-
公开(公告)号：WO2022122635A1
公开(公告)日：2022-06-16
申请号：PCT/EP2021/084350
申请日：2021-12-06
Applicant: ABB SCHWEIZ AG [CH]/[CH]
Inventor： SCHMIDT, Benedikt , SOSALE, Guruprasad , SUBBIAH, Subanatarajan , GITZEL, Ralf , SPOORENDONK, Jonas
IPC: G05B19/418 , G05B23/02 , G06N3/04
Abstract: A method (100) for monitoring an equipment (1) with at least one rotating member, comprising the steps of: recording (110), by at least one sensor (2), at least one sample (3) of noise and/or vibration generated by the equipment (1) in the time domain; obtaining (120) at least one representation (3') of the at least one sample (3) in the frequency domain; obtaining (125) information (7) that is indicative at least of the type of the equipment (1); selecting (126), based on this information (7), one model (4a-4c) of the equipment (1) from a plurality of available models (4a-4c); and mapping (130), by means of the selected model (4a-4c), the at least one representation (3') to an operating state (5) of the equipment, wherein said operating state comprises a normal state, an abnormal state, a fault, and/or a degradation state (5).
-
公开(公告)号：WO2021213808A1
公开(公告)日：2021-10-28
申请号：PCT/EP2021/059141
申请日：2021-04-08
Applicant: ABB SCHWEIZ AG
Inventor： GITZEL, Ralf , WILDERMUTH, Stephan , GEBHARDT, Joerg , OSTROWSKI, Joerg , KAUFMANN, Patrik Reto
Abstract: The present invention relates to a fault state detection apparatus, comprising: - an input unit; and - a processing unit. The input unit is configured to receive condition monitoring data. The processing unit is configured to implement a trained machine learning algorithm to analyse the received condition monitoring data to determine if the received condition monitoring data is associated with a fault state. The trained machine learning algorithm was trained on the basis of a plurality of non-fault state condition monitoring data and associated ground truth information and on the basis of a plurality of fault state condition monitoring data and associated ground truth information. A subset of the plurality of fault state condition monitoring data was generated from one or more non-fault state condition monitoring data. Generation of fault state conditioning monitoring data in the subset of the plurality of fault state condition monitoring data comprises a transformation of non-fault state condition monitoring data to fault state condition monitoring data.
-
公开(公告)号：WO2020178253A1
公开(公告)日：2020-09-10
申请号：PCT/EP2020/055471
申请日：2020-03-02
Applicant: ABB SCHWEIZ AG
Inventor： GITZEL, Ralf , SUBBIAH, Subanatarajan , SCHMIDT, Benedikt
Abstract: The present invention relates to an apparatus for monitoring a switchgear. The apparatus comprises an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with a monitor infra-red image of a switchgear. The processing unit is configured to implement a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained on the basis of a plurality of different training infra-red images. The plurality of training infra-red images comprises a plurality of modified infrared images generated from a corresponding plurality of infra-red images. Each of the modified infra-red images has been modified to remove the effect of obscuration in the image. The output unit is configured to output information relating to the one or more anomalous hot spots.
-
公开(公告)号：WO2020178237A1
公开(公告)日：2020-09-10
申请号：PCT/EP2020/055435
申请日：2020-03-02
Applicant: ABB SCHWEIZ AG
Inventor： SUBBIAH, Subanatarajan , GITZEL, Ralf , SCHMIDT, Benedikt
Abstract: The present invention relates to an apparatus for monitoring a switchgear. The apparatus comprises an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with a monitor infra-red image of a switchgear. The processing unit is configured to implement a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained on the basis of a plurality of different training images, wherein the plurality of training images comprises a plurality of synthetic infra-red images generated by an image processing algorithm. The output unit is configured to output information relating to the one or more anomalous hot spots.
