中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

50 records (took 0.048 seconds)

    A WIDE-FIELD-OF-VIEW OPTICAL SYSTEM AND A METHOD FOR IMAGING THE GROUND
    1.
    发明授权
    A WIDE-FIELD-OF-VIEW OPTICAL SYSTEM AND A METHOD FOR IMAGING THE GROUND 有权
    宽视场光学系统和用于成像地面的方法

    公开(公告)号：EP2381286B1

    公开(公告)日：2018-04-04

    申请号：EP11151597.9

    申请日：2011-01-20

    Applicant: Raytheon Company

    Inventor： Cook, Lacy G.

    IPC: G02B17/06

    CPC classification number: G02B17/0657

    Abstract: A wide-field-of-view (WFOV) optical system includes a negative optical-power primary mirror configured to receive and reflect light from an image scene; a low optical-power secondary mirror configured to receive and reflect light from the primary mirror; a negative optical-power tertiary mirror configured to receive and reflect light from the secondary mirror; and a positive optical-power quaternary mirror configured to receive and reflect light from the tertiary mirror. The primary, secondary, tertiary and quaternary mirrors are configured to maintain an effective focal length (EFL) at edges of the field of view (FOV) of the optical system to be at least equal to a center of the FOV of the optical system so that a spatial resolution of the optical system essentially remains constant across the FOV.

    Calibration source assembly for an infrared detector
    4.
    发明公开
    Calibration source assembly for an infrared detector 有权
    Infrarotdetektor mit einer Kalibrierquellenanordnung

    公开(公告)号：EP2244076A1

    公开(公告)日：2010-10-27

    申请号：EP10169745.6

    申请日：2008-10-29

    Applicant: Raytheon Company

    Inventor： Moskun, Eric M. ,  Cook, Lacy G. ,  De Ruyter, Howard M.

    IPC: G01J5/52 ,  G02B13/14

    CPC classification number: G01J5/522 ,  G02B19/0028 ,  G02B19/0061 ,  G02B19/0085 ,  G02B19/009 ,  G02B23/12 ,  G02B26/007 ,  G02B27/0927 ,  G02B27/0933 ,  G02B27/0938 ,  G02B27/0977

    Abstract: An IR detector with a calibration source assembly (104) includes a cold cavity assembly tube (106) providing an internal vacuum (108), the tube (106) having a first end (110) providing a cold stop (112) and a second end (114) providing an IR focal plane (116) oriented towards the first end (110). The IR detector with a calibration source assembly (104) also includes a rotatable spectral filter wheel (118) optically coupled to an IR focal plane (116) of the detector, the filter wheel (118) having a plurality of areas (120) each of at least a minimum size, at least one area being a calibration area (120A). The calibration area includes: a substrate (122) having a first side (124) facing the IR focal plane (116) and a second side (126) opposite from the first side (124); a light transmitting edge section (128) disposed between the first side (124) and the second side (126); and, at least one light redirector (130) disposed at least partially within the substrate (122), the light redirector (130) structured and arranged to receive light from the edge (128) and to redirect the light out the first side (124). The IR detector with a calibration source assembly (104) also includes a light source (132) optically coupled to the edge section (128).

    Abstract translation: 具有校准源组件（104）的IR检测器包括提供内部真空（108）的冷腔组件管（106），该管（106）具有提供冷止动件（112）的第一端（110）和第二端 端部（114）提供朝向第一端（110）定向的红外焦平面（116）。 具有校准源组件（104）的IR检测器还包括光学耦合到检测器的IR焦平面（116）的可旋转光谱滤光轮（118），滤光轮（118）具有多个区域（120） 至少一个最小尺寸，至少一个区域是校准区域（120A）。 校准区域包括：具有面向IR焦平面（116）的第一侧面（124）和与第一侧面（124）相对的第二侧面（126）的基底（122）。 设置在所述第一侧（124）和所述第二侧（126）之间的光透射边缘部分（128）; 以及至少部分地设置在所述衬底（122）内的至少一个光重定向器（130），所述光重定向器（130）被构造和布置成接收来自所述边缘（128）的光并将光从所述第一侧（124 ）。 具有校准源组件（104）的IR检测器还包括光学耦合到边缘部分（128）的光源（132）。

    Two-channel imaging spectrometer utilizing shared objective collimating and imaging optics
    5.
    发明公开
    Two-channel imaging spectrometer utilizing shared objective collimating and imaging optics 有权
    Zweikanal-Abbildungsspektrometer mit gemeinsamerObjektivbündelungund Abbildungsoptik

    公开(公告)号：EP1988372A1

    公开(公告)日：2008-11-05

    申请号：EP08251581.8

    申请日：2008-04-30

    Applicant: Raytheon Company

    Inventor： Cook, Lacy G.

