公开(公告)号：US20160131579A1

公开(公告)日：2016-05-12

申请号：US14924815

申请日：2015-10-28

Applicant: Hiroyoshi SEKIGUCHI ,  Shintaroh KIDA ,  Kohji OSHIKIRI ,  Izumi ITOH

Inventor： Hiroyoshi SEKIGUCHI ,  Shintaroh KIDA ,  Kohji OSHIKIRI ,  Izumi ITOH

IPC: G01N21/55 ,  B60Q1/08 ,  B60S1/08 ,  B60R16/023

CPC classification number: G01N21/55 ,  B60Q1/085 ,  B60R16/023 ,  B60S1/0844 ,  G01N21/552 ,  G01N21/94 ,  G01N2021/945 ,  G01N2021/9586 ,  G01N2201/061 ,  G01N2201/063 ,  G01N2201/064

Abstract: An adhering detection apparatus includes a light source to emit probe light to a light translucent object during an emission period, and to stop an emission of the probe light to the light translucent object during a non-emission period, a light receiver to receive light coming from the light translucent object during the emission period and the non-emission period of the light source, and an adhering detection processor to perform an adhering detection processing for detecting a substance adhering to the light translucent object based on light quantity of the light coming from the light translucent object and received by the light receiver, and to output a detection result of the adhering detection processing. The adhering detection processor selectively performs one or more processes depending on the light quantity of the light received by the light receiver during the non-emission period of the light source.

Abstract translation: 附着检测装置包括在发光期间将探测光发射到光半透明物体的光源，并且在非发光期间停止将探测光发射到光半透明物体;光接收器，用于接收光 在光源的发光期间和非发光期间的光半透明物体，以及附着检测处理器，其基于来自光源的光的光量进行用于检测附着在所述光半透明物体上的物质的附着检测处理 该光半透明物体并由光接收器接收，并输出粘附检测处理的检测结果。 粘附检测处理器根据在光源的非发光时段期间由光接收器接收的光的光量来选择性地执行一个或多个处理。

公开(公告)号：US20160084751A1

公开(公告)日：2016-03-24

申请号：US14786144

申请日：2014-04-20

Applicant: MOBILEODT LTD

Inventor： David Levitz ,  Ariel Be'ery

IPC: G01N21/21

CPC classification number: G01N21/21 ,  G01N21/956 ,  G01N2201/063

Abstract: A polarized light imaging apparatus is provided. In an embodiment, the apparatus comprises a light source for producing light beams; an illumination optic coupled to the light source for guiding the light beams towards the sample; a linear polarizer coupled to the illumination optic and configured to produce a linearly polarized light towards the sample respective of the light beams; a TIR birefringent polarizing prism (BPP) coupled to the sample to maximize a refraction difference between ordinary waves and extraordinary waves of light returning from the sample; and a detection optic unit coupled to the non-TIR BPP for guiding the light waves returning from the sample towards a single polarization sensitive sensor element (SE), the SE is configured to capture at least one frame of the sample respective of the light waves returning from the superficial single-scattering layer of the sample apart from the deeper diffuse layer.

Abstract translation: 提供了一种偏振光成像装置。 在一个实施例中，该装置包括用于产生光束的光源; 耦合到光源的照明光学器件，用于将光束引向样品; 耦合到所述照明光学器件并且被配置为朝向所述光束的所述样本产生线偏振光的线性偏振器; 耦合到样品的TIR双折射偏振棱镜（BPP），以最大化普通波和从样品返回的非常波的波之间的折射差; 以及耦合到非TIR BPP的检测光学单元，用于将从样品返回的光波导向单个偏振敏感传感器元件（SE），所述SE被配置为捕获相应于所述光波的样本的至少一个帧 从样品的表面单散射层离开较深的漫射层返回。

公开(公告)号：US09217718B2

公开(公告)日：2015-12-22

申请号：US14587271

申请日：2014-12-31

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Yuko Otani ,  Takehiro Tachizaki ,  Masahiro Watanabe ,  Shunichi Matsumoto

