Abstract:
PROBLEM TO BE SOLVED: To provide a method for reducing outgassing of a component being employed in the vacuum chamber of a lithography system. SOLUTION: The preparation processing method comprises steps for: coating a component with a nonmetallic and nonplastic material; and processing the coating to harden. A preferable coating material is hydrogen silsesquioxane (HSQ) which can be applied by various methods (spray, brush coating, spinning) and can be processed through heating or irradiation with an electron beam. A resulting component reduces outgassing of water or hydrocarbon significantly when subjected to a vacuum environment. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion-type lithography projection device with improved functionality.SOLUTION: An immersion-type lithography projection device comprises: a radiation systems Ex, IL which are provided with a radiation source LA and supply projection beams PB of radiation; a first object table (mask table) MT connected to first positioning means for correctly positioning a mask with respect to a member PL; a second object table (substrate table) WT connected to second positioning means for correctly positioning a substrate with respect to the member PL; and a projection system PL for forming an image of a radiated part of the mask MA on a target part C of a substrate W.
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion-type lithographic projection apparatus with improved functionality.SOLUTION: The immersion-type lithographic projection apparatus comprises: a radiation system Ex which is provided with a radiation source LA and supplies a radiation projection beam PB; an illumination system IL; a first object table (mask table) MT connected to first positioning means for accurately positioning a mask to a member PL; a second object table (substrate table) WT connected to second positioning means for accurately positioning the substrate to the member PL; and a projection system PL for imaging an irradiated part of a mask MA on a target part C of a substrate W. This apparatus also includes at least one sensor that is disposed so as to be illuminated with a radiation projection beam that has passed through an immersion liquid.
Abstract:
PROBLEM TO BE SOLVED: To provide an image-sensing device having several sensors that can be positioned very close to each other, so that the dimension of the arranging area of the sensors may become small and the detecting structures of the sensors. SOLUTION: A lithographic projection apparatus includes a radiation system, a pattern-forming means supporting structure, a substrate table, a projecting system which projects a beam upon substrates, and the image sensing device. The image-sensing device includes a slab, provided at least with one radiation sensitive sensor on its first side face and a film made of a material, that does not transmit the radiation of the projected beam. The image-sensing sensor is integrated with the slab and responds to the radiation of the projected beam, and the film is provided on the first side face of the slab to cover the sensor and has a division patterned, to selectively transmit the radiation of the projected beam to the sensor on the sensor. The slab is mounted on the slab bearing surface of an intermediate plate by its second surface on a side opposite to its first surface.
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion-type lithography projection device with improved functionality.SOLUTION: An immersion-type lithography projection device comprises: a radiation systems Ex, IL which are provided with a radiation source LA and supply projection beams PB of radiation; a first object table (mask table) MT connected to first positioning means for correctly positioning a mask with respect to a member PL; a second object table (substrate table) WT connected to second positioning means for correctly positioning a substrate with respect to the member PL; and a projection system PL for forming an image of a radiated part of the mask MA on a target part C of a substrate W.
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion-type lithographic projection apparatus with improved functionality.SOLUTION: The immersion-type lithographic projection apparatus comprises: a radiation system Ex which is provided with a radiation source LA and supplies a radiation projection beam PB; an illumination system IL; a first object table (mask table) MT connected to first positioning means for accurately positioning a mask to a member PL; a second object table (substrate table) WT connected to second positioning means for accurately positioning the substrate to the member PL; and a projection system PL for imaging an irradiated part of a mask MA on a target part C of a substrate W. This apparatus also includes at least one sensor that is disposed so as to be illuminated with a radiation projection beam that has passed through an immersion liquid.
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion type lithography projection apparatus with improved functionality. SOLUTION: The highlights of this invention are that the lithography apparatus is equipped with a radiation system Ex to provide the projection beams PB of radiation including a radioactive source LA, a primary object table (mask table) MT connected to a primary positioning means to correctly position a mask against IL and a member PL, a secondary object table (substrate table) WT connected to a secondary positioning means to correctly position a substrate against the member PL, and a projection system PL to form an image of the irradiated part of the mask MA on the target part of the substrate W. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion type lithography projection apparatus with improved functionality. SOLUTION: The lithography projection apparatus includes: a radiation system Ex, IL also equipped with a radiation source LA, for providing the projection beams PB of radiation; a first object table (mask table) MT connected to a first positioning means, for correctly positioning a mask with respect to a member PL; a second object table (substrate table) WT connected to a second positioning means, for correctly positioning a substrate with respect to the member PL; and a projection system PL for forming an image of the radiated part of the mask MA on the target part C of the substrate W. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation system which has a large turnout, and radiates a reduced out-of-band radiation amount and a reduced amount of high-speed particles which may possibly sputter downstream matters. SOLUTION: The radiation system to multiplex radiations contains two sub-radiation sources. The sub-radiation sources each supply a specific amount of radiation. The system further contains a member equipped with reflecting surfaces. The surfaces receive the radiations from the sub-radiation sources, and are arranged so as to combine the radiations. The sub-radiation sources can operate simultaneously or alternately. The surfaces can function as filtering and magnifying (demagnifying). COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an immersion type lithography projection apparatus with improved functionality. SOLUTION: The lithography projection apparatus includes: a radiation system Ex, IL also equipped with a radiation source LA, for providing the projection beams PB of radiation; a first object table (mask table) MT connected to a first positioning means, for correctly positioning a mask with respect to a member PL; a second object table (substrate table) WT connected to a second positioning means, for correctly positioning a substrate with respect to the member PL; and a projection system PL for forming an image of the radiated part of the mask MA on the target part C of the substrate W. COPYRIGHT: (C)2010,JPO&INPIT