公开(公告)号：US20190195620A1

公开(公告)日：2019-06-27

申请号：US16283661

申请日：2019-02-22

Applicant: Apple Inc.

Inventor： Denis G. Chen ,  Jui Hua Liu ,  Xingxing Cai

IPC: G01B11/14 ,  G01D5/20 ,  G01B11/00 ,  G01D5/30

CPC classification number: G01B11/14 ,  G01B11/002 ,  G01D5/142 ,  G01D5/2013 ,  G01D5/30

Abstract: Systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass.

公开(公告)号：US10215555B2

公开(公告)日：2019-02-26

申请号：US15674260

申请日：2017-08-10

Applicant: Apple Inc.

Inventor： Denis G. Chen ,  Jui Hua Liu ,  Xingxing Cai

IPC: G01B11/14 ,  G01D5/20 ,  G01B11/00 ,  G01D5/30 ,  G01D5/14

Abstract: Systems and techniques are described for measuring displacement of a mass by using an array of beams for scanning a binary intensity pattern disposed on a surface of the mass. Further, systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass. Furthermore, systems and techniques are described for measuring displacement of a mass by illuminating an intensity pattern disposed on a surface of the mass with an array of beams and monitoring intensity of each of the beams that is redirected by the intensity pattern.

公开(公告)号：US20180080758A1

公开(公告)日：2018-03-22

申请号：US15674260

申请日：2017-08-10

Applicant: Apple Inc.

Inventor： Denis G. Chen ,  Jui Hua Liu ,  Xingxing Cai

IPC: G01B11/14 ,  G01D5/20

CPC classification number: G01B11/14 ,  G01B11/002 ,  G01D5/142 ,  G01D5/2013 ,  G01D5/30

Abstract: Systems and techniques are described for measuring displacement of a mass by using an array of beams for scanning a binary intensity pattern disposed on a surface of the mass. Further, systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass. Furthermore, systems and techniques are described for measuring displacement of a mass by illuminating an intensity pattern disposed on a surface of the mass with an array of beams and monitoring intensity of each of the beams that is redirected by the intensity pattern.