元件的控制单元（405），所述光学相位修改元件 通过优化由处理单元计算的图像的至少一部分的统计参数来控制。

公开(公告)号：WO2017174743A1

公开(公告)日：2017-10-12

申请号：PCT/EP2017/058288

申请日：2017-04-06

Applicant: LLTECH MANAGEMENT

Inventor： BOCCARA, Albert Claude

IPC: G01B9/02 ,  G01B9/04 ,  G02B21/14

CPC classification number: G01B9/02091 ,  G01B9/02082 ,  G01B9/02083 ,  G02B21/14 ,  G06T2207/10101

Abstract: Procédé d'imagerie par microscopie interfércntielle plein champ d'un échantillon volumique et diffusant placé sur un bras objet d'un dispositif d'interférence. Le procédé comprend une production, au moyen du dispositif d' interférence (200), d'un signal interférométrique bidimensionnel résultant d'une interférence entre, d'une part, une onde de référence obtenue par réflexion d' une onde lumineuse incidente sur une surface de réflexion (205) d'un bras de référence du dispositif d'interférence (200), et, d'autre part, une onde objet obtenue par rétrodiffusion de l 'onde lumineuse incidente par une tranche de cohérence de l'échantillon (206) placé dans le bras objet du dispositif d' interférence (200); une acquisition (320), à différence de marche fixe entre le bras objet et le bras de référence, d'une image interférométrique brute à partir du signal interférométrique bidimensionnel; un calcul (330) d'une image normalisée à partir de l'image interférométrique brute et d'une image de référence; un calcul (340) d'une image OCT plein champ de la tranche de cohérence de l'échantillon par élimination, dans l' image normalisée, de fluctuations spatiales basses fréquences définies en. fonction de la largeur du pic central d'une fonction d'autocorrélation de l 'image interférométrique.

Abstract translation:

处理程序; 干扰素显微镜成像在放置在田间的固体和散射样品的场中。 在干扰设备的手臂物体上。 d＆oacute的过程; 包括通过所述干涉装置（200）产生由一方面谐振波与所述谐振波之间的干涉产生的二维干涉信号; 其通过使入射在干涉装置（200）的折射臂的反射表面（205）上的光波谐振而获得，并且另一方面， 通过样本（206）的相干切片重新散射入射光波而获得的物体波， 在干扰装置（200）的物体臂中; 收购（320），＆amp; 物体臂和参考臂之间的固定台阶的差异，粗略界面图像的差异。 根据二维干涉信号; 归一化图像的计算（330） 来自原始干涉图像和存储库图像; 通过在标准化的图像中消除定义在其中的低频空间波动来计算（340）样本相干切片的全场OCT图像。 干涉图像自相关函数的中心峰宽的函数。

公开(公告)号：WO2012035148A1

公开(公告)日：2012-03-22

申请号：PCT/EP2011/066132

申请日：2011-09-16

Applicant: LLTECH MANAGEMENT ,  BOCCARA, Albert ,  LATRIVE, Anne ,  LE CONTE DE POLY, Bertrand ,  HARMS, Fabrice

Inventor： BOCCARA, Albert ,  LATRIVE, Anne ,  LE CONTE DE POLY, Bertrand ,  HARMS, Fabrice

IPC: A61B5/00 ,  G01N21/47

CPC classification number: G01B9/02091 ,  A61B5/0066 ,  A61B5/0084 ,  G01N21/4795

Abstract: The present invention relates to a full-field optical coherence tomography system (300) for imaging an object (319), comprising a light source (301), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (307), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (321), the system (300) being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.

