公开(公告)号：US08260004B2

公开(公告)日：2012-09-04

申请号：US12053518

申请日：2008-03-21

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G06K9/00 ,  G01N21/00

CPC classification number: G01N21/4738 ,  G01J3/462 ,  G01J2003/466 ,  G01N21/57 ,  G01N21/8806

Abstract: The present disclosure relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analyzing the image. According to the disclosure, the result value is displayed against the size of the determined surface areas.

Abstract translation: 本公开涉及一种用于定量测定表面性质的方法，其中记录了包含大量测量值的待分析表面的空间分辨图像。 在第一种方法步骤中，分析测量值以确定具有特定物理性质的那些表面积。 然后确定该物理性质的结果值，其中该结果值是通过分析图像确定的图像的所有这些表面积的物理性质的值的特征。 根据本公开，结果值相对于确定的表面积的大小显示。

公开(公告)号：US07973932B2

公开(公告)日：2011-07-05

申请号：US12400610

申请日：2009-03-09

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G01J3/46 ,  G01N21/55 ,  G01N21/88 ,  G01B11/24

CPC classification number: G01N21/57 ,  G01N2021/4711 ,  G01N2021/4735

Abstract: The invention relates to an apparatus for determining optical surface properties of workpieces, comprising a housing, in the interior of which there is provided a carrier on which the workpiece be arranged, and comprising a radiation device which directs radiation onto the workpiece in a predefined emission direction (E). According to the invention, the housing has in at least one wall an observation opening, through which a region of the workpiece illuminated by the radiation device can be observed in a predefined observation direction (B).

Abstract translation: 本发明涉及一种用于确定工件的光学表面性质的装置，包括壳体，其内部设置有载体，工件布置在该载体上，并且包括辐射装置，其以预定义的排放将辐射引导到工件上 方向（E）。 根据本发明，壳体在至少一个壁上具有观察开口，通过该观察开口可以沿预定的观察方向（B）观察由辐射装置照射的工件的区域。

公开(公告)号：US07567348B2

公开(公告)日：2009-07-28

申请号：US11230316

申请日：2005-09-19

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01N21/55

CPC classification number: G01N21/57

Abstract: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

Abstract translation: 用于空间分辨检查和评估表面性质的方法和装置，特别是影响表面所产生的光学印象的表面的这种特性。 被限定的辐射被引导到被检查表面的第一预定立体角。 此外，特别是通过扩散和反射影响被检查表面的辐射的至少一部分以第二预定义立体角检测。 捕获的至少一个测量变量被空间分辨，其表征受检查表面影响的辐射的至少一个预定特性。 至少在空间分辨测量值的一部分上，确定用于表征表面的至少一个统计参数。

公开(公告)号：US07834991B2

公开(公告)日：2010-11-16

申请号：US11774376

申请日：2007-07-06

Applicant: Peter Schwarz ,  Konrad Lex

Inventor： Peter Schwarz ,  Konrad Lex

IPC: G01N21/00

CPC classification number: G01N21/4738 ,  G01N21/55

Abstract: An apparatus for determining surface properties, comprises at least a first radiation device which emits radiation onto a surface to be analyzed, at least a first radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by the surface and outputs at least a first measurement signal which is characteristic of the reflected or scattered radiation, and at least a further radiation detector device which receives at least part of the radiation emitted by the at least one radiation device and then scattered or reflected by a surface and outputs at least a second measurement signal which is characteristic of the reflected or scattered radiation.

Abstract translation: 用于确定表面性质的装置包括至少第一辐射装置，其将辐射发射到待分析的表面上，至少第一辐射检测器装置，其接收由至少一个辐射装置发射的辐射的至少一部分，然后散射 或由表面反射并输出至少是反射或散射辐射的特征的第一测量信号，以及至少另外的辐射检测器装置，其接收由至少一个辐射装置发射的辐射的至少一部分，然后散射 或由表面反射，并且输出至少是反射或散射的辐射的特征的第二测量信号。

公开(公告)号：US07630516B2

公开(公告)日：2009-12-08

申请号：US10924361

申请日：2004-08-23

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G06K9/00

CPC classification number: G01B11/303

Abstract: A method for characterizing surfaces wherein a first and a second quantity characteristic of roughness of the surface are determined, a first derived quantity is determined by applying mathematical operations to at least said first characteristic quantity and a second derived quantity is determined by applying mathematical operations to at least said second characteristic quantity; wherein an interrelationship between the first and the second derived quantity will be formed which at least partially specifies at least the optical properties of the surface. Finally, the first and the second derived quantities are represented in a common reference frame.

