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    Modification of the normalized difference method for real-time optical tomography
    182.
    发明授权
    Modification of the normalized difference method for real-time optical tomography 有权
    用于实时光学层析成像的归一化差分法的修改

    公开(公告)号：US07616984B2

    公开(公告)日：2009-11-10

    申请号：US10408511

    申请日：2003-04-07

    Applicant: Randall L. Barbour ,  Yaling Pei

    Inventor： Randall L. Barbour ,  Yaling Pei

    IPC: A61B6/00

    CPC classification number: G06T11/006 ,  A61B5/0073 ,  A61B5/0091 ,  A61B5/4312 ,  G01N21/359 ,  G01N21/4795 ,  G01N21/49 ,  G01N2021/1787 ,  G01N2021/475 ,  G01N2201/0826 ,  G01N2201/0833

    Abstract: Computation-saving techniques and stability-adding techniques provide for fast, accurate reconstructions of a time series of images involving large-scale 3D problems, such as real-time image recovery in an optical tomography imaging system. A system equation for a target medium (116) such as tissue is solved using a Normalized Difference Method (NDM) (250). Because of the inherent stability of the NDM solutions, a weight matrix (W) of the system equation can be provided for a given point in a time series (220), then reused without recalculation at subsequent points. Further savings are achieved by decomposing W using singular value decomposition or direct matrix decomposition, transforming it to reduce its dimensions, and/or scaling it to achieve a more stable numerical solution. Values of measured energy (112) emerging from the target medium are back-substituted into the system equation for the different points to obtain the target medium properties.

    Abstract translation: 计算节省技术和稳定性增加技术提供了涉及大规模3D问题的时间序列图像的快速，精确重建，例如光学层析成像系统中的实时图像恢复。 使用归一化差分法（NDM）（250）解决诸如组织的目标介质（116）的系统方程式。 由于NDM解决方案的固有稳定性，可以为时间序列（220）中的给定点提供系统方程的权重矩阵（W），然后在后续点重新使用重新计算。 通过使用奇异值分解或直接矩阵分解来分解W来实现进一步的节省，将其变换以减小其尺寸，和/或缩放以实现更稳定的数值解。 从目标介质出现的测量能量（112）的值被替代为不同点的系统方程，以获得目标介质特性。

    System for detection of water defects
    184.
    发明授权
    System for detection of water defects 有权
    水缺陷检测系统

    公开(公告)号：US07525659B2

    公开(公告)日：2009-04-28

    申请号：US10345097

    申请日：2003-01-15

    Applicant: Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    Inventor： Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    IPC: G01B11/00

    CPC classification number: G01N21/9501 ,  G01N21/8806 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/479 ,  G01N2021/8825 ,  G01N2201/0697 ,  G01N2201/0826

    Abstract: Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane assembly, optically forming a continuous surface of photo-detectors at the focal plane of the optical imaging system. The continuously moving wafer is illuminated by a laser pulse of duration significantly shorter than the pixel dwell time, such that there is effectively no image smear during the wafer motion. The laser pulse has sufficient energy and brightness to impart the necessary illumination to each sequentially inspected field of view required for creating an image of the inspected wafer die. A novel fiber optical illumination delivery system, which is effective in reducing the effects of source coherence is described. Other novel aspects of the system include a system for compensating for variations in the pulse energy of a Q-switched laser output, methods for autofocussing of the wafer imaging system, and novel methods for removal of repetitive features of the image by means of Fourier plane filtering, to enable easier detection of wafer defects.

    Abstract translation: 通过用来自重复脉冲激光器的短光脉冲照射晶片缺陷的快速在线电光检测，晶片的一部分在成像系统的视场内移动，并将移动的晶片成像到 焦平面组件，在光学成像系统的焦平面处光学地形成光电检测器的连续表面。 持续移动的晶片被持续时间明显短于像素停留时间的激光脉冲照亮，使得在晶片运动期间实际上没有图像污迹。 激光脉冲具有足够的能量和亮度，以对于产生被检查的晶片管芯的图像所需的每个顺序检查的视场赋予必要的照明。 描述了一种有效减少源相干效应的新型光纤照明传输系统。 该系统的其他新颖的方面包括用于补偿Q开关激光输出的脉冲能量变化的系统，用于晶片成像系统的自动聚焦的方法，以及通过傅里叶平面去除图像的重复特征的新颖方法 过滤，以便更容易地检测晶片缺陷。

    Fiber optical illumination system
    185.
    发明授权
    Fiber optical illumination system 有权
    光纤照明系统