Abstract translation: 本发明涉及一种用于对物体（319）进行成像的全场光学相干断层摄影系统（300），其包括光源（301），第一干涉设备，其具有用于分割输入光束的装置，并且至少包括反射 表面（307），具有用于分离光谱调制的输出光束并且至少包括反射表面的装置的第二干涉测量装置，多通道采集装置（321），所述系统（300）的特征在于，至少一个干涉装置 至少包括聚焦光学元件，其被布置为将输入光束中的至少一个或至少一个输出光束聚焦到相应的干涉测量装置的对应反射表面上。

公开(公告)号：US09046338B2

公开(公告)日：2015-06-02

申请号：US13846378

申请日：2013-03-18

Applicant: LLTECH MANAGEMENT

Inventor： Albert Boccara ,  Anne Latrive ,  Bertrand Le Conte De Poly ,  Fabrice Harms

IPC: G01B9/02 ,  A61B5/00 ,  G01N21/47

CPC classification number: G01B9/02091 ,  A61B5/0066 ,  A61B5/0084 ,  G01N21/4795

Abstract: The present invention relates to a full-field optical coherence tomography system (300) for imaging an object (319), comprising a light source (301), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (307), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (321), the system (300) being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.

Abstract translation: 本发明涉及一种用于对物体（319）进行成像的全场光学相干断层摄影系统（300），其包括光源（301），第一干涉设备，其具有用于分割输入光束的装置，并且至少包括反射 表面（307），具有用于分离光谱调制的输出光束并且至少包括反射表面的装置的第二干涉测量装置，多通道采集装置（321），所述系统（300）的特征在于至少一个干涉装置 至少包括聚焦光学元件，其被布置成将至少一个输入光束或至少一个输出光束聚焦到相应的干涉测量装置的对应的反射表面上。

公开(公告)号：WO2016162521A1

公开(公告)日：2016-10-13

申请号：PCT/EP2016/057827

申请日：2016-04-08

Applicant: LLTECH MANAGEMENT

Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice

IPC: G02B21/00 ,  G01B9/02 ,  G02B21/14 ,  G01N21/47 ,  G02B21/18

CPC classification number: G02B21/125 ,  G01B9/02091 ,  G01N21/47 ,  G01N21/4795 ,  G01N2021/4709 ,  G02B21/0004 ,  G02B21/082 ,  G02B21/14 ,  G02B21/18 ,  G06T1/0007 ,  G06T5/50 ,  G06T2207/10101

Abstract: Système d'imagerie (20) par microscopie interférentielle plein champ d'un échantillon volumique diffusant (206) comprenant : - un dispositif d'interférence (200) comprenant un bras de référence sur lequel est agencée une surface de réflexion (205), le dispositif d'interférence étant adapté pour produire, lorsque l'échantillon est disposé sur un bras objet du dispositif d'interférence, en chaque point d'un champ d'imagerie, une interférence entre une onde de référence obtenue par réflexion d'ondes lumineuses incidentes sur une surface élémentaire de la surface de réflexion (205) correspondant audit point du champ d'imagerie et une onde objet obtenue par rétrodiffusion d'ondes lumineuses incidentes par un voxel d'une tranche de l'échantillon à une profondeur donnée, ledit voxel correspondant audit point du champ d'imagerie, - un dispositif d'acquisition (208) adapté pour acquérir, à différence de marche fixe entre le bras objet et le bras de référence, une succession temporelle de N signaux interférométriques bidimensionnels résultant des interférences produites en chaque point du champ d'imagerie, - une unité de traitement (220) configurée pour calculer une image (IB, IC) représentative de variations temporelles d'intensité entre lesdits N signaux interférométriques bidimensionnels.

Abstract translation: 本发明涉及用于三维扩散样品（206）的全场干涉显微成像的系统（20）。 所述系统包括： - 干涉装置（200），包括其上布置有反射表面（205）的参考臂，所述干涉装置适于在将样品放置在目标臂上时在成像场的每个点处产生 通过将入射光波反射到对应于成像场的所述点的反射表面（205）的基本表面上获得的参考波之间的干扰以及通过入射光波的后向散射获得的目标波 在给定深度处的样本片的体素的装置，所述体素对应于成像场的所述点; - 适于以目标臂和参考臂之间的固定路径长度差获取由在成像场的每个点产生的干扰产生的N个二维干涉测量信号的时间序列的采集装置（208） 以及 - 被配置为计算表示所述N个二维干涉信号之间的强度的时间变化的图像（IB，IC）的处理单元（220）。

公开(公告)号：US11543641B2

公开(公告)日：2023-01-03

申请号：US16837031

申请日：2020-04-01

Applicant: LLTECH MANAGEMENT

Inventor： Albert Claude Boccara ,  Fabrice Harms

IPC: G02B21/14 ,  G02B21/12 ,  G01B9/02091 ,  G02B21/00 ,  G01N21/47 ,  G02B21/08 ,  G06T5/50 ,  G02B21/18 ,  G06T1/00

Abstract: A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.

