公开(公告)号：US11947233B2

公开(公告)日：2024-04-02

申请号：US17135739

申请日：2020-12-28

Applicant: SAGE Electrochromics, Inc.

Inventor： Benjamin Treml ,  Jean-Christophe Giron ,  Yigang Wang ,  Robert Newcomb

IPC: G02F1/155 ,  B23K26/352 ,  B23K26/362 ,  G02F1/153

CPC classification number: G02F1/155 ,  G02F1/1533 ,  B23K26/355 ,  B23K26/362

Abstract: Various embodiments relate to an electrochromic (EC) device that is structured with surface contour features arranged according to a randomized pattern. For example, one or more conductive layers of an EC device may be structured with such surface ablations. In some embodiments, the randomized ablation pattern may comprise a randomized variation in one or more geometrical characteristics of a group of segments. In some examples, the geometrical characteristic(s) may include a distance characteristic, an orientation characteristic, and/or a shape characteristic, etc. According to various embodiments, the randomized ablation pattern may be configured to reduce diffraction and/or scatter of light incident on the surface ablations as compared to some other ablation patterns.

公开(公告)号：US20210200052A1

公开(公告)日：2021-07-01

申请号：US17135739

申请日：2020-12-28

Applicant: SAGE Electrochromics, Inc.

Inventor： Benjamin Treml ,  Jean-Christophe Giron ,  Yigang Wang ,  Robert Newcomb

IPC: G02F1/153 ,  B23K26/57 ,  G02F1/1523

Abstract: Various embodiments relate to an electrochromic (EC) device that is structured with surface contour features arranged according to a randomized pattern. For example, one or more conductive layers of an EC device may be structured with such surface ablations. In some embodiments, the randomized ablation pattern may comprise a randomized variation in one or more geometrical characteristics of a group of segments. In some examples, the geometrical characteristic(s) may include a distance characteristic, an orientation characteristic, and/or a shape characteristic, etc. According to various embodiments, the randomized ablation pattern may be configured to reduce diffraction and/or scatter of light incident on the surface ablations as compared to some other ablation patterns.