    公开(公告)号：US07486861B2

    公开(公告)日：2009-02-03

    申请号：US11709019

    申请日：2007-02-21

    Applicant: Dov Furman

    Inventor： Dov Furman

    IPC: G02B6/04

    CPC classification number: G01N21/9501 ,  G01N2021/479 ,  G01N2021/8825 ,  G01N2201/0697 ,  G01N2201/0826

    Abstract: A fiber optical illumination delivery system, which is effective in reducing the effects of source coherence. The system preferably utilizes either a single bundle of optical fibers, or serial bundles of optical fibers. In the single bundle embodiment, the differences in optical lengths between different fibers of the bundle is preferably made to be equal to even less than the coherence length of the source illumination. In the serial bundle embodiment, the fibers in the other bundle are arranged as groups of fibers of the same length, and it is the difference in lengths of these groups which is made equal to, or even more preferably, less than the overall difference in length between the shortest and the longest fibers in the other bundle. Both of these fiber systems enable construction of illumination systems delivering a higher level of illumination, but without greatly affecting the coherence breaking abilities of the system, thus enabling a generally more applicable system to be constructed.

    Abstract translation: 一种光纤照明传输系统，可有效减少源相干的影响。 系统优选地使用单束光纤或串联的光纤束。 在单束实施例中，束的不同光纤之间的光学长度差异优选地等于甚至小于源照明的相干长度。 在串联捆绑实施例中，另一束中的纤维被布置成具有相同长度的纤维组，并且这些组的长度差异等于或甚至更优选地小于总体差异 另一束中最短和最长纤维之间的长度。 这两种光纤系统能够实现提供更高水平的照明的照明系统的构造，但是不会非常影响系统的相干断裂能力，从而能够构建一般更适用的系统。

    System for detection of wafer defects
    186.
    发明授权
    System for detection of wafer defects 有权
    晶圆缺陷检测系统

    公开(公告)号：US07477383B2

    公开(公告)日：2009-01-13

    申请号：US11476322

    申请日：2006-06-28

    Applicant: Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    Inventor： Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    IPC: G01N21/00

    CPC classification number: G01N21/9501 ,  G01N21/8806 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/479 ,  G01N2021/8825 ,  G01N2201/0697 ,  G01N2201/0826

    Abstract: Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane assembly, optically forming a continuous surface of photo-detectors at the focal plane of the optical imaging system. The continuously moving wafer is illuminated by a laser pulse of duration significantly shorter than the pixel dwell time, such that there is effectively no image smear during the wafer motion. The laser pulse has sufficient energy and brightness to impart the necessary illumination to each sequentially inspected field of view required for creating an image of the inspected wafer die. A novel fiber optical illumination delivery system, which is effective in reducing the effects of source coherence is described. Other novel aspects of the system include a system for compensating for variations in the pulse energy of a Q-switched laser output, methods for autofocussing of the wafer imaging system, and novel methods for removal of repetitive features of the image by means of Fourier plane filtering, to enable easier detection of wafer defects.

    Abstract translation: 通过用来自重复脉冲激光器的短光脉冲照射晶片缺陷的快速在线电光检测，晶片的一部分在成像系统的视场内移动，并将移动的晶片成像到 焦平面组件，在光学成像系统的焦平面处光学地形成光电检测器的连续表面。 持续移动的晶片被持续时间明显短于像素停留时间的激光脉冲照亮，使得在晶片运动期间实际上没有图像污迹。 激光脉冲具有足够的能量和亮度，以对于产生被检查的晶片管芯的图像所需的每个顺序检查的视场赋予必要的照明。 描述了一种有效减少源相干效应的新型光纤照明传输系统。 该系统的其他新颖的方面包括用于补偿Q开关激光输出的脉冲能量变化的系统，用于晶片成像系统的自动聚焦的方法，以及通过傅里叶平面去除图像的重复特征的新颖方法 过滤，以便更容易地检测晶片缺陷。

    Spectrometer for analysis of multiple samples
    188.
    发明授权
    Spectrometer for analysis of multiple samples 有权
    用于分析多个样品的光谱仪

    公开(公告)号：US07339668B2

    公开(公告)日：2008-03-04

    申请号：US11253853

    申请日：2005-10-18

    Applicant: Matthew D. Ebersole ,  John R. Iverson

    Inventor： Matthew D. Ebersole ,  John R. Iverson

    IPC: G01J3/42

    CPC classification number: G01N21/31 ,  G01N21/253 ,  G01N2021/3137 ,  G01N2021/317 ,  G01N2201/0826

    Abstract: A spectrometer (100) includes a light source (102) providing output light (106) to the bundled input ends (108) of multiple light pipes (110). The light pipes (110) branch into sets (118) between their input ends (108) and output ends (114), with each set (118) illuminating a sample detector (126) (via a sample chamber (122)) for measuring light scattered or emitted by a sample, or a reference detector (128) for obtaining a reference/datum measurement of the supplied light, so that comparison of measurements from the sample detector (126) and the reference detector (128) allows compensation of the sample detector measurements for drift. Efficient and accurate measurement is further assured by arraying the multiple light pipes (110) in each set (118) about the input bundle (116) so that each set receives at least substantially the same amount of light from the light source (102).

