Abstract:
The invention relates to a measuring apparatus, which comprises a cavity (34) extending in a longitudinal direction (36), a first opening (35), which is to face a sample, a plurality of second openings (31) for detecting light coming from the sample, and at least one third opening (33) for coupling light into the cavity. Such a measuring apparatus is suitable in particular for spectroscopically examining planar samples.
Abstract:
Gegenstand der Erfindung ein Verfahren zur Bestimmung einer Oberflächenverunreinigung von polykristallinem Silicium, umfassend die Schritte a) Bereitstellen von zwei polykristallinen Siliciumstäben durch Abscheidung in einem Siemensreaktor; b) Verunreinigungen im ersten der beiden Stäbe werden unmittelbar nach der Abscheidung bestimmt; c) Der zweite Stab wird durch eine oder mehrere Anlagen geführt, in denen polykristalline Siliciumstäbe zu Stabstücken oder Polysiliciumbruchstücken weiterverarbeitet, gegebenenfalls gereinigt, gelagert oder verpackt werden; d) Daraufhin werden Verunreinigungen im zweiten Stab bestimmt; wobei sich aus der Differenz der bestimmten Verunreinigungen in erstem und zweitem Stab eine Oberflächenverunreinigung von polykristallinem Silicium infolge Anlagen und Anlagenumgebung ergibt.
Abstract:
According to one aspect, the invention relates a spectral band-pass filter, which is optimized for the transmission of an incident wave at at least a first given central wavelength λ 0 , and which includes: a metal grating having a thickness (t) greater than approximately λ 0 /50 and including at least a first set of substantially identical, parallel slots having a width ( W ) less than around λ 0 /10, and being spaced apart periodically or quasi-periodically according to a first period that is less than said first central wavelength, a layer of dielectric material having a thickness (h) and a given refractive index (n g ), which is coupled to the metal grating to form a waveguide for the waves diffracted by the grating, said first period of the grating being designed such that only orders 0 and ± 1 of a wave having normal incidence and a wavelength λ 0 are diffracted in the layer of dielectric material, the assembly of the dielectric layer and grating being suspended, during use, in a fluid having a refractive index of close to 1.
Abstract:
An apparatus for incorporation into time-domain spectroscopy systems that creates a continuous reference whereby a sample pulses' phase and amplitude can be tracked and corrected employs a beam splitter to generate sample and reference pulses. A detector is positioned for receiving the reference radiation pulses that do not interact with the sample. The same detector is also positioned for receiving the sample radiation pulses that emerge from the sample. The apparatus can be readily implemented by being configured between the emitter and detector of a terahertz time-domain spectrometer. The reference pulse is used to trace the changes in time and amplitude of the sample pulse. Since any changes in the reference pulse will most likely manifest in the sample pulse, the reference pulse is monitored and used to correct the sample pulse and thereby reduce the effects of jitter.
Abstract:
A classification device (2) for identification of articles (3) in an automated checkout counter is presented. The device comprises a memory unit (5) capable of storing digital reference signatures, each of which digital reference signatures corresponds to an article identity, a processor (6) connected to the memory unit (5), and at least one sensor (4, 7, 14, 15, 16, 17, 18, 24) configured to determine a measured signature of an article (3) wherein said processor (6) is configured to compare said measured signature with the digital reference signatures, and to calculate a matching probability of a predetermined number of article identities.
Abstract:
The invention relates to a method for calibrating a spectrometer (1) equipped with a CCD array (2), the CCD array recording at least two spectra of two special samples (P1, P2) that function as calibration patterns and are designed such that the respective one reference substance in the calibration pattern is adjusted such that for one of the calibration patterns the light to be examined is emitted in a location extremely close to the surface, while the other calibration pattern is adjusted such that the light to be examined is emitted from deeper locations, differing in depth, the raw data recorded in the process being used to generate a function describing a respective etalon effect and said function being saved in the spectrometer as a correction function (K) for measurements obtained from volume emitters.
Abstract:
In an endoscope system, rays of different wavelength bands are sequentially projected toward a target site of a test subject, to obtain image signals from the reflected rays. Reflection spectra (S) are calculated from the image signals and subjected to a multi-regression analysis in combination with absorption spectra of those objects which are relevant to the inspection, such as blood or hemoglobin in the target site, and absorption spectra of irrelevant objects other than the relevant objects, such as bile or staining materials. Spectral components of the irrelevant objects in the reflection spectra (S) are determined through the multi-regression analysis, and are eliminated from the reflection spectra (S), providing second reflection spectra (S'). A couple of images are produced and displayed on the basis of the first reflection spectra (S) from which the spectral components of the irrelevant objects are not eliminated and the second reflection spectra (S').
Abstract:
This invention concerns a spectroscopic method, apparatus for determining whether a component is present in a sample. In one aspect, the method comprises resolving a model of the spectral data separately for candidates from a set of predetermined component reference spectra, and determining whether a component is present in the sample based upon a figure of merit quantifying an effect of including the candidate reference spectrum corresponding to that component in the model.
Abstract:
An optical interrogation system is described herein that can interrogate a label-independent-detection (LID) biosensor and monitor a biological event on top of the biosensor without suffering from problematical parasitic reflections and/or problematical pixelation effects. In one embodiment, the optical interrogation system is capable of interrogating a biosensor and using a low pass filter algorithm to digitally remove problematic parasitic reflections contained in the spectrum of an optical resonance which makes it easier to determine whether or not a biological event occurred on the biosensor.; In another embodiment, the optical interrogation system is capable of interrogating a biosensor and using an oversampling/smoothing algorithm to reduce oscillations in the estimated location of an optical resonance caused by the problematical pixelation effect which makes it easier to determine whether or not a biological event occurred on the biosensor.