Abstract:
PROBLEM TO BE SOLVED: To provide a solving means for authenticating the success/failure of a test mode. SOLUTION: This memory is provided with an array of memory cells each having two storage elements, a plurality of peripheral devices for writing data in the memory cells and reading data from the memory cells, a plurality of voltage sources for generating a plurality of supply voltages to be used by the array and the peripheral device in response to an external voltage, and a test mode logic for determining whether the memory is a test mode or not. The plurality of peripheral devices include latch circuits for latching data stored in the first group of a memory element in response to a first external signal, and write permission circuits for writing the latched data in the second group of the memory element in response to a second external signal. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To solve the problem that there is an adverse influence such as noise when maximum power is not necessary if a voltage pump of a size enough to supply necessary power is arranged. SOLUTION: A voltage pump for the dynamic random access memory is provided with a variable pump for supplying power at a variable level in response to a clock signal and an enable signal generated by the dynamic random access memory, an oscillator for generating the clock signal, and a regulator for generating a first signal to control the oscillator means. The variable pump includes a plurality of first independent pump circuits, and a plurality of second independent pump circuits. Each pump includes two substantially similar pump parts cooeperatively operated in response to the clock signal. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a means for supplying a proper operation voltage to a large semiconductor memory device. SOLUTION: A method for operating the amplification part of a voltage regulator for the dynamic random access memory includes a step of operating at least one power amplifier while a memory array is operated, a step of operating at least one booster amplifier independently of a power amplifier while a voltage pump is operated, and a step of operating a standby amplifier maintained at a low current level irrespective of the operated states of the power amplifier and the booster amplifier. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To cope with a problem during power-up and to perform power-up surely in the shortest time. SOLUTION: The dynamic random access memory is provided with a memory cell array, a plurality of peripheral apparatus for writing data in the memory cell and reading out data from the memory cell, a plurality of voltage sources generating a plurality of supply voltages used by the array and the plurality of peripheral sources responding to the outside voltage, and a power-up sequence circuit for controlling power-up operation for a certain voltage source among a plurality of voltage sources. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To uniformize a system read latency of a memory device for the purpose of reducing complexity of a memory controller. SOLUTION: By a control circuit 2000, after receiving the flag signal by the control circuit, a memory device begins to output data associated with a previously received command onto at least one data signal line from a memory array in the predetermined number of read clock cycles, and the aforementioned number of read clock cycles is preliminarily determined according to a feature of signal propagation in order to equalize it to the read latency of the memory device. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To realize a high-density memory by an economical method. SOLUTION: This memory is provided with a plurality of memory cells, a plurality of pads, a plurality of peripheral devices for transmitting data between the plurality of memory cells and the plurality of pads, a plurality of voltage sources for supplying a plurality of supply voltages, a power distribution bus for supplying the plurality of supply voltages, and a package having a lead frame constituting a part of the power distribution bus to seal the memory. The lead frame constituting a part of the power distribution bus forms a ground bus. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To obtain the optimal chip layout under restrictions in arranging pins and to provide power supply architecture in which a device can perform appropriate operation in the shortest period of time. SOLUTION: The power supply for a dynamic random access memory is equipped with multiple array blocks and multiple pads arranged in the center of the multiple array blocks, arranged near the multiple pads and equipped with multiple voltage source for generating the supply voltage to the multiple array blocks. The multiple voltage source is equipped with a voltage regulator having multiple power amplifiers, and at least one power amplifier is related with each of the multiple array blocks. In order to attain the setup output power level, the multiple voltage sources include voltage pumps having multiple voltage pump circuits divided into multiple groups for performing either of separate or simultaneous operation. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To realize a high-density memory by an economical method. SOLUTION: This dynamic random memory is provided with a plurality of independent arrays constituted of memory cells and having digit lines extending therethrough, and a plurality of peripheral devices for writing/reading data in the memory cells. The peripheral device is provided with a plurality of sense amplifiers for sensing signals on the digit lines. The sense amplifier is provided with a plurality of peripheral devices controlled by a control signal larger than a data signal written in the memory cell, a power source for generating a plurality of supply voltages, and a power distribution bus for supplying the plurality of supply voltages to the plurality of independent arrays and the peripheral devices. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To use overvoltage/undervoltage sensors to stabilize supply voltage of a large capacity memory. SOLUTION: The dynamic random access memory is provided with a memory cell array, a plurality of peripheral apparatus for writing data in the memory cell and reading out data from the memory cell, a plurality of voltage sources which are a plurality of voltage sources generating a plurality of supply voltages used by the array and the plurality of peripheral sources responding to the outside voltage and one of which comprises a voltage generator generating output voltage, a voltage detecting circuit generating the over-voltage signal and the under-voltage signal indicating whether the output voltage is within a first setting range or not responding to the output voltage, and a logic circuit for providing display of stability of the voltage generator responding to the over-voltage signal and the under-voltage signal. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a means for properly supplying power to a large-scale semiconductor memory device. SOLUTION: A voltage regulator for the dynamic random access memory is provided with a voltage reference circuit for generating a reference voltage, and a plurality of power amplifiers having gains larger than 1 for amplifying supply voltages to supply power to the dynamic random access memory and responding to the reference voltage, and a control circuit for generating a control signal to control the plurality of power amplifiers. The voltage regulator for the dynamic random access memory is further provided with a circuit for generating a reference voltage from a voltage supplied from the outside, an amplifier for amplifying the reference voltage by a gain larger than one unit to generate an internal supply voltage to be used by first and second buses, and a control logic for generating a control signal to control the amplifier. COPYRIGHT: (C)2006,JPO&NCIPI