公开(公告)号：US06785407B1

公开(公告)日：2004-08-31

申请号：US09622940

申请日：2000-10-12

Applicant: Jon Tschudi ,  Ib-Rune Johansen ,  Ivar Mathiassen ,  Svein Mathiassen

Inventor： Jon Tschudi ,  Ib-Rune Johansen ,  Ivar Mathiassen ,  Svein Mathiassen

IPC: G06K900

CPC classification number: G06K9/00026 ,  A61B5/1172 ,  G06K9/0002

Abstract: This invention relates to an apparatus for measuring structures in a fingerprint or the like, comprising at least one sensor array adapted to be positioned close to, or in contact with, the surface of the fingerprint, the sensor array being adapted to measure chosen characteristics of the surface, e.g. by measuring capacitance or resistivity, at a plurality of positions. At least one sensor array comprises at least one line of sensors, adapted to measure said characteristics at chosen intervals of time, the surface having a relative movement in relation to the sensor array with a direction essentially perpendicular to the at least one line of sensors, and at least one of the outer ends of at least one sensor array protrudes towards the surface to be measured, providing an essentially U-shaped cross section in a plane perpendicular to the direction of said movement.

Abstract translation: 本发明涉及一种用于测量指纹等中的结构的装置，包括至少一个传感器阵列，其适于定位成靠近或与指纹表面接触，传感器阵列适于测量选定的特性 表面，例如 通过在多个位置测量电容或电阻率。 至少一个传感器阵列包括至少一行传感器，其适于在所选择的时间间隔内测量所述特性，所述表面具有相对于传感器阵列的相对运动，其方向基本上垂直于所述至少一个传感器线， 并且至少一个传感器阵列的外端中的至少一个朝向被测量表面突出，在垂直于所述运动方向的平面中提供基本上U形的横截面。