IMAGING SPECTROMETER WITH FREEFORM SURFACES
    1.
    发明申请

    公开(公告)号:US20180136039A1

    公开(公告)日:2018-05-17

    申请号:US15579201

    申请日:2016-06-07

    CPC classification number: G01J3/021 G01J3/0208 G01J3/18 G01J3/2823

    Abstract: Expanded performance opportunities for imaging spectrometers are described using φ-polynomial freeform surfaces in reflective and diffractive optics. The imaging spectrometers are generally of a type that include an entrance aperture for admitting radiation over a range of wavelengths, a detector array, a primary reflective optic with optical power, a secondary reflective diffractive optic, and a tertiary reflective optic with optical power for collectively imaging the entrance aperture onto the detector array through a range of dispersed positions. One or more of the primary reflective optic, the secondary reflective diffractive optic, and the tertiary reflective optic can include a φ-polynomial optical surface with no axis of symmetry and represented by a function that depends on both a radial component and an azimuthal

    Imaging spectrometer with freeform surfaces

    公开(公告)号:US10444069B2

    公开(公告)日:2019-10-15

    申请号:US15579201

    申请日:2016-06-07

    Abstract: Expanded performance opportunities for imaging spectrometers are described using ϕ-polynomial freeform surfaces in reflective and diffractive optics. The imaging spectrometers are generally of a type that include an entrance aperture for admitting radiation over a range of wavelengths, a detector array, a primary reflective optic with optical power, a secondary reflective diffractive optic, and a tertiary reflective optic with optical power for collectively imaging the entrance aperture onto the detector array through a range of dispersed positions. One or more of the primary reflective optic, the secondary reflective diffractive optic, and the tertiary reflective optic can include a ϕ-polynomial optical surface with no axis of symmetry and represented by a function that depends on both a radial component and an azimuthal component.

Patent Agency Ranking