公开(公告)号：US11031038B2

公开(公告)日：2021-06-08

申请号：US16641399

申请日：2019-01-31

Applicant: HOYA CORPORATION

Inventor： Shinji Eda ,  Kinobu Osakabe ,  Yoshitake Tanno ,  Mikio Ikenishi

IPC: G11B17/32 ,  G11B5/73 ,  G11B17/038 ,  G11B33/12

Abstract: A glass material of a glass spacer has a surface resistivity of 103 to 109 (Ω/sq) at 22 (° C.). The surface resistivity of a surface of the glass material of the glass spacer at 22 (° C.) is lower than the surface resistivity of an inner portion of the glass material at 22 (° C.). The glass spacer contains at least one oxide selected from the group consisting of TiO2, Nb2O5, WO3, and Bi2O3, as a glass component.

公开(公告)号：US09589586B2

公开(公告)日：2017-03-07

申请号：US14665857

申请日：2015-03-23

Applicant: HOYA CORPORATION

Inventor： Yoichi Hachitani ,  Kinobu Osakabe

IPC: G11B5/73 ,  C03C3/083 ,  C03C3/085 ,  C03C3/087 ,  C03C3/095 ,  C03C3/097 ,  G11B5/84

CPC classification number: G11B5/7315 ,  C03C3/083 ,  C03C3/085 ,  C03C3/087 ,  C03C3/095 ,  C03C3/097 ,  G11B5/8404 ,  Y10T428/315

Abstract: A glass for a magnetic recording medium substrate permitting the realization of a magnetic recording medium substrate affording good chemical durability and having an extremely flat surface, a magnetic recording medium substrate comprised of this glass, a magnetic recording medium equipped with this substrate, and methods of manufacturing the same. The glass compositions disclosed comprise oxides of at least Si, Al, Li, Na, K, Sn and Ce, optionally Sb, but not comprising As or F. Additional oxides of Mg, Cs, Sr and Ba may be present. The oxides are presented as molar percentages, mass percentages and ratios thereof.

Abstract translation: 一种用于磁记录介质基板的玻璃，其允许实现具有良好化学耐久性并且具有极其平坦表面的磁记录介质基板，由该玻璃构成的磁记录介质基板，配备有该基板的磁记录介质，以及 制造相同。 公开的玻璃组合物至少包含Si，Al，Li，Na，K，Sn和Ce的氧化物，任选的Sb，但不包括As或F.可以存在其他的Mg，Cs，Sr和Ba的氧化物。 氧化物以摩尔百分数，质量百分比和比例表示。

公开(公告)号：US09236077B2

公开(公告)日：2016-01-12

申请号：US14306675

申请日：2014-06-17

Applicant: HOYA CORPORATION

Inventor： Kazuo Tachiwana ,  Yoichi Hachitani ,  Xuelu Zou ,  Mikio Ikenishi ,  Kinobu Osakabe

IPC: G11B5/73 ,  G11B5/735 ,  C03C3/087 ,  C03C3/097 ,  C03C19/00 ,  C03C21/00 ,  C03C23/00 ,  G11B5/82 ,  G11B5/84 ,  C03C3/083 ,  C03C3/095

CPC classification number: G11B5/735 ,  C03C3/083 ,  C03C3/087 ,  C03C3/095 ,  C03C3/097 ,  C03C15/00 ,  C03C19/00 ,  C03C21/002 ,  C03C23/0075 ,  G11B5/7315 ,  G11B5/82 ,  G11B5/8404 ,  Y10T428/24273 ,  Y10T428/315

Abstract: According to one aspect of the present invention, provided is glass for use in substrate for information recording medium, which comprises, denoted as molar percentages, a total of 70 to 85 percent of SiO2 and Al2O3, where SiO2 content is equal to or greater than 50 percent and Al2O3 content is equal to or greater than 3 percent; a total of equal to or greater than 10 percent of Li2O, Na2O and K2O; a total of 1 to 6 percent of CaO and MgO, where CaO content is greater than MgO content; a total of greater than 0 percent but equal to or lower than 4 percent of ZrO2, HfO2, Nb2O5, Ta2O5, La2O3 Y2O3 and TiO2; with the molar ratio of the total content of Li2O, Na2O and K2O to the total content of SiO2, Al2O3, ZrO2, HfO2, Nb2O5, Ta2O5, La2O3, Y2O3 and TiO2 ((Li2O+Na2O+K2O)/(SiO2+Al2O3+ZrO2+HfO2+Nb2O5+Ta2O5+La2O3+Y2O3+TiO2)) being equal to or less than 0.28. Further provided are the substrate for information recording medium, information recording medium and their manufacturing methods according to the present invention.