IPC: G01N21/88 ,  G01N21/95 ,  G01N21/21 ,  G01N21/47 ,  G01N21/956

CPC classification number: G01N21/8806 ,  G01N21/21 ,  G01N21/47 ,  G01N21/94 ,  G01N21/9501 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/8822 ,  G01N2021/8848 ,  G01N2201/06113 ,  G01N2201/063

Abstract: The disclosed device, which, using an electron microscope or the like, minutely observes defects detected by an optical appearance-inspecting device or an optical defect-inspecting device, can reliably insert a defect to be observed into the field of an electron microscope or the like, and can be a device of a smaller scale. The electron microscope, which observes defects detected by an optical appearance-inspecting device or by an optical defect-inspecting device, has a configuration wherein an optical microscope that re-detects defects is incorporated, and a spatial filter and a distribution polarization element are inserted at the pupil plane when making dark-field observations using this optical microscope. The electron microscope, which observes defects detected by an optical appearance-inspecting device or an optical defect-inspecting device, has a configuration wherein an optical microscope that re-detects defects is incorporated, and a distribution filter is inserted at the pupil plane when making dark-field observations using this optical microscope.

Abstract translation: 所公开的使用电子显微镜等精细观察由光学外观检查装置或光学缺陷检查装置检测到的缺陷的装置可以将观察到的缺陷可靠地插入电子显微镜领域或 喜欢，可以是一个规模较小的设备。 观察由光学外观检查装置或光学缺陷检查装置检测到的缺陷的电子显微镜具有结合了重新检测缺陷的光学显微镜，并且插入空间滤光器和分布偏振元件 在使用该光学显微镜进行暗视场观察时在瞳孔平面上。 观察由光学外观检查装置或光学缺陷检查装置检测到的缺陷的电子显微镜具有结合了重新检测缺陷的光学显微镜，并且在制造时将分配滤波器插入瞳孔平面 使用该光学显微镜进行暗场观测。

公开(公告)号：US20150211997A1

公开(公告)日：2015-07-30

申请号：US14683507

申请日：2015-04-10

Applicant: NIKON CORPORATION

Inventor： Fumihiro DAKE

IPC: G01N21/64 ,  G02F1/11 ,  G02F1/21

CPC classification number: G01N21/64 ,  G01N21/6458 ,  G01N2201/063 ,  G02B21/0032 ,  G02B21/367 ,  G02F1/11 ,  G02F1/21

Abstract: An illumination apparatus including: a traveling wave forming unit that is disposed in an optical path of a light flux emitted from a light source unit and that is configured to form a sonic traveling wave in a direction traversing the emitted light flux; and an illumination optical system that is configured to form, on a plane to be observed, position-variable interference fringes caused by a plurality of diffracted light beams generated from the traveling wave forming unit.

Abstract translation: 一种照明装置，包括：行波形成单元，其设置在从光源单元发射的光束的光路中，并且被构造成在穿过所述发射光束的方向上形成声波; 以及照明光学系统，被配置为在待观察的平面上形成由从行波形成单元产生的多个衍射光束引起的位置变化的干涉条纹。

公开(公告)号：US20080095669A1

公开(公告)日：2008-04-24

申请号：US11810915

申请日：2007-06-07

Applicant: Uk Kang ,  Soo Jin Bae ,  Geri V Papayan

Inventor： Uk Kang ,  Soo Jin Bae ,  Geri V Papayan

IPC: B32B5/02 ,  G01N21/76

CPC classification number: G01N21/6452 ,  G01N21/648 ,  G01N2201/063

Abstract: Disclosed herein is an apparatus for and method of measuring bio-chips, which can implement an illumination method of a novel type that illuminates a bio sample (which may be also referred to as a “bio specimen”) through a side face of a substrate using a diffusion plate to form an evanescent field by the illumination light over the entire surface of a substrate so as to uniformly secure brightness of the illuminated light over a wide area of a substrate, thereby more efficiently measuring fluorescence information of a bio-chip over a wide field of view.

Abstract translation: 本文公开了一种测量生物芯片的装置和方法，其可以实现通过衬底的侧面照射生物样品（其也可以称为“生物样本”）的新型照明方法 使用扩散板通过在基板的整个表面上的照明光形成消逝场，从而均匀地将照明光的亮度保持在基板的宽阔区域上，从而更有效地测量生物芯片的荧光信息 广泛的视野。