公开(公告)号：US11256587B2

公开(公告)日：2022-02-22

申请号：US16851279

申请日：2020-04-17

Applicant: PURE STORAGE, INC.

Inventor： Eric Mueller ,  Matthew D. Fleming ,  Shao-Ting Chang ,  Pavan Rao ,  Xinyi Shu

IPC: G06F11/20 ,  G06F11/16 ,  G06F11/10

Abstract: A method of failure detection in a storage system is performed by the storage system. The method includes detecting a failure in a nonvolatile random access memory device that is in or coupled to a storage device having storage memory. The storage system has multiple NVRAM devices and multiple storage devices that have storage memory. The method includes taking a portion or all of the NVRAM device offline. Taking a portion or all of the NVRAM device offline is responsive to detecting the failure. Taking a portion or all of the NVRAM device off-line is while keeping online the storage memory of the storage device, sufficient ones of the NVRAM devices, and sufficient ones of the storage devices to provide reliable access to data and metadata in the storage system.

公开(公告)号：US12087382B2

公开(公告)日：2024-09-10

申请号：US16381581

申请日：2019-04-11

Applicant: Pure Storage, Inc.

Inventor： Matthew D. Fleming ,  John Roper ,  Hari Kannan ,  John Boyle ,  Eric Michael Verwillow ,  Nenad Miladinovic ,  Eric Mueller

IPC: G11C29/44 ,  G11C29/38

CPC classification number: G11C29/44 ,  G11C29/38

Abstract: A method of tracking flash memory in a storage system is provided. The method includes initializing a bad blocks threshold value and marking one or more planes or logical unit numbers (LUNs) of flash memory as bad, responsive to determining that bad blocks in the one or more planes or LUNs meet the bad blocks threshold value. The method includes adjusting the bad blocks threshold value, responsive to exceeding a threshold number or rate of retiring planes or LUNs of flash memory, and repeating the marking and the adjusting, with the bad blocks threshold value capped at a maximum threshold value.

公开(公告)号：US20210326225A1

公开(公告)日：2021-10-21

申请号：US16851279

申请日：2020-04-17

Applicant: PURE STORAGE, INC.

Inventor： Eric Mueller ,  Matthew D. Fleming ,  Shao-Ting Chang ,  Pavan Rao ,  Xinyi Shu

IPC: G06F11/20 ,  G06F11/10

Abstract: A method of failure detection in a storage system is performed by the storage system. The method includes detecting a failure in a nonvolatile random access memory device that is in or coupled to a storage device having storage memory. The storage system has multiple NVRAM devices and multiple storage devices that have storage memory. The method includes taking a portion or all of the NVRAM device offline. Taking a portion or all of the NVRAM device offline is responsive to detecting the failure. Taking a portion or all of the NVRAM device off-line is while keeping online the storage memory of the storage device, sufficient ones of the NVRAM devices, and sufficient ones of the storage devices to provide reliable access to data and metadata in the storage system.

公开(公告)号：US20200327953A1

公开(公告)日：2020-10-15

申请号：US16381581

申请日：2019-04-11

Applicant: Pure Storage, Inc.

Inventor： Matthew D. Fleming ,  John Roper ,  Hari Kannan ,  John Boyle ,  Eric Michael Verwillow ,  Nenad Miladinovic ,  Eric Mueller

IPC: G11C29/44 ,  G11C29/38

Abstract: A method of tracking flash memory in a storage system is provided. The method includes initializing a bad blocks threshold value and marking one or more planes or logical unit numbers (LUNs) of flash memory as bad, responsive to determining that bad blocks in the one or more planes or LUNs meet the bad blocks threshold value. The method includes adjusting the bad blocks threshold value, responsive to exceeding a threshold number or rate of retiring planes or LUNs of flash memory, and repeating the marking and the adjusting, with the bad blocks threshold value capped at a maximum threshold value.