Abstract:
PROBLEM TO BE SOLVED: To provide an enhanced electric contact in a high reflection factor, excellent ohmic contact to a semiconductor, each other's excellent adhesion between layers which form excellent adhesion and contact on the semiconductor, good thermal stability, high stability to the environmental-impact factor, and soldering possibility and structuring possibility. SOLUTION: This electric contact of the photoelectron semiconductor chip 1 comprises a mirror layer 2 made of metal or metal alloy, a protective layer 3 for reducing the corrosion of the mirror layer 2, a barrier layer 4, an adhesion intermediate layer 5, and a solder layer 8. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor chip suitable for high radiation output so that output efficiency of radiation generated in the semiconductor chip is improved. SOLUTION: At least one vertical surface of a semiconductor chip, which is used as an output surface, is longer than a lateral surface in an extending direction of an active zone. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a display device whose control electronic circuit is improved by reducing absorption in the control electronic circuit or avoiding it as completely as possible. SOLUTION: The display device has a 1st array with individual display elements and a 2nd array of control transistors for the display elements, and each control transistor is formed having a band gap of such size that transmissivity is obtained in the visible spectrum range. The method for manufacturing a display element of such a kind is included. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a light emitting semiconductor element which is enhanced in radiation efficiency, and a method of manufacturing the light emitting semiconductor element.SOLUTION: The light emitting semiconductor element has a first main surface and a second main surface, and a semiconductor base of the semiconductor element is formed by a stack of various group III-V nitride semiconductor layers. At least part of produced radiation is passed through the first main surface to be output and coupled, and a reflector is bonded to the second main surface. A group III-V nitride layer is bonded to a junction substrate having a substrate base and an intermediate layer, and the substrate base has a larger coefficient of thermal expansion than the group III-V nitride layer, which is deposited on the intermediate layer.
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-emitting semiconductor component which can be produced from a wafer with a better area yield and is suitable to high optical output, and a method for the production thereof. SOLUTION: The radiation-emitting semiconductor component has a radiation-transmissive substrate, on the underside of which a radiation-generating layer is arranged, in which the substrate has inclined side surfaces, in which the refractive index of the substrate is greater than the refractive index of the radiation-generating layer, in which the difference in refractive index results in an unilluminated substrate region, into which no photons are coupled directly from the radiation-generating layer, and in which the substrate has essentially perpendicular side surfaces in the unilluminated region. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To obtain a III-V nitride semiconductor material, based radiation-emitting semiconductor, which allows its manufacture to be simple in terms of technology and thereby being inexpensive to be performed, and has high external quantum efficiency. SOLUTION: This radiation-emitting semiconductor chip is constituted, in which a thin-layer element is attached on a conductive substrate in a p-type side and has a contact surface in a n-type side, a buffer layer adjoining the contact surface of the thin-layer element has an AlGaN-based material, a side facing the contact surface of the buffer layer has the Al content higher than that of an side opposite to the contact surface, the buffer layer has many conductive regions made from the III-V nitride semiconductor material, and remaining regions of the buffer layer have other III-V nitride semiconductor materials, and which has many layers made from III-V nitride semiconductor materials and provided with n-type and p-type sides. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method of fabricating a multitude of semiconductor chips of high quality achieving an improved yield. SOLUTION: The method comprises steps of: forming on a baseboard 1 a mask layer 3 having a plurality of windows opened to the baseboard 1; growing a semiconductor material 5 on the baseboard such that the semiconductor material is grown starting from on the windows so as to make excess growth, merge in the midway between neighboring windows beyond the mask layer and form merge regions 8 there; growing arrays of element layers on the semiconductor material; and separating the combination made up of the baseboard, the mask layer, the semiconductor material and the arrays of element layers into individual semiconductor chips along the merge regions. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a method of manufacturing an optical semiconductor device capable of improving quantum efficiency. SOLUTION: An indium content of at least one well layer is increased in a step of growing the well layer. In the optical semiconductor device, the well layer has a first composition based on a nitride semiconductor material with first electron energy, and a barrier layer has a second composition based on the nitride semiconductor material with second electron energy higher than the first electron energy. A beam activated quantum well layer is grown on the barrier layer. Non-radiative well layers and the barrier layers form a superlattice for the beam activated quantum well layer. The layer thickness of the beam activated quantum well layer is larger than the layer thickness of the well layer of the superlattice. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To realize an optoelectronic semiconductor device suitable for high optical output power. SOLUTION: The optoelectronic semiconductor device 1 consists of semiconductor crystal material containing at least one of gallium and aluminum substance, and the optoelectronic semiconductor device includes at least one optical active region 2 with its surface, on which at least one optical surface 3 is formed, and at least one boundary layer 4 formed in a position facing an optical surface 3 in the optical active region 2 and consisting of one up to ten layers of monomolecular layers, which contains sulfur or selenium. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a technically simple and an inexpensive method for manufacturing a GaN-based semiconductor device, and to provide a method for manufacturing the semiconductor device which has enhanced luminous efficiency. SOLUTION: A plurality of GaN-based layers (4) are applied onto a laminated substrate which has a substrate body (1) and an interlayer (2). In this case, the thermal expansion coefficient of the substrate body (1) is similar to or greater than that of the GaN-based layers (4), and the GaN-based layers (4) are deposited on the interlayer (2). Preferably, the interlayer and the substrate body are bonded by a wafer bonding process. COPYRIGHT: (C)2007,JPO&INPIT