-
公开(公告)号：WO2021151830A1
公开(公告)日：2021-08-05
申请号：PCT/EP2021/051600
申请日：2021-01-25
Applicant: ABB SCHWEIZ AG
Inventor： GEBHARDT, Joerg , WILDERMUTH, Stephan , GITZEL, Ralf , KOENIG, Kai , OSTROWSKI, Joerg , KAUFMANN, Patrik Reto , SAMUL, Boguslaw
IPC: H02B13/065 , G01J5/00 , G01R31/327 , G01R31/66 , H02B3/00
Abstract: The present invention relates to a system (110) for monitoring a switchgear (100). The system (110) comprises: multiple infrared cameras (120) with fields of view (130); a processing unit (30); and an output unit (40). The multiple infrared cameras are configured to acquire multiple image data of a plurality of phases (50, 60, 70) of the switchgear, wherein each phase comprises a plurality of component parts (52, 62, 72) comprising a circuit breaker and a plurality of busbars and wherein each phase comprises a plurality of connections (54) between the plurality of components. Each infrared camera is configured to acquire image data of a same component part of the plurality of component parts for each phase and/or acquire image data of a same connection of the plurality of connections for each phase, and wherein each infrared camera acquires different image data to the other infrared cameras of the multiple infrared cameras. The processing unit is configured to determine that there is a phase imbalance in a specific phase comprising a determination from a plurality of image data that temperature information for a plurality of component parts and/or a plurality of connections for that specific phase has an overall enhanced temperature compared to the temperature information for the same plurality of component parts and/or the same plurality of connections for one or more other phases of the plurality of phases. The processing unit is configured to determine that there is a fault in a specific phase comprising a determination from a plurality of image data that temperature information for a first component part and/or a first connection for that specific phase has an enhanced temperature compared to the temperature information for the same first component part and/or the same first connection for one or more other phases of the plurality of phases and that temperature information for one or more second component parts and/or one or more second connections for that specific phase does not have an enhanced temperature compared to the temperature information for the same one or more second component parts and/or the same one or more second connections for one or more other phases of the plurality of phases. The output unit is configured to output information that a fault or load imbalance has occurred in a phase.
-
Patent Agency Ranking
公开(公告)号：WO2020178255A1
公开(公告)日：2020-09-10
申请号：PCT/EP2020/055473
申请日：2020-03-02
Applicant: ABB SCHWEIZ AG
Inventor： GITZEL, Ralf , SUBBIAH, Subanatarajan , SCHMIDT, Benedikt
Abstract: The present invention relates to an apparatus for monitoring a switchgear. The apparatus comprises an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with a monitor infra-red image of a switchgear. The processing unit is configured to implement a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained on the basis of a plurality of different training infra-red images. The plurality of training infra-red images comprises a plurality of synthetic infra-red images generated from a corresponding plurality of visible images. The output unit is configured to output information relating to the one or more anomalous hot spots.
-
公开(公告)号：EP4414673A1
公开(公告)日：2024-08-14
申请号：EP23155987.3
申请日：2023-02-10
Applicant: ABB SCHWEIZ AG
Inventor： GITZEL, Ralf , BOYACI, Aydin , OSTROWSKI, Joerg
CPC classification number: G01K1/026 , G01K2003/14520130101 , G01K3/10 , G01K3/005 , G06N20/00 , H02B13/065 , G01R31/327 , G01R31/3271 , G01R31/3277
Abstract: The present invention relates to a system (10) for monitoring a three phase switchgear, the system comprising: at least one temperature sensor (20); a processing unit (30); and an output unit (40). One or more of the at least one temperature sensor is configured to acquire first temperature data for each location of at least one location of a first phase (50) of a switchgear (80) at n time points. One or more of the at least one temperature sensor is configured to acquire second temperature data for each location of at least one location of a second phase (60) of the switchgear at the n time points. One or more of the at least one temperature sensor is configured to acquire third temperature data for each location of at least one location of a third phase (70) of the switchgear at the n time points. The at least one temperature sensor is configured to provide the first temperature data, the second temperature data, and the third temperature data to the processing unit. The processing unit is configured to determine n-1 first rates of change of temperature for one or more locations of the at least one location of the first phase with respect to the n first temperature data for the one or more locations of the first phase at the n time points. The processing unit is configured to determine n-1 second rates of change of temperature for one or more locations of the at least one location of the second phase with respect to the n second temperature data for the one or more locations of the second phase at the n time points. The processing unit is configured to determine n-1 third rates of change of temperature for one or more locations of the at least one location of the third phase with respect to the n third temperature data for the one or more locations of the third phase at the n time points. The processing unit is configured to determine a state of the switchgear, wherein the determination of the state of the switchgear comprises utilization of the n-1 first rates of change of temperature for the one or more locations of the first phase and at least n-1 of the n first temperature data for the one or more locations of the first phase and the n-1 second rates of change of temperature for the one or more locations of the second phase and at least n-1 of the n second temperature data for the one or more locations of the second phase and the n-1 third rates of change of temperature for the one or more locations of the third phase and at least n-1 of the n third temperature data for the one or more locations of the third phase. The output unit is configured to output the determined state of the switchgear when the determined state of the switchgear is determined not to be normal or not to be healthy.