    IPC: G01J3/02 ,  G01J3/04 ,  G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/0294 ,  G01J3/04 ,  G01J3/12 ,  G01J3/2823

    Abstract: A two-channel spectrometer (20) has a shared objective (22) and a pair of slits (34, 40) at a common image plane (46). Each of the slits (34, 40) receives a portion of the output beam (22) of the shared objective (22) and is optimized for transmitting different wavelengths. A shared double-pass reflective triplet (48) receives the output beams of the slits. The output of the reflective triplet (48) is incident upon a beamsplitter (62), which sends a collimated first reflective triplet output (52) of a first wavelength to a first dispersive element (64), and a collimated second reflective triplet output (54) of a second wavelength to a second dispersive element (70). The outputs (66, 72) of the dispersive elements (64, 70) are directed back to the beamsplitter (62) and the reflective triplet (48) to imaging detectors (76, 78) located at two different locations of the common image plane (46).

    Abstract translation: 双通道光谱仪（20）在共同的图像平面（46）处具有共享物镜（22）和一对狭缝（34,40）。 每个狭缝（34,40）接收共享物镜（22）的输出光束（22）的一部分，并被优化用于透射不同的波长。 共享双通反射三重态（48）接收狭缝的输出光束。 反射三重态（48）的输出入射到分束器（62）上，分束器（62）将第一波长的准直的第一反射三重态输出（52）发送到第一色散元件（64）和准直的第二反射三重态输出 54）到第二分散元件（70）。 分散元件（64,70）的输出（66,72）被引导回分光器（62）和反射三重态（48）到成像检测器（76,78），位于公共图像平面的两个不同位置 （46）。

    Integrated 3-channel gas detection and measurement spectrometer
    9.
    发明公开
    Integrated 3-channel gas detection and measurement spectrometer 有权
    Integriertes 3-Kanal Gaserkennungs- und Messspektrometer

    公开(公告)号：EP2573529A1

    公开(公告)日：2013-03-27

    申请号：EP12177626.4

    申请日：2012-07-24

    Applicant: Raytheon Company

    Inventor： Cook, Lacy G.

    IPC: G01J3/02

    CPC classification number: G01J3/0294 ,  G01J2003/045 ,  G01J2003/047

    Abstract: A three-channel spectrometer including: a beamsplitter element that receives an incident radiation and transmits a first portion, a second portion, and a third portion of the incident radiation, a first slit that receives the first portion and transmits a first slit output radiation of a first wavelength range; a second slit that receives the second portion and transmits a second slit output radiation of a second wavelength range; a third slit that receives the third portion of the incident radiation and transmits a third slit output radiation of a third wavelength range; a common optical form that receives and collimates the first, second, and third slit output radiation; and a dispersive element that receives and reflects the collimated first, second, and third slit output radiation from the optical form.

    Abstract translation: 一种三通道光谱仪，包括：分束器元件，其接收入射辐射并透射入射辐射的第一部分，第二部分和第三部分;第一狭缝，其接收第一部分并透射第一狭缝输出辐射 第一波长范围; 第二狭缝，其接收所述第二部分并透射第二波长范围的第二狭缝输出辐射; 第三狭缝，其接收入射辐射的第三部分并透射第三波长范围的第三狭缝输出辐射; 接收和准直第一，第二和第三狭缝输出辐射的公共光学形式; 以及从光学形式接收并反射准直的第一，第二和第三狭缝输出辐射的色散元件。

    Low distortion spectrometer
    10.
    发明公开
    Low distortion spectrometer 有权
    Spektrometer mit geringer Verzerrung

    公开(公告)号：EP2551655A1

    公开(公告)日：2013-01-30

    申请号：EP12173022.0

    申请日：2012-06-21

    Applicant: Raytheon Company

    Inventor： Robinson, Ian S. ,  Cook, Lacy G. ,  Shaham, Yifal J.

    IPC: G01J3/04 ,  G01J3/28 ,  G01J3/02

    CPC classification number: G01J3/0294 ,  G01J3/0256 ,  G01J3/04 ,  G01J3/2803 ,  G01J3/2823

    Abstract: An imaging assembly for a spectrometer includes a substrate with first and second modules thereon containing respective arrays of detector elements positioned so the arrays are elongated along a first axis with a gap therebetween. A third module including a third array of detector elements is also thereon, spaced from the first axis, at least as long as the gap, and smaller than the elongation of either of the first or second arrays. Further thereon are first and second slits elongated along a second axis spaced from and generally parallel to the first axis, each being at least as long as the respective arrays. A third slit at least as long as the gap is also therein, spaced from the first axis, second axis, and third array such that the gap, third slit, and third array are generally along a third axis generally perpendicular to the first and second axis.

    Abstract translation: 用于光谱仪的成像组件包括其上具有第一和第二模块的基板，其上包含相应的检测器元件阵列，所述检测器元件被定位成使得阵列沿着第一轴线在其间具有间隙而细长。 包括检测器元件的第三阵列的第三模块也在其上，与第一轴线间隔开至少等于间隙，并且小于第一或第二阵列中的任一个的伸长率。 此外，还具有沿着与第一轴线间隔开并且大致平行于第一轴线的第二轴线延伸的第一和第二狭缝，每个狭缝至少与相应的阵列一样长。 第三狭缝至少与间隙一样长，与第一轴线，第二轴线和第三阵列间隔开，使得间隙，第三狭缝和第三阵列通常沿着大致垂直于第一和第二阵列的第三轴线 轴。

Patent Agency Ranking