    Abstract translation: 光谱仪（100）包括向多个光管（110）的捆扎输入端（108）提供输出光（106）的光源（102）。 光管（110）在其输入端（108）和输出端（114）之间分支成集合（118），每组（118）照射样品检测器（126）（经由样品室（122）），用于测量 由样品散射或发射的光或用于获得所提供的光的参考/基准测量的参考检测器（128），使得来自样本检测器（126）和参考检测器（128）的测量值的比较允许补偿 样品检测器测量漂移。 通过将每个组（118）中的多个光管（110）围绕输入束（116）排列，使得每个组从光源（102）接收至少基本上相同量的光，进一步确保高效和准确的测量。

    Blood coagulation analyzer and blood coagulation analyzing method
    189.
    发明申请
    Blood coagulation analyzer and blood coagulation analyzing method 审中-公开
    凝血分析仪和血液凝固分析方法

    公开(公告)号：US20080044912A1

    公开(公告)日：2008-02-21

    申请号：US11889250

    申请日：2007-08-10

    Applicant: Norimasa Yamamoto ,  Kazutoshi Tokunaga

    Inventor： Norimasa Yamamoto ,  Kazutoshi Tokunaga

    IPC: G01N33/86 ,  B01J19/00

    CPC classification number: G01N33/4905 ,  G01N21/272 ,  G01N21/314 ,  G01N21/82 ,  G01N35/025 ,  G01N2021/3133 ,  G01N2021/3137 ,  G01N2021/3148 ,  G01N2021/3174 ,  G01N2021/825 ,  G01N2201/0618 ,  G01N2201/0826

    Abstract: A blood coagulation analyzer and analyzing method perform following: (a) preparing a measurement specimen by dispensing a blood specimen and a reagent into a reaction container; (b) emitting light of a plurality of wavelengths to the measurement specimen in the reaction container, the wavelengths comprising a first wavelength for use in a measurement by a blood coagulation time method, and at least one of a second wavelength for use in a measurement by a synthetic substrate method and a third wavelength for use in a measurement by an immunoturbidimetric method; (c) detecting light of a plurality of wavelengths corresponding to the light emitted in (b), from the measurement specimen, by a light receiving element, and acquiring data corresponding to each wavelength; and (d) conducting an analysis based on the data corresponding to one of the wavelengths among the acquired data, and acquiring a result of the analysis.

    Abstract translation: 凝血分析仪和分析方法执行以下操作：（a）通过将血液样本和试剂分配到反应容器中来制备测量样本; （b）将多个波长的光发射到所述反应容器中的测定试样，所述波长包含用于通过凝血时间法测定的第一波长，以及用于测定的第二波长中的至少一个 通过合成底物法和第三波长，用于通过免疫比浊法测定; （c）通过光接收元件从所述测量样本中检测与（b）中发射的光相对应的多个波长的光，并获取对应于每个波长的数据; 以及（d）基于与所获取的数据中的一个波长对应的数据进行分析，并获取分析结果。

    System for detection of wafer defects
    190.
    发明授权
    System for detection of wafer defects 有权

    公开(公告)号：US07180586B2

    公开(公告)日：2007-02-20

    申请号：US11021393

    申请日：2004-12-23

    Applicant: Gad Neumann ,  Noam Dotan

    Inventor： Gad Neumann ,  Noam Dotan

    IPC: G01N21/88

    CPC classification number: G01N21/9501 ,  G01N21/8806 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/479 ,  G01N2021/8825 ,  G01N2201/0697 ,  G01N2201/0826

    Abstract: Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane assembly, optically forming a continuous surface of photo-detectors at the focal plane of the optical imaging system. The continuously moving wafer is illuminated by a laser pulse of duration significantly shorter than the pixel dwell time, such that there is effectively no image smear during the wafer motion. The laser pulse has sufficient energy and brightness to impart the necessary illumination to each sequentially inspected field of view required for creating an image of the inspected wafer die. A novel fiber optical illumination delivery system, which is effective in reducing the effects of source coherence is described. Other novel aspects of the system include a system for compensating for variations in the pulse energy of a Q-switched laser output, methods for autofocussing of the wafer imaging system, and novel methods for removal of repetitive features of the image by means of Fourier plane filtering, to enable easier detection of wafer defects.

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