公开(公告)号：US20220341892A1

公开(公告)日：2022-10-27

申请号：US17824656

申请日：2022-05-25

Applicant: Gecko Robotics, Inc.

Inventor： Chase David ,  Jose Aparicio ,  Juan Roberto Mendoza Mora ,  Kevin Y. Low ,  Troy Demmer ,  Edward A. Bryner ,  Scott Ashley Corl

IPC: G01N29/265 ,  G01N29/04

Abstract: Robotic systems for rapid ultrasonic surface inspection are described. An example system may have an inspection robot to move in a direction of travel on an inspection surface. The robot may have a payload with a first and a second ultrasonic (UT) phased array, and a rastering device that executes a reciprocating motion of the payload. The system may have an inspection controller with a positioning circuit to provide an inspection position command, an inspection circuit to provide a rastering position command and an interrogation command. The robot is responsive to the inspection position command to move to an inspection position, and the rastering device is responsive to the rastering position command to move the payload through at least a portion of a range of reciprocating motion. The UT phased arrays are responsive to the interrogation command to perform an inspection on three axes of inspection.

公开(公告)号：US20220341886A1

公开(公告)日：2022-10-27

申请号：US17726336

申请日：2022-04-21

Applicant: Gecko Robotics, Inc.

Inventor： Chase David ,  Jose Aparicio ,  Juan Roberto Mendoza Mora ,  Kevin Y. Low ,  Troy Demmer ,  Edward A. Bryner ,  Scott Ashley Corl

IPC: G01N29/265 ,  G01N29/04

Abstract: Systems, methods, and apparatus for ultra-sonic inspection of a surface are described. An example system may include an inspection robot structured to move in a direction of travel on an inspection surface. The inspection robot may include a payload including a first ultrasonic (UT) phased array and a second UT phased array, the first UT phased array and the second UT phased array being arranged in a parallel configuration. The inspection robot may include a rastering device structured to move the payload in a direction of inspection, the direction of inspection being distinct from the direction of travel and the direction of inspection being distinct from the parallel configuration of the first UT phased array and the second UT phased array.