Abstract in simplified Chinese:如本文所揭示的具体实施例提供特征化物理性质的方法及系统,例如固态发光设备中成长于一基板上之数个结晶结构或沉积于一基板上之数个薄膜的厚度、均匀度、极化及/或缺陷大小及位置(例如,缺陷密度分布)。揭示于本文的具体实施例大体包括用一能量源激发该发光设备以及分析成长于该基板上之该等结晶结构或沉积于该基板上之该等薄膜所发射的光能量。
Abstract in simplified Chinese:一种使用C参数来定型一光谱功率分布(SPD),俾在制造一物体,设计使用该物体的产品和制程,及描述/界定该物体时,可改良波长和辐射通量的光学性质测量值之精确性、准确度、可重复性和可用性,来量化包括发光二极(LEDs)、高亮度发光二极管(HBLEDs),及其它固态光(SSLs)等光源的色彩与强度之系统及方法系被提供。在一实施例中,一种特征化一固态光(SSL)源的方法包含一受测试的SSL源,一该SSL源之发射光的光谱功率分布(SPD),一曲线适配函数,一组构态数据报含该曲线适配函数的级序,波节数目,波长边界限制,饱和临界值,和噪声底限临界值,一计算设备用于曲线适配、波节检测、重复和程控、及输入和输出数据;及一组C参数,噪声参数,和信任值。
Abstract:
A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters. In another embodiment, a photodetector is implemented to measure the integrated power of the optical output of the HBLED.
Abstract:
A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (OUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences, a Parametπc Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED
Abstract:
A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a Solid State Light (SSL) source includes a SSL source under test (DUT), a Spectral Power Distribution (SPD) of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values.
Abstract:
A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided.