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111.发明公开公开(公告)号：US20230168185A1
公开(公告)日：2023-06-01
申请号：US17921706
申请日：2020-09-21
Inventor： Hyun Mo CHO , Dong Hyung KIM , Won CHEGAL , Yong Jai CHO
CPC classification number: G01N21/211 , G01N21/11 , G01N2021/752
Abstract: An embodiment of the present disclosure provides a multi-reflection silicon-based liquid immersion micro-channel measurement device and measurement method capable of improving measurement sensitivity by completely separating, through multi-reflection, first reflective light reflected by a sample detection layer and a second reflective light by a prism-buffer solution interface and by allowing the light to enter multiple times through the multi-reflection. The multi-reflection silicon-based liquid immersion micro-channel measurement device according to the embodiment of the present disclosure includes a micro-channel structure including a support, and one or more micro-channels formed on the support and each having a sample detection layer with a fixed bioadhesive material for detecting a sample, a sample injection unit configured to inject a buffer solution containing the sample into the micro-channel, a prism unit including a prism, and a reflection structure formed by coating a bottom surface of the prism with a mirror reflection material, the polarized light generating unit configured to generate polarized light, and the polarized light detecting unit configured to detect a polarization change of reflected light.
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公开(公告)号：US11656214B2
公开(公告)日：2023-05-23
申请号：US17348804
申请日：2021-06-16
Inventor： Nam Goo Kang
IPC: G01N33/00
CPC classification number: G01N33/007
Abstract: Disclosed herein is a quantifying method of uncertainty of measured value by close match span calibration of measuring sensor comprising a step of:
a quantifying using below equation I.
u
c
(
x
bag
)
≃
[
1
f
cyl
u
(
R
bag
)
]
2
+
[
1
f
cyl
u
(
R
cyl
)
]
2
+
u
2
(
x
cyl
)
(
I
)
wherein, uc is a combined standard uncertainty, Xbag is a measured value of a test, xcyl is standard value, fcyl is standard response factor (sensitivity coefficient), Rbag is a signal value of a test, represents xbag·fbag, Rcyl represents xcyl·fcyl, and u is standard uncertainty.-
公开(公告)号：US20230109872A1
公开(公告)日：2023-04-13
申请号：US17887619
申请日：2022-08-15
Inventor： Ogawa Takashi , Jun Hyeok HWANG , In Yong PARK
Abstract: Provided is a method of deconvoluting and restoring an image observed in a charged particle beam apparatus. The method includes receiving, by an image processing apparatus, an observed image acquired by a detector of the charged particle beam apparatus, calculating, by the image processing apparatus, a point spread function (PSF), deconvoluting and restoring, by the image processing apparatus, the observed image using the observed image and the PSF, calculating, by the image processing apparatus, an evaluation function of the parameter applied to a process of the deconvoluting, and adjusting, by the image processing apparatus, the parameter on the basis of a result of the evaluation function, and restoring the image after deconvoluting the observed image and the PSF again using an optimal parameter. Furthermore, a charged particle beam apparatus using the above-described method of deconvoluting and restoring the image is provided.
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114.发明申请公开(公告)号：US20220270852A1
公开(公告)日：2022-08-25
申请号：US17222937
申请日：2021-04-05
Inventor： Hyo Chang LEE , Jung Hyung KIM , Hee Jung YEOM
IPC: H01J37/32
Abstract: Disclosed herein is a device for measuring a plasma ion density, which includes a transceiver antenna configured to apply and receive a microwave, of which a frequency is varied, to and from plasma, and a frequency analyzer configured to analyze a frequency of the microwave received from the transceiver antenna and measure a cut-off frequency, wherein the frequency of the microwave applied to the plasma is varied in the range of 100 kHz to 500 MHz.
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公开(公告)号：US20220246340A1
公开(公告)日：2022-08-04
申请号：US17318613
申请日：2021-05-12
Inventor： Chan Yong Hwang , Kyoung Woong Moon , Seung Mo Yang , Chang Soo Kim
Abstract: The present disclosure relates to a device and method for forming skyrmion in a magnetic thin film. A skyrmion forming method comprises aligning the surface of the magnetic thin film and a horizontal magnetic field to be applied to the magnetic thin film and applying the horizontal magnetic field and a vertical magnetic field to the magnetic thin film. Accordingly, it is possible to form the bubble skyrmion easily even in the case of a wide width of a stripe formed on the magnetic thin film.
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Patent Agency Ranking
公开(公告)号：US20220238735A1
公开(公告)日：2022-07-28
申请号：US17523650
申请日：2021-11-10
Inventor： Jiman CHOI , Yonuk CHONG , Gahyun CHOI , Kibog PARK
IPC: H01L31/0232 , H01L31/18 , H01L31/101 , H01B12/04
Abstract: A light detection device having improved self-alignment precision using a hard mask, and a method for manufacturing the same is provided. A method of manufacturing a light detection device includes i) providing a substrate; ii) providing a light reflecting portion on the substrate; iii) providing a light detection portion on the light reflection portion; iv) providing an anti-reflection portion provided on the light reflection portion to cover the light detection portion; v) removing each of the first outer periphery of the light reflection portion and the second outer periphery of the anti-reflection portion, and vi) providing a hard mask formed to correspond to the removed first outer periphery, positioned on the substrate, and spaced apart from the light reflecting portion to surround the light reflecting portion.
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117.发明授权公开(公告)号：US11255662B2
公开(公告)日：2022-02-22
申请号：US16610664
申请日：2018-08-14
Inventor： Young-sik Ghim , The-mahn Nguyen , Hyug-gyo Rhee
Abstract: The present disclosure is directed to a system and a method for compensating non-linear response characteristics in measuring the shape of an object using phase-shifting deflectomerty. More particularly, the present disclosure is directed to a method for compensating non-linear response characteristics in phase-shifting deflectometry including steps of: generating a pattern by a pattern generating portion and projecting the same to a measurement object; obtaining an image of a deformed pattern reflected from the measurement object by a detector; linearizing non-linear responses on the basis of a look up table considering non-linear response characteristics of the pattern generating portion and the detector by a compensation means; and compensating phase-shifting amounts generated due to non-linear response characteristics by the compensation means.
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公开(公告)号：US11222653B2
公开(公告)日：2022-01-11
申请号：US16554708
申请日：2019-08-29
Applicant: SHINSUNG UNIVERSITY Industry-Academia Cooperation Group , Korea Research Institute of Standards and Science
Inventor： Se Jin Park , Seung Nam Min , Kyung Sun Lee , Jung Nam Im , Dong Joon Kim , Sung Kyun Im , Hea Sol Kim , Murali Subramaniyam , Seoung Eun Kim
Abstract: The present invention relates to a system and a method for determining a stroke based on a voice analysis. According to the present invention, voice data of subjects are collected to extract and analyze voice onset times to determine stroke patients based on voices. The system for determining a stroke generates and collects voice data from test subjects reading a predetermined word that includes a plosive sound. The system for determining a stroke extracts and calculates voice onset times from the voice data to calculate probability parameters for the voice onset times of each of a normal group and a stroke patient group. The system for determining a stroke uses a set of probability parameters to determine an integration section, and calculates probabilities of being in the normal group and the stroke patient group. The system for determining a stroke applies the calculated probabilities to the Bayes theorem to determine whether the subjects are stroke patients.
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公开(公告)号：US20210404797A1
公开(公告)日：2021-12-30
申请号：US16651792
申请日：2019-07-29
Inventor： Young-Sik GHIM , The Manh NGUYEN , Hyug-Gyo RHEE
IPC: G01B11/25
Abstract: The present disclosure is related to a system and a method for 3D shape measurement of a freeform surface based on high-speed deflectometry using composite patterns. More particularly, a system for profile measurement based on high-speed deflectometry using composite patterns includes: a composite pattern generation part to project a composite pattern generated by synthesizing patterns having different frequencies to a measurement object; a detector to acquire images of a deformed composite pattern reflected from the measurement object; and a phase acquisition part to acquire wrapped phases by each frequency from the composite pattern and unwrapped phases from the respective wrapped phases.
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公开(公告)号：US20210364509A1
公开(公告)日：2021-11-25
申请号：US16498326
申请日：2018-10-10
Inventor： Eun-Ah YOU , Wansun KIM , Tae Geol LEE
IPC: G01N33/543 , G01N33/553
Abstract: Provided is a method of preparing Raman-active nanoparticles, which includes a) preparing a metal nanocore having a nano-star shape from a first reaction solution in which a first metal precursor is mixed with a buffer solution; b) fixing a Raman reporter in the metal nanocore; and c) forming a metal shell, which surrounds the nanocore in which the Raman reporter is fixed, from a second reaction solution in which a second metal precursor is mixed with the nanocore in which the Raman reporter is fixed. The Raman reporter has a binding affinity for each of a first metal of the metal nanocore and a second metal of the metal shell.
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