公开(公告)号：US20210164912A1

公开(公告)日：2021-06-03

申请号：US16772954

申请日：2018-12-05

Applicant: ABB Schweiz AG

Inventor： Michael Ohora

IPC: G01N21/89 ,  G01J3/427 ,  G01N21/3559 ,  G01N21/86

Abstract: A web manufacturing supervision system for monitoring properties of a web being transported in a moving direction during a web manufacturing process, includes: a) a radiation source for illuminating a first spot on the web; b) a tunable first detector for capturing signal radiation emanating from the first spot within a signal wavelength band; the signal wavelength band being adjustable to one of at least a first wavelength band and a second wavelength band; c) a second detector for capturing reference radiation emanating from the first spot within a reference wavelength band; d) control means for alternatingly tuning the signal wavelength band to the first wavelength band and the second wavelength band and measuring the signal at both wavelength bands simultaneously.

公开(公告)号：US11209370B2

公开(公告)日：2021-12-28

申请号：US16772954

申请日：2018-12-05

Applicant: ABB Schweiz AG

Inventor： Michael Ohora

IPC: G01N21/89 ,  G01J3/427 ,  G01N21/3559 ,  G01N21/86

Abstract: A web manufacturing supervision system for monitoring properties of a web being transported in a moving direction during a web manufacturing process, includes: a) a radiation source for illuminating a first spot on the web; b) a tunable first detector for capturing signal radiation emanating from the first spot within a signal wavelength band; the signal wavelength band being adjustable to one of at least a first wavelength band and a second wavelength band; c) a second detector for capturing reference radiation emanating from the first spot within a reference wavelength band; d) control means for alternatingly tuning the signal wavelength band to the first wavelength band and the second wavelength band and measuring the signal at both wavelength bands simultaneously.