公开(公告)号：US20200233198A1

公开(公告)日：2020-07-23

申请号：US16837031

申请日：2020-04-01

Applicant: LLTECH MANAGEMENT

Inventor： Albert Claude Boccara ,  Fabrice Harms

IPC: G02B21/12 ,  G01B9/02 ,  G02B21/14 ,  G02B21/00 ,  G01N21/47 ,  G02B21/08 ,  G06T5/50

Abstract: A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.

公开(公告)号：US20180120550A1

公开(公告)日：2018-05-03

申请号：US15565449

申请日：2016-04-08

Applicant: LLTECH MANAGEMENT

Inventor： Albert Claude Boccara ,  Fabrice Harms

IPC: G02B21/12 ,  G02B21/08 ,  G01N21/47 ,  G06T5/50 ,  G01B9/02

CPC classification number: G02B21/125 ,  G01B9/02091 ,  G01N21/47 ,  G01N21/4795 ,  G01N2021/4709 ,  G02B21/0004 ,  G02B21/082 ,  G02B21/14 ,  G02B21/18 ,  G06T1/0007 ,  G06T5/50 ,  G06T2207/10101

Abstract: The invention relates to a system (20) for full-field interference microscopy imaging of a three-dimensional diffusing sample (206). Said system includes: an interference device (200) including a reference arm on which a reflective surface (205) is arranged, the interference device being suitable for producing, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave, obtained by reflection of incident light waves onto a basic surface of the reflective surface (205) corresponding to said point of the imaging field, and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; an acquisition device (208) suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit (220) configured to calculate an image (IB, IC) representing temporal variations in intensity between said N two-dimensional interferometric signals.

公开(公告)号：US20130235383A1

公开(公告)日：2013-09-12

申请号：US13846378

申请日：2013-03-18

Applicant: LLTECH MANAGEMENT

Inventor： Albert Boccara ,  Anne Latrive ,  Bertrand Le Conte De Poly ,  Fabrice Harms

IPC: G01B9/02

CPC classification number: G01B9/02091 ,  A61B5/0066 ,  A61B5/0084 ,  G01N21/4795

Abstract: The present invention relates to a full-field optical coherence tomography system (300) for imaging an object (319), comprising a light source (301), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (307), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (321), the system (300) being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.

Abstract translation: 本发明涉及一种用于对物体（319）进行成像的全场光学相干断层摄影系统（300），其包括光源（301），第一干涉设备，其具有用于分割输入光束的装置，并且至少包括反射 表面（307），具有用于分离光谱调制的输出光束并且至少包括反射表面的装置的第二干涉测量装置，多通道采集装置（321），所述系统（300）的特征在于至少一个干涉装置 至少包括聚焦光学元件，其被布置成将至少一个输入光束或至少一个输出光束聚焦到相应的干涉测量装置的对应的反射表面上。

公开(公告)号：EP2615966A1

公开(公告)日：2013-07-24

申请号：EP11755363.6

申请日：2011-09-16

Applicant: Lltech Management

Inventor： BOCCARA, Albert ,  LATRIVE, Anne ,  LE CONTE DE POLY, Bertrand ,  HARMS, Fabrice

IPC: A61B5/00 ,  G01N21/47

CPC classification number: G01B9/02091 ,  A61B5/0066 ,  A61B5/0084 ,  G01N21/4795

Abstract: The present invention relates to a full-field optical coherence tomography system (300) for imaging an object (319), comprising a light source (301), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (307), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (321), the system (300) being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.