Abstract:
PROBLEM TO BE SOLVED: To reduce a heat load applied to a projection system and/or an immersion system.SOLUTION: A lithographic apparatus comprises a projection system configured to project a patterned radiation beam onto a target portion of a substrate. The projection system has a final element. The apparatus also comprises a barrier member surrounding a space between the substrate in use and the projection system, to define in part with the final element a reservoir for liquid. The barrier member is spaced from the final element to define a gap therebetween. The apparatus further comprises a deformable seal between a radially outer surface of the final element and a radially outer surface of the barrier member. The deformable seal is configured to substantially prevent a gas from flowing past the seal towards or away from the reservoir of liquid.
Abstract:
PROBLEM TO BE SOLVED: To provide a system to remove an immersion liquid capable of controlling the level of the immersion liquid present in space among a barrier member, a final element of a projection system and a substrate. SOLUTION: A plurality of extraction conduits are provided in order to remove the immersion liquid prior to entry into a chamber. The extraction conduits are disposed at various distances from a target part of the substrate. A channel added with a suction force from the chamber is provided. When all conduits are filled with the immersion liquid, the extraction capacity becomes larger than that when one conduit or a plurality of conduits contain gas. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an apparatus by which two-phase flow can be stabilized and/or at least substantially separated into liquid and gas flows, and desirably substantially minimized. SOLUTION: An immersion lithographic apparatus is described in which a two-phase flow is separated into liquid-rich and gas-rich flows by causing the liquid-rich flow to preferentially flow along a surface. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To limit the movement of immersion liquid in a gap between immersion system structure and a projection system, and to reduce the quantity of immersion liquid that escapes the immersion system through the gap.SOLUTION: A lithographic apparatus includes a projection system configured to project a patterned radiation beam onto a target portion of a substrate. The lithographic apparatus also includes a barrier member, surrounding a space between the projection system, and the substrate in use, to define in part with the projection system a reservoir for liquid. A radially outer surface of the barrier member facing a portion of the projection system and a radially outer surface of the portion of the projection system facing the barrier member each have a lyophobic outer surface. The lyophobic outer surface of the barrier member and/or the lyophobic outer surface of the portion of the projection system has an inner edge that defines in part the reservoir.
Abstract:
PROBLEM TO BE SOLVED: To disclose an immersion lithographic apparatus that includes a fluid supply system for supplying a fluid. SOLUTION: The fluid supply system has a chamber with a plurality of inlet holes formed in a first sidewall and a plurality of outlet holes formed in a second sidewall, wherein the first sidewall faces the second sidewall, and the inlet holes allows fluid entering the chamber to induce in a direction towards areas of the second sidewall between the plurality of outlet holes. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method of highly precisely adjusting a measuring optical system of a lithographic apparatus. SOLUTION: In the lithographic apparatus, a substrate table constituted to hold a substrate is movable to transfer the substrate between a substrate measuring position and a substrate processing position. The lithographic apparatus also includes a measuring system constituted to measure at least one aspect or a characteristic of the substrate when the substrate table holds the substrate in the measuring position. The measuring system is constituted to guide at least one measuring beam and/or a field toward the front surface of the substrate. A projection system is constituted to project a patterned radiation beam onto the target of the substrate when the substrate table holds the substrate in the substrate processing position. An adjusting system is constituted to supply adjusting fluid to at least a part of the path of the measuring beam and/or the field of the measuring system to adjust the part of the path. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithography device having a gas flushing device. SOLUTION: The lithography device includes a lighting system which supplies projection beams, and a support structure which supports a patterning device useful for supplying beams having a pattern in the section thereof. The lithography device also has a gas flushing device which flushes a practically layered gas flow across the projection beams and/or along the surface of optical components and includes a single gas exit having an inner rim on the downstream end thereof. The inner rim demarcates the entire area of the gas exit, which is equipped with a laminator having an effective area where the layered gas flow practically comes out therefrom when the gas is used. The effective area of the laminator has a laminator opening and includes a material at least having the same size as the entire area of the gas exit. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion lithographic apparatus in which generation of bubbles in the immersion liquid is reduced.SOLUTION: An immersion lithographic projection apparatus has a liquid confinement structure configured to at least partly confine liquid to a space between a projection system and a substrate. The confinement structure having a buffer surface, when in use, is positioned in close proximity to a plane substantially comprising the upper surface of the substrate and of a substrate table holding the substrate, to define a passage having a flow resistance. A recess is provided in the buffer surface. The recess, when in use, is normally full of immersion liquid to enable rapid filling of a gap between the substrate and substrate table as the gap moves under the buffer surface. The recess may be annular or radial and a plurality of recesses may be provided.
Abstract:
PROBLEM TO BE SOLVED: To provide a seal member or a barrier member that reduces a turbulent flow and an overflow of immersion liquid in a liquid supply system for an immersion lithographic apparatus. SOLUTION: The immersion liquid is supplied into a seal member 12 through an inlet 128. The immersion liquid is pushed into orifices 121 that permit fluid communication between a first chamber 120 and a second chamber 122, causing a first pressure drop in the immersion liquid. The orifices 121 are individual holes prepared in a plate 123 separating the chambers 120 and 122, and the orifices 121 disperse a flow in a tangential direction over a plate 126 separating the chamber 122 from a space, ensuring a uniform flow over the width of the array of orifices 124. The orifices 124 are provided as a (regular) two-dimensional array in the plate 126 of the seal member 12. Thus uniform and parallel flows are generated in the space. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a liquid supply system of a liquid immersion lithographic apparatus, the system taking measures by which possibility of liquid overflow from between a projection system and a substrate or possibility of air bubble inclusion into the liquid is reduced. SOLUTION: A protrusion 100 is prepared on a barrier member 10 at least partially confining the liquid between the projection system PL and the substrate W. The protrusion 100 comes closer to the projection system PL than other parts of the barrier member 10, thereby promotes adherence of a liquid meniscus 110 between the protrusion 100 and the projection system PL. COPYRIGHT: (C)2010,JPO&INPIT