-
公开(公告)号：EP4235591A1
公开(公告)日：2023-08-30
申请号：EP22159066.4
申请日：2022-02-28
Applicant: ABB SCHWEIZ AG
Inventor： GITZEL, Ralf , DIX, Marcel , KAUL, Holger , KOZEL, Tomas
IPC: G06V10/143 , G06V10/28 , G06V10/82 , G06V20/52 , G06V10/74 , G06V10/774
Abstract: The present invention relates to a system for monitoring a switchgear, the system comprising:
- an infrared camera;
- a processing unit; and
- an output unit.
The infrared camera is configured to acquire an infrared image of the switchgear. The processing unit is configured to convert the infrared image into a binary image. Pixels in the infrared image having a temperature equal to or above a first threshold value are given the same first value. Pixels in the infrared image having a temperature below the first threshold value are given the same second value. The processing unit is configured to implement a Siamese neural network to determine if a hot spot exists in the infrared image. The determination by the Siamese neural network comprises analysis by the Siamese neural network of the binary image and a reference binary image. The reference binary image was generated from a reference infrared image of the switchgear or of a reference switchgear. Pixels in the reference infrared image having a temperature equal to or above a second threshold value were given the same first value. Pixels in the reference infrared image having a temperature below the second threshold value were given the same second value to generate the reference binary image. The output unit is configured to output an indication of a fault in the switchgear on the basis that a hot spot has been determined to exist in the infrared image.-
公开(公告)号：EP4123276A1
公开(公告)日：2023-01-25
申请号：EP21186807.0
申请日：2021-07-20
Applicant: ABB SCHWEIZ AG
Inventor： OSTROWSKI, Joerg , WILDERMUTH, Stephan , GITZEL, Ralf , KAUFMANN, Patrik Reto , GEBHARDT, Joerg , KOENIG, Kai , SAMUL, Boguslaw
Abstract: The present invention relates to a system for monitoring a device, the system comprising:
- at least one temperature sensor;
- a processing unit; and
- an output unit;
wherein the at least one temperature sensor is configured to acquire at least one temperature measurement at a first location of an operational device, and wherein the first location is in thermal contact with a second location of the operational device;
wherein the at least one temperature sensor is configured to provide the at least one temperature measurement to the processing unit;
wherein the processing unit is configured to select a simulated temperature distribution of the first location of the simulated device from a plurality of simulated temperature distributions of the first location of the simulated device, wherein the selection comprises a comparison of the at least one temperature measurement with the plurality of simulated temperature distributions of the first location, wherein the plurality of simulated temperature distributions of the first location each relate to a different situation with respect to simulated operation of the simulated device, and wherein for each of the different situations there is a correlation between a simulated temperature distribution of the first location and a simulated temperature at the second location of the simulated device;
wherein the processing unit is configured to determine that a hot spot exists or is developing at the second location of the operational device, and wherein the determination comprises utilization of the correlation between the simulated temperature distribution of the first location and the second location for the selected simulated temperature distribution of the first location of the simulated device; and
wherein the output unit is configured to output an indication of a fault at the second location of the operational device.-
公开(公告)号：EP4097811A1
公开(公告)日：2022-12-07
申请号：EP21700798.8
申请日：2021-01-25
Applicant: ABB SCHWEIZ AG
Inventor： GEBHARDT, Joerg , WILDERMUTH, Stephan , GITZEL, Ralf , KOENIG, Kai , OSTROWSKI, Joerg , KAUFMANN, Patrik Reto , SAMUL, Boguslaw
IPC: H02B13/065 , G01J5/00 , G01R31/327 , G01R31/66 , H02B3/00
-
-
-
-
-
-
-
-
-
Search Results
28
records
(took 0.026 seconds)