Abstract translation: 根据本发明的一个方面，提供了一种用于信息记录介质的基板的玻璃，其包括以摩尔百分数表示的总和为70〜85％的SiO 2和Al 2 O 3，其中SiO 2含量等于或大于 50％，Al2O3含量等于或大于3％; 总计等于或大于10％的Li2O，Na2O和K2O; CaO和MgO的总量为1〜6％，其中CaO含量大于MgO含量; 总共大于0％但等于或低于ZrO2，HfO2，Nb2O5，Ta2O5，La2O3 Y2O3和TiO2的4％; 其中Li2O，Na2O和K2O的总含量与SiO2，Al2O3，ZrO2，HfO2，Nb2O5，Ta2O5，La2O3，Y2O3和TiO2（（Li2O + Na2O + K2O）/（SiO2 + Al2O3 + ZrO 2 + HfO 2 + Nb 2 O 5 + Ta 2 O 5 + La 2 O 3 + Y 2 O 3 + TiO 2））等于或小于0.28。 还提供了根据本发明的用于信息记录介质的基板，信息记录介质及其制造方法。

公开(公告)号：US20150248910A1

公开(公告)日：2015-09-03

申请号：US14432184

申请日：2013-09-30

Applicant: HOYA CORPORATION

Inventor： Masanobu Itaya ,  Kinobu Osakabe

IPC: G11B5/73

CPC classification number: G11B5/7315 ,  C23C14/35 ,  G11B5/73

Abstract: A magnetic-disk glass substrate of the present invention has a pair of main surfaces, and an arithmetic mean roughness (Ra) for wavelength components of 10 to 50 nm of the surface of the main surfaces is 0.15 nm or less.

Abstract translation: 本发明的磁盘玻璃基板具有一对主表面，主表面的波长成分为10〜50nm的算术平均粗糙度（Ra）为0.15nm以下。

公开(公告)号：US20150213826A1

公开(公告)日：2015-07-30

申请号：US14424261

申请日：2013-06-28

Applicant: HOYA CORPORATION ,  HOYA GLASS DISK VIETNAM II LTD.

Inventor： Masanobu Itaya ,  Kinobu Osakabe ,  Toshio Takizawa

IPC: G11B5/82 ,  G11B5/73

CPC classification number: G11B5/7315 ,  G11B5/82

Abstract: A magnetic-disk glass substrate of the present invention has an average value of squares of inclinations of 0.0025 or less and a frequency at which squares of inclinations are 0.004 or more of 15% or less, in a case where samples of inclinations on a main surface are obtained at intervals of 10 nm.

Abstract translation: 在本发明的磁盘玻璃基板中，在主体上倾斜的样本的情况下，倾斜平方的平均值为0.0025以下，倾斜方格为0.004以上的频率为15％以下 以10nm的间隔获得表面。

公开(公告)号：US11152026B2

公开(公告)日：2021-10-19

申请号：US16499210

申请日：2018-07-02

Applicant: HOYA CORPORATION

Inventor： Kinobu Osakabe

IPC: G11B5/73

Abstract: A substrate for a magnetic disk includes a substrate main body having two main surfaces, and a film that is provided on the main surfaces and is made of a material having a loss factor of 0.01 or more. The substrate for a magnetic disk including the film has a thickness T of 0.700 mm or less, and a thickness D [mm] of the film provided on the main surfaces and the thickness T [mm] of the substrate for a magnetic disk including the film satisfy a relationship D≥0.0082/T−0.0015.

公开(公告)号：US10319403B2

公开(公告)日：2019-06-11

申请号：US15545969

申请日：2016-03-31

Applicant: HOYA CORPORATION

Inventor： Masanobu Itaya ,  Kinobu Osakabe

IPC: G11B5/73 ,  G11B5/82 ,  G11B5/84 ,  B82Y10/00 ,  B82Y40/00

Abstract: A magnetic-disk substrate has a pair of main surfaces and arithmetic average roughnesses Ra of the main surfaces are each 0.11 nm or less. Also, in surface unevenness of the main surfaces, an average area of regions occupied by a plurality of protrusions having a height of 0.1 nm or more from an average plane of the surface unevenness is 25 nm2/protrusion or less. The arithmetic average roughness Ra and the surface unevenness are measured using an atomic force microscope with a probe having a probe tip provided with a carbon nanofiber rod-shaped member.