Abstract translation: 一种用于表征表面的方法，其中确定表面的粗糙度的第一和第二量特征，通过对至少所述第一特征量应用数学运算来确定第一导出量，并且通过将数学运算应用于 至少所述第二特征量; 其中将形成第一和第二导出量之间的相互关系，其至少部分地至少部分地指定表面的光学性质。 最后，第一和第二导出量在公共参考系中被表示。

公开(公告)号：US07566894B2

公开(公告)日：2009-07-28

申请号：US11139027

申请日：2005-05-26

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G01N21/86 ,  G02B11/24

CPC classification number: G01N21/57 ,  G01B11/306

Abstract: A device for the quantified evaluation of surface characteristics including a first radiation structure which is arranged in a first predetermined angle with respect to a surface to be analyzed and which directs radiation onto the surface to be analyzed, wherein the radiation directed onto the surface has at least one component with wavelengths in the infrared area, a detection apparatus arranged in a second predetermined angle with respect to the surface to be analyzed detecting the radiation radiated onto the surface and being thrown back from it.

Abstract translation: 一种用于量化评估表面特性的装置，包括相对于待分析表面以第一预定角度布置并将辐射引导到待分析表面上的第一辐射结构，其中指向表面的辐射具有 至少一个具有红外区域波长的部件，相对于要分析的表面以第二预定角度布置的检测装置，检测辐射到表面上的辐射并从其中被抛回。

公开(公告)号：US20080232646A1

公开(公告)日：2008-09-25

申请号：US12053518

申请日：2008-03-21

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G06K9/00

CPC classification number: G01N21/4738 ,  G01J3/462 ,  G01J2003/466 ,  G01N21/57 ,  G01N21/8806

Abstract: The invention relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analysing the image. According to the invention, the result value is displayed against the size of the determined surface areas.

Abstract translation: 本发明涉及一种用于定量测定表面性质的方法，其中记录了包含大量测量值的待分析表面的空间分辨图像。 在第一种方法步骤中，分析测量值以确定具有特定物理性质的那些表面积。 然后确定该物理性质的结果值，其中该结果值是通过分析图像确定的图像的所有这些表面积的物理性质的值的特征。 根据本发明，结果值相对于确定的表面积的尺寸显示。

公开(公告)号：US20080231865A1

公开(公告)日：2008-09-25

申请号：US12053497

申请日：2008-03-21

Applicant: Peter Schwarz ,  Konrad Lex

Inventor： Peter Schwarz ,  Konrad Lex

IPC: G01B11/30 ,  G01B15/08 ,  G01N21/55

CPC classification number: G01N21/4738 ,  G01J3/462 ,  G01J2003/466 ,  G01N21/57 ,  G01N21/8806

Abstract: The invention relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analysing the image. According to the invention, in addition to the result value, a further value (B) characteristic of the surface is determined and this characteristic value is displayed together with the result value (I).

Abstract translation: 本发明涉及一种用于定量测定表面性质的方法，其中记录了包含大量测量值的待分析表面的空间分辨图像。 在第一种方法步骤中，分析测量值以确定具有特定物理性质的那些表面积。 然后确定该物理性质的结果值，其中该结果值是通过分析图像确定的图像的所有这些表面积的物理性质的值的特征。 根据本发明，除了结果值之外，还确定表面的另外的值（B）特性，并且将该特征值与结果值（I）一起显示。

公开(公告)号：US07177032B2

公开(公告)日：2007-02-13

申请号：US10854926

申请日：2004-05-27

Applicant: Konrad Lex

Inventor： Konrad Lex

IPC: G01B11/30

CPC classification number: G01B11/303 ,  G01J1/00 ,  G01N21/474

Abstract: A method for determining the properties of surfaces wherein a first process step specified radiation emits from at least one radiation source to a measuring surface, in further process steps the radiation reflected and/or scattered off the measuring surface is detected by a plurality of image-capturing components, and a signal is generated which specifies at least one parameter of the radiation detected by the image-capturing components. In further process steps the first signals are grouped based on predetermined criteria to form group signals, and at least one group-specific evaluation figure is computed, and a dependent statistical parameter correlating with at least one measuring surface remission characteristic. Finally at least one statistical parameter is read out in dependence on the predetermined criterion for grouping said first signals. The properties of the surface are specified by a relation between at least two statistical parameters.

Abstract translation: 一种用于确定表面性质的方法，其中特定辐射的第一工艺步骤从至少一个辐射源发射到测量表面，在进一步的处理步骤中，由测量表面反射和/或散射的辐射被多个图像 - 捕获组件，并且生成指定由图像捕获组件检测到的辐射的至少一个参数的信号。 在进一步的处理步骤中，基于预定标准对第一信号进行分组以形成组信号，并且计算至少一个组特定评估图，以及与至少一个测量表面缓解特性相关的依赖统计参数。 最后，根据用于对所述第一信号进行分组的预定标准，读出至少一个统计参数。 表面的属性由至少两个统计参数之间的关系指定。

公开(公告)号：US20060187453A1

公开(公告)日：2006-08-24

申请号：US11241827

申请日：2005-09-30

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01B11/00

CPC classification number: G01N21/55 ,  G01N21/8806

Abstract: A device for examining the optical properties of surfaces includes a first radiation source which emits radiation to an examination surface, at least one first detector device, for detecting the radiation reflected off the surface and emitting at least one signal that is characteristic of at least one parameter of the detected radiation, wherein the detector device includes a plurality of image capturing components arranged in a specified detection area and wherein a control is provided for compensating signal changes caused by a shift of the location where the reflected radiation is incident on the detection area.