Abstract:
PROBLEM TO BE SOLVED: To provide a thin film light-emitting diode chip which allows easy later testing of a thin film semiconductor chip with small structure height at a wafer level and has small structure height and excellent mechanical stability.SOLUTION: A thin film semiconductor chip 1 comprises: an active layer body 2 suitable to formation of electromagnetic radiation; a conductive and reflective contact material layer 4 on the active layer body 2; and a support layer comprising a flexible conductive sheet 6 on the conductive and reflective contact layer 4, where the conductive sheet 6 is a carbon sheet.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation emitter 1 having an efficient radiation output. SOLUTION: A radiation emitter has a layer continuation 55 having an active area 2 for generating electromagnetic radiation; an output layer 4 disposed on the first side of the layer continuation 55, for outputting the generated radiation; a reflective layer 3 disposed on a second side opposite to the first side, for reflecting the generated radiation; and a boundary surface 10 of the layer continuation 55 having a structuring part of the side provided with a plurality of projecting structuring elements 6 and facing the reflective layer 3. The reflective layer 3 is connected to the layer continuation 55 so as to have the structuring part corresponding to the structuring part of the boundary surface 10. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method of manufacturing an optical semiconductor device capable of improving quantum efficiency. SOLUTION: An indium content of at least one well layer is increased in a step of growing the well layer. In the optical semiconductor device, the well layer has a first composition based on a nitride semiconductor material with first electron energy, and a barrier layer has a second composition based on the nitride semiconductor material with second electron energy higher than the first electron energy. A beam activated quantum well layer is grown on the barrier layer. Non-radiative well layers and the barrier layers form a superlattice for the beam activated quantum well layer. The layer thickness of the beam activated quantum well layer is larger than the layer thickness of the well layer of the superlattice. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an optoelectronic semiconductor chip having improved efficiency.SOLUTION: An optoelectronic semiconductor chip comprises the following sequence of plural regions in a growth direction of the semiconductor chip: a p-doped barrier layer for an active region; the active region, which is suitable for generating electromagnetic radiation, the active region being based on a hexagonal compound semiconductor; and an n-doped barrier layer for the active region. The active region comprises a quantum well structure for generating radiation, and at least one further quantum well structure which is not provided for generating radiation and which is disposed upstream of the quantum well structure provided for generating radiation, as seen in the growth direction.
Abstract:
PROBLEM TO BE SOLVED: To provide a method for manufacturing a plurality of semiconductor substrates wherein defect between component layer sequence can be reduced. SOLUTION: A mask layer 3 having a plurality of windows is formed over a substrate 1/an initial layer 2. A semiconductor material 5 which should grow up on the substrate in a consecutive process is made not to grow substantially on a mask layer. Etching back of the substrate/the primitive layer is performed in windows, and trenches are formed in the substrate/the initial layer starting from the windows. The semiconductor material 5 is grown onto the substrate/the initial layer. Priority is given to lateral growth, the semiconductor material departs from flanks 43 of the trenches first, and grows toward the center of the trenches where a coalescence region 61 is formed. As a result, defects in the substrate/the initial layer which impinge on the flanks 43 of the trenches bend off toward the center of the trenches. The semiconductor material grows over the mask layer, grows over the mask layer between adjacent windows, where the other coalescence region 62 is formed. The component layer sequence 8 is grown on the semiconductor material. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a solution for achieving high image-forming quality even if the luminance is the same. SOLUTION: An optical device comprises at least a first light-emitting device (LE1) and a second light-emitting device (LE2), and at least a light adder (1). The optical device is constituted such that the lights from the first and second light-emitting devices (LE1, LE2) are added to form one light beam. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an improved edge-emitting semiconductor laser chip and optimize a distortion and a waveguide property in a semiconductor laser. SOLUTION: There is provided an edge emitting semiconductor laser chip, including a support substrate (1) and an intermediate layer (2), wherein the intermediate layer (2) intermediates an adhesion between the support substrate (1) and an element structure (50) of the edge-emitting semiconductor laser chip, and at that time, the element structure (50) has an active region (5) provided for beam formation. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a forming method which is self-adjustable and forms a structure width especially of ≤2 μm technically and simply in the forming method for at least one mesa structure or ridge structure, or at least one region electrically pumped in a layer or in a layer sequence. SOLUTION: A mesa size or a ridge size is decided by structuring by mounting a mask layer on a sacrificial layer attached on the layer or on the layer sequence. The mesa structure or the ridge structure is formed in the layer or in the layer sequence by partially removing the sacrificial layer and the layer or the layer sequence. A sacrificial layer whose width is narrower compared with a layer remained on the sacrificial layer is left by selectively remove a part of the sacrificial layer from a side face of the exposed sacrificial layer. A coating is attached to an edge portion of the formed structure. The sacrificial layer is removed by fully coating the side face of the residual sacrificial layer by a coating material. Layers remained on the sacrificial layer are peeled off. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a display device whose control electronic circuit is improved by reducing absorption in the control electronic circuit or avoiding it as completely as possible. SOLUTION: The display device has a 1st array with individual display elements and a 2nd array of control transistors for the display elements, and each control transistor is formed having a band gap of such size that transmissivity is obtained in the visible spectrum range. The method for manufacturing a display element of such a kind is included. COPYRIGHT: (C)2004,JPO